陶瓷基片外觀檢測及分揀系統(tǒng)設(shè)計
發(fā)布時間：2019-03-06 21:01
【摘要】：在電阻及電容的組成材料中,陶瓷基片的尺寸和表面光滑度都決定著電阻的阻值和電容的容量,同時隨著電子產(chǎn)業(yè)的發(fā)展,電阻、電容要求制作的越來越小,使得對陶瓷基片的檢測有更高的要求。目前市面上對陶瓷基片的檢測都是用視覺處理來克服人工檢測的缺陷,但大多數(shù)方法都是直接利用像素坐標進行參數(shù)計算,需要系統(tǒng)進行龐大的數(shù)據(jù)計算,并要通過硬件的精密配合來完成圖像的采集。本文在此基礎(chǔ)上做了改進,設(shè)計了陶瓷基片檢測器用來對陶瓷基片的表面光滑度、基片外形尺寸進行檢測,以及對矩形基片的垂直度檢測;設(shè)計了結(jié)合檢測結(jié)果對產(chǎn)品進行自動分揀的分揀機構(gòu)。具體工作內(nèi)容如下:(1)分析了基片的常見缺陷和尺寸大小,根據(jù)缺陷特征參數(shù)對基片是否含有缺陷進行判斷、分類,完成檢測器的檢測任務(wù)。系統(tǒng)中采用了穩(wěn)定性好、傳輸效率高的PPI通信協(xié)議,將嵌入式系統(tǒng)得出的檢測結(jié)果傳送至PLC,并通過對伺服電機的控制完成自動分揀功能,完成分揀機構(gòu)設(shè)計。最后,利用miniGUI來制作人機界面,完成整個過程的人機交互功能。(2)在基片檢測過程中,系統(tǒng)中為了克服傳統(tǒng)的缺陷參數(shù)計算過程中出現(xiàn)的誤差,先采用像素坐標計算的方法,得出計算結(jié)果一;然后求出基片重心,以及離重心最遠點和最近點的距離,來計算相關(guān)參數(shù),得出計算結(jié)果二;最后,將二者作分析比較,得出最終計算參數(shù),并設(shè)計參數(shù)計算程序。(3)系統(tǒng)在嵌入式平臺上,利用實時圖像采集程序和圖像處理程序得到單像素寬度的基片邊緣圖像。并使用亞像素算法得到供參數(shù)計算使用的亞像素邊緣坐標。(4)在實驗室現(xiàn)有的實驗條件下,搭建了系統(tǒng)的實驗平臺,對系統(tǒng)的各控制部分分別進行了實驗驗證。通過實驗結(jié)果發(fā)現(xiàn),系統(tǒng)的各個部分都能夠在相關(guān)程序的指引下完成相對應的系統(tǒng)功能,并且驗證了系統(tǒng)的設(shè)計可以在規(guī)定的時間及誤差范圍內(nèi)完成陶瓷基片的各項檢測及分揀功能,具有低功耗、低成本、安裝方便、精度高、實時性好等特點,并能夠克服傳統(tǒng)檢測的諸多缺點。
[Abstract]:In the composition materials of resistance and capacitance, the size and surface smoothness of ceramic substrate determine the resistance value and capacitance capacity. At the same time, with the development of electronic industry, the requirement of fabrication of resistance and capacitance becomes smaller and smaller. It makes the detection of ceramic substrate have higher requirements. At present, the detection of ceramic substrates on the market is to overcome the defects of manual inspection by visual processing, but most methods use pixel coordinates directly to calculate parameters, which requires a large amount of data calculation in the system. And through the precise cooperation of the hardware to complete the image acquisition. In this paper, the ceramic substrate detector is designed to detect the smooth surface of ceramic substrate, the size of the substrate, and the verticality of the rectangular substrate, on the basis of this, the ceramic substrate detector is designed to detect the smoothness of the surface of the ceramic substrate and the dimension of the substrate. A sorting mechanism for automatic sorting of products is designed based on the testing results. The main contents are as follows: (1) the common defects and the size of the substrate are analyzed, and the defects in the substrate are judged and classified according to the defect characteristic parameters, and the detection task of the detector is completed. The PPI communication protocol, which has good stability and high transmission efficiency, is adopted in the system. The test results obtained from the embedded system are transmitted to the PLC, and the automatic sorting function is completed through the control of the servo motor, and the sorting mechanism is designed. Finally, using miniGUI to make man-machine interface to complete the whole process of human-computer interaction. (2) in the process of substrate detection, the system in order to overcome the traditional error in the calculation of defect parameters, Firstly, the method of pixel coordinate calculation is used to get the first result. Then the center of gravity of the substrate and the distance from the farthest point and the nearest point of the center of gravity are calculated to calculate the related parameters and get the result of calculation. Finally, the final calculation parameters are obtained by comparing them. (3) on the embedded platform, the real-time image acquisition program and the image processing program are used to obtain the single pixel width image of the substrate edge. (3) the system uses the real-time image acquisition program and the image processing program to obtain the single pixel width substrate edge image. The sub-pixel edge coordinates for parameter calculation are obtained by using the sub-pixel algorithm. (4) under the existing experimental conditions in the laboratory, the experimental platform of the system is built, and the control parts of the system are verified by experiments. The experimental results show that each part of the system can complete the corresponding system functions under the guidance of the relevant procedures. And verified that the design of the system can complete the detection and sorting functions of ceramic substrates within the specified time and error range, with the characteristics of low power consumption, low cost, convenient installation, high precision and good real-time performance, and so on. It can overcome many shortcomings of traditional detection.
【學位授予單位】：太原科技大學
【學位級別】：碩士
【學位授予年份】：2016
【分類號】：TQ174.6;TP391.41
本文編號：2435891
[Abstract]:In the composition materials of resistance and capacitance, the size and surface smoothness of ceramic substrate determine the resistance value and capacitance capacity. At the same time, with the development of electronic industry, the requirement of fabrication of resistance and capacitance becomes smaller and smaller. It makes the detection of ceramic substrate have higher requirements. At present, the detection of ceramic substrates on the market is to overcome the defects of manual inspection by visual processing, but most methods use pixel coordinates directly to calculate parameters, which requires a large amount of data calculation in the system. And through the precise cooperation of the hardware to complete the image acquisition. In this paper, the ceramic substrate detector is designed to detect the smooth surface of ceramic substrate, the size of the substrate, and the verticality of the rectangular substrate, on the basis of this, the ceramic substrate detector is designed to detect the smoothness of the surface of the ceramic substrate and the dimension of the substrate. A sorting mechanism for automatic sorting of products is designed based on the testing results. The main contents are as follows: (1) the common defects and the size of the substrate are analyzed, and the defects in the substrate are judged and classified according to the defect characteristic parameters, and the detection task of the detector is completed. The PPI communication protocol, which has good stability and high transmission efficiency, is adopted in the system. The test results obtained from the embedded system are transmitted to the PLC, and the automatic sorting function is completed through the control of the servo motor, and the sorting mechanism is designed. Finally, using miniGUI to make man-machine interface to complete the whole process of human-computer interaction. (2) in the process of substrate detection, the system in order to overcome the traditional error in the calculation of defect parameters, Firstly, the method of pixel coordinate calculation is used to get the first result. Then the center of gravity of the substrate and the distance from the farthest point and the nearest point of the center of gravity are calculated to calculate the related parameters and get the result of calculation. Finally, the final calculation parameters are obtained by comparing them. (3) on the embedded platform, the real-time image acquisition program and the image processing program are used to obtain the single pixel width image of the substrate edge. (3) the system uses the real-time image acquisition program and the image processing program to obtain the single pixel width substrate edge image. The sub-pixel edge coordinates for parameter calculation are obtained by using the sub-pixel algorithm. (4) under the existing experimental conditions in the laboratory, the experimental platform of the system is built, and the control parts of the system are verified by experiments. The experimental results show that each part of the system can complete the corresponding system functions under the guidance of the relevant procedures. And verified that the design of the system can complete the detection and sorting functions of ceramic substrates within the specified time and error range, with the characteristics of low power consumption, low cost, convenient installation, high precision and good real-time performance, and so on. It can overcome many shortcomings of traditional detection.
【學位授予單位】：太原科技大學
【學位級別】：碩士
【學位授予年份】：2016
【分類號】：TQ174.6;TP391.41
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