藍(lán)寶石襯底拋光過程磨粒軌跡與加工平整性研究
[Abstract]:Sapphire single crystals have excellent optical, mechanical, chemical and electrical properties, high hardness, high strength, high temperature resistance and good light permeability, which make them more and more widely used in the fields of optoelectronics, communication, national defense and so on. Because sapphire has stable chemical and physical mechanical properties, this greatly increases the processing difficulty of sapphire material. With the development of optics, microelectronics and related technologies, high processing efficiency, high surface precision and low surface and sub-surface damage are required, so the fabrication technology of sapphire wafers is facing great challenges. As a typical hard and brittle material, the processing technology of sapphire is not mature. Because sapphire has special applications in aerospace, deep space exploration and other military fields, the processing technology of single crystal sapphire is extremely secret in the west. In order to achieve high efficiency, high precision and high quality flat machining of single crystal sapphire, grinding and polishing technology emerged as the times require. Grinding is mainly to remove the micro-protruding part of the wafer surface by micro-cutting of the abrasive particles to ensure the planeness of the wafer, and the polishing is mainly to reduce the surface roughness of the wafer, make the machined surface mirrorized, and reduce the surface and sub-surface damage of the wafer. As grinding and polishing is a systematic project, it needs a high stability process condition, its material removal mechanism and material non-uniformity formation mechanism are not perfect, the grinding and polishing process is studied by means of experimental method. Because of the influence of test conditions and the limitation of test cost, the combination of test and simulation is an effective means to study the mechanism of grinding and polishing and to optimize the processing technology. In this paper, the relative motion model between the workpiece and the polishing disc is established, and the kinematics principle and coordinate transformation are used to obtain the motion trajectory equation of the abrasive particle, and the formula of trajectory length and curve curvature are derived. The effects of rotational speed ratio, eccentricity, particle diameter and initial angle on the morphology and curve curvature of abrasive particles during grinding and polishing were analyzed by MATLAB software. On this basis, the variation coefficient is used to analyze the inhomogeneity of track length, velocity and pressure distribution, and the uniform wear equation of workpiece is obtained by "calculus" method. In order to satisfy the condition of uniform wear of workpiece, the effects of rotating speed, rotation speed, eccentricity and diameter of abrasive particle on wear factor were analyzed respectively. In order to explore the stress change of workpiece contact during grinding and polishing, a 3D model of workpiece, polishing pad, polishing pad and contact between workpiece, polishing pad and retaining ring is established by using commercial finite element software Abaqus, and the downward pressure is simulated and analyzed. The influence of thickness of polishing pad, elastic modulus of polishing pad, Poisson's ratio of polishing pad and friction coefficient between workpiece and polishing pad on contact stress distribution and non-uniformity of stress distribution. On the basis of the above theory and simulation, the polishing experiment of sapphire substrate will be carried out in this paper. The effects of different pressure, rotating speed of upper and lower disk and polishing pad on the removal rate and surface roughness of chemical-mechanical polishing material on sapphire substrate were studied by single factor experiment. The theory, simulation and experiment are used to improve the grinding and polishing process of sapphire, which provides theoretical guidance for understanding the mechanism of grinding and polishing and the design of grinding polishing machine.
【學(xué)位授予單位】:昆明理工大學(xué)
【學(xué)位級別】:碩士
【學(xué)位授予年份】:2017
【分類號】:O786
【參考文獻(xiàn)】
相關(guān)期刊論文 前10條
1 張保國;劉玉嶺;;藍(lán)寶石晶片加工中的技術(shù)關(guān)鍵和對策[J];人工晶體學(xué)報;2016年04期
2 黃建東;李軍;宋龍龍;花成旭;胡章貴;朱永偉;左敦穩(wěn);;拋光液酸堿性對固結(jié)磨料拋光硫化鋅晶體的影響[J];人工晶體學(xué)報;2016年02期
3 施純俊;張連翰;洪佳琪;張方方;潘世烈;杭寅;;藍(lán)寶石晶體的熱學(xué)性能研究[J];人工晶體學(xué)報;2015年10期
4 WANG TongQing;LU XinChun;ZHAO DeWen;HE YongYong;;Contact stress non-uniformity of wafer surface for multi-zone chemical mechanical polishing process[J];Science China(Technological Sciences);2013年08期
5 高慧瑩;費玖海;;拋光盤、拋光頭轉(zhuǎn)速比對化學(xué)機(jī)械拋光效果的影響分析[J];電子工業(yè)專用設(shè)備;2011年05期
6 朱永偉;王軍;李軍;林魁;;固結(jié)磨料拋光墊拋光硅片的探索研究[J];中國機(jī)械工程;2009年06期
7 楊鑫宏,胡忠輝,張偉,胡孝勇;平面研磨中基于磨具均勻磨損的磨具設(shè)計方法研究[J];機(jī)械工程學(xué)報;2004年11期
8 吳宏基,曹利新,劉健,郭麗莎;行星式平面研磨機(jī)研拋過程運動軌跡分析[J];大連理工大學(xué)學(xué)報;2002年04期
9 吳宏基,曹利新,劉 健;基于行星式平面研磨機(jī)研拋過程的運動幾何學(xué)分析[J];機(jī)械工程學(xué)報;2002年06期
10 史興寬,仝猛,袁昕,任敬心;散粒磨粒拋光運動軌跡的仿真與合理參數(shù)的選擇[J];航空精密制造技術(shù);1998年03期
相關(guān)博士學(xué)位論文 前5條
1 柯瑞;輻照/壓痕載荷/表面圖形化條件下藍(lán)寶石單晶性能研究[D];哈爾濱工業(yè)大學(xué);2014年
2 周圣軍;大功率GaN基LED芯片設(shè)計與制造技術(shù)研究[D];上海交通大學(xué);2011年
3 余劍峰;新型化學(xué)機(jī)械拋光墊和拋光液的研究[D];華南理工大學(xué);2010年
4 田業(yè)冰;大尺寸硅片磨削平整化理論與工藝技術(shù)的研究[D];大連理工大學(xué);2007年
5 蘇建修;IC制造中硅片化學(xué)機(jī)械拋光材料去除機(jī)理研究[D];大連理工大學(xué);2006年
相關(guān)碩士學(xué)位論文 前3條
1 袁志勇;藍(lán)寶石動態(tài)腐蝕行為及機(jī)理[D];哈爾濱工業(yè)大學(xué);2011年
2 王長征;超精密平面研磨劃痕形成的建模與仿真[D];南京航空航天大學(xué);2006年
3 陳懷松;邊界潤滑狀態(tài)下往復(fù)摩擦磨損的數(shù)值仿真研究[D];武漢理工大學(xué);2005年
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