Straight and Bent nano-cantilever specimens are respectively proposed to investigate the single-mode and mixed-mode crack initiation at the Cu/Si interface edge in nanoscale components. With a minute loading apparatus, all nanoscale samples are in situ loaded and observed. Numerical analysis is employed to acquire the critical interfacial stress distributions during crack initiation. The stress concentration regions near the edge of Cu/Si interface in all specimens are within the scale of 100 nm... 

【文章來源】：Acta Mechanica Solida Sinica. 2016,29(04)EISCICSCD

【文章頁數(shù)】：13 頁


本文編號：3602175