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考試焦慮者注意偏向的動(dòng)態(tài)時(shí)間變化

發(fā)布時(shí)間:2019-06-05 11:16
【摘要】:本研究主要采用事件相關(guān)電位技術(shù)(Event-related potential, ERP)和眼動(dòng)追蹤技術(shù)(Eye-tracking technique),通過評定標(biāo)準(zhǔn)化的考試焦慮圖片庫和詞匯庫,以考試相關(guān)及無關(guān)威脅詞匯或圖片作為刺激材料,探討了在點(diǎn)探測任務(wù)中刺激的呈現(xiàn)時(shí)間及威脅水平對高、低考試焦慮個(gè)體注意偏向的影響。主要的結(jié)果和結(jié)論如下:1.閾上200ms刺激呈現(xiàn)時(shí),在行為水平上,高考試焦慮個(gè)體對考試相關(guān)威脅刺激存在注意偏向,而低考試焦慮個(gè)體則對考試相關(guān)刺激存在注意回避;在腦電水平上,高考試焦慮組在考試無關(guān)威脅詞線索瑣時(shí)N1波幅增強(qiáng)以及考試相關(guān)威脅詞異側(cè)探測時(shí)的靶瑣時(shí)N200波幅增強(qiáng)和LPP波幅減弱,而低考試焦慮組的考試相關(guān)威脅詞異側(cè)探測時(shí)的靶瑣時(shí)N200波幅減弱。2.閾下50ms刺激呈現(xiàn)時(shí),與低考試焦慮相比,在行為水平上,高考試焦慮個(gè)體對考試相關(guān)低威脅刺激產(chǎn)生注意易化趨勢,并對考試相關(guān)高威脅刺激脫離易化;在腦電水平上,高考試焦慮個(gè)體線索誘發(fā)的Cl波幅、N1峰值以及靶刺激誘發(fā)的N1波幅和峰值、P1波幅增強(qiáng)。3.閾上500ms刺激呈現(xiàn)時(shí),與低考試焦慮相比,在行為水平上,高考試焦慮個(gè)體對考試相關(guān)的高、低威脅刺激均產(chǎn)生注意回避及脫離困難:在腦電水平上,高考試焦慮個(gè)體線索誘發(fā)的N1峰值以及靶刺激誘發(fā)的N1峰值、P1波幅升高。4.在刺激呈現(xiàn)時(shí)間3000ms時(shí),與低考試焦慮相比,高考試焦慮個(gè)體對考試相關(guān)低威脅刺激存在注意易化,對考試相關(guān)高威脅刺激注意回避;隨著認(rèn)知負(fù)荷的增加,高考試焦慮個(gè)體對呈現(xiàn)時(shí)間為3000ms的考試相關(guān)威脅刺激脫離困難。5.高考試焦慮個(gè)體對考試相關(guān)威脅刺激注意偏向呈現(xiàn)動(dòng)態(tài)變化特征,對考試相關(guān)威脅刺激注意偏向出現(xiàn)在早期的前注意加工階段,并在后期的策略加工階段對威脅刺激注意保持或回避。威脅水平和認(rèn)知負(fù)荷也會(huì)調(diào)節(jié)考試焦慮者對考試相關(guān)威脅刺激注意偏向成分。對本研究存在的局限、本研究結(jié)果及應(yīng)用進(jìn)行了深入討論,且對于未來研究工作及研究方向,提供具體建議。
[Abstract]:In this study, event-related potential techniques (Event-related potential, ERP) and eye movement tracking techniques (Eye-tracking technique),) were used to evaluate standardized test anxiety photography and vocabulary. Using test-related and unrelated threat words or pictures as stimulus materials, this paper discusses the effects of stimulation presentation time and threat level on attention bias of individuals with high and low test anxiety. The main results and conclusions are as follows: 1. When the threshold 200ms stimulation was presented, at the behavioral level, the anxiety individuals in the college entrance examination showed attention bias to the test-related threat stimuli, while the low test anxiety individuals had attention avoidance to the test-related stimuli. At the EEG level, in the college entrance examination anxiety group, the N1 amplitude of the unrelated threat word clue was enhanced, and the N200 amplitude and the LPP amplitude of the test related threat word were enhanced and the amplitude of N200 was weakened when the test related threat words were detected on the different side of the test. In the low test anxiety group, the N200 amplitude of the target was weakened when the test-related threat words were detected differently. 2. When subthreshold 50ms stimulation was presented, compared with low test anxiety, at the behavioral level, individuals with college entrance examination anxiety had a tendency of attention facilitation to test-related low threat stimuli, and were separated from facilitation to test-related high threat stimuli. At EEG level, the amplitude of Cl induced by individual clues of anxiety in college entrance examination, the amplitude and peak of N1 induced by target stimulation, and the amplitude of P1 were enhanced. 3. When the suprathreshold 500ms stimulation was presented, compared with the low test anxiety, at the behavioral level, the individuals with anxiety in the college entrance examination had attention avoidance and difficulty in getting rid of the high and low threat stimuli related to the exam: at the EEG level, The N1 peak induced by individual clues and the N1 peak induced by target stimulation increased the amplitude of P1. 4. When stimulation presents time 3000ms, compared with low test anxiety, high test anxiety individuals have attention facilitation to test related low threat stimuli and attention avoidance to test related high threat stimuli. With the increase of cognitive load, individuals with anxiety in college entrance examination were out of difficulty to stimulate the threat related to the presentation time of 3000ms. 5. The anxiety individuals in college entrance examination showed dynamic characteristics of attention bias to test-related threat stimulation, and the test-related threat stimulus attention bias appeared in the early pre-attention processing stage. And in the later stage of strategic processing, attention to threat stimulation to maintain or avoid. Threat level and cognitive load also regulate the bias of test anxiety to test-related threat stimulation attention bias. The limitations of this study, the results and applications of this study are discussed in depth, and some concrete suggestions are provided for the future research work and research direction.
【學(xué)位授予單位】:東南大學(xué)
【學(xué)位級別】:博士
【學(xué)位授予年份】:2016
【分類號】:B842.3

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