【摘要】：智能卡(SmartCard)即IC卡,是內(nèi)嵌有集成電路芯片的卡片。隨著物聯(lián)網(wǎng)技術(shù)和集成電路產(chǎn)業(yè)的發(fā)展,智能卡越來越普遍地應(yīng)用于生產(chǎn)生活的方方面面。其中非接觸式智能卡技術(shù)(NFC)的大力推廣和應(yīng)用即將成為今后幾年的科技發(fā)展趨勢(shì)。在智能卡領(lǐng)域,讀卡器和智能卡設(shè)備的適配性越來越多地成為智能卡推廣和走向成熟發(fā)展的瓶頸。由于不同生產(chǎn)廠家、不同工藝水平、不同技術(shù)標(biāo)準(zhǔn),上市的智能卡設(shè)備和智能卡讀卡器并不能完全兼容和匹配。無論是接觸式智能卡設(shè)備還是非接觸式智能卡設(shè)備,硬件和軟件的故障檢測(cè)和故障處理能力都是十分重要的。傳統(tǒng)的測(cè)試方法采用了分立的MCU芯片和專用芯片分別用來支持協(xié)議層和物理層的應(yīng)用,相關(guān)的工作參數(shù)已經(jīng)固化,但是在系統(tǒng)的可擴(kuò)展性方面和傳輸速率方面有所欠缺。本文分別針對(duì)接觸式智能卡和非接觸式智能卡(特指NFC技術(shù))提出了一種具有高度靈活性的智能卡仿真測(cè)試系統(tǒng)的設(shè)計(jì)和實(shí)現(xiàn)。在一定范圍內(nèi),可以對(duì)載波頻率、調(diào)制深度等技術(shù)指標(biāo)進(jìn)行控制,兼容不同的應(yīng)用層協(xié)議,實(shí)現(xiàn)測(cè)試的可定制化和可復(fù)用特性。本論文的研究?jī)?nèi)容和創(chuàng)新點(diǎn)如下1.針對(duì)接觸式智能卡,依照ISO/IEC7816協(xié)議,實(shí)現(xiàn)了智能卡的模擬系統(tǒng),可以與智能卡讀卡器設(shè)備相交互,實(shí)現(xiàn)特定內(nèi)容命令的檢測(cè)和故障容錯(cuò)功能校驗(yàn),可以對(duì)特定應(yīng)用及其協(xié)議命令進(jìn)行定制化測(cè)試。2.針對(duì)非接觸式智能卡,依照ISO/IEC14443協(xié)議,仿真了智能卡讀卡器的系統(tǒng),實(shí)現(xiàn)在可配置工作頻率、調(diào)制深度和其他指標(biāo)的情況下,可以與NFC標(biāo)簽設(shè)備進(jìn)行通信,檢測(cè)NFC標(biāo)簽設(shè)備在不同參數(shù)條件下的適配性。3.智能卡仿真測(cè)試系統(tǒng)的硬件平臺(tái)為ARM+FPGA架構(gòu)的ZYNQ-7000 SOC。這樣的設(shè)計(jì)充分發(fā)揮了器件的優(yōu)勢(shì),同時(shí)應(yīng)用了高性能、低延遲的AXI片內(nèi)總線和DMA傳輸方式。相比于傳統(tǒng)的仿真測(cè)試方法,基于ZYNQ-7000 SOC的解決方案可以在不改變硬件電路的情況下,通過修改代碼來完成新的智能卡功能。軟硬件的可重構(gòu)特性保證了它也可以滿足未來的新型智能卡設(shè)備的測(cè)試需求。
[Abstract]:Smart card (SmartCard), or IC card, is a card embedded with integrated circuit chips. With the development of Internet of things technology and integrated circuit industry, smart cards are more and more widely used in all aspects of production and life. The promotion and application of contactless smart card technology (NFC) will be the trend of science and technology development in the next few years. In the field of smart card, the adaptability of card reader and smart card equipment has become the bottleneck of the popularization and development of smart card. Due to different manufacturers, different technology levels and different technical standards, the available smart card devices and smart card readers are not fully compatible and compatible. Whether contact smart card equipment or contactless smart card equipment, hardware and software fault detection and fault processing capabilities are very important. The traditional test method uses separate MCU chip and special chip to support the application of protocol layer and physical layer respectively. The related working parameters have been solidified, but the system scalability and transmission rate are not enough. This paper presents the design and implementation of a smart card simulation and testing system with high flexibility for contact smart card and contactless smart card (NFC technology in particular). In a certain range, the carrier frequency, modulation depth and other technical specifications can be controlled, compatible with different application layer protocols, and the test can be customized and reusable. The contents and innovations of this thesis are as follows. According to ISO/IEC7816 protocol, the simulation system of smart card is implemented for contact smart card, which can interact with smart card reader equipment, and realize the detection of specific content command and fault tolerance function check. Can be customized for specific applications and their protocol commands. 2. For contactless smart card, according to ISO/IEC14443 protocol, the system of smart card reader is simulated, which can communicate with NFC tag device under the condition of configurable working frequency, modulation depth and other indexes. Test the adaptability of NFC tag equipment under different parameters. 3. 3. The hardware platform of smart card simulation test system is ZYNQ-7000 SOC. based on ARM FPGA architecture This design gives full play to the advantages of the device, and uses high performance, low delay AXI on-chip bus and DMA transmission mode. Compared with the traditional simulation test method, the solution based on ZYNQ-7000 SOC can complete the new smart card function by modifying the code without changing the hardware circuit. The reconfigurable property of hardware and software ensures that it can also meet the testing requirements of new smart card devices in the future.
【學(xué)位授予單位】：北京郵電大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2016
【分類號(hào)】：TN409;TP391.9

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