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航天器介質(zhì)充電效應(yīng)模擬試驗(yàn)中的電位測(cè)量技術(shù)及應(yīng)用

發(fā)布時(shí)間:2018-08-14 15:25
【摘要】:航天器所運(yùn)行的空間輻射環(huán)境復(fù)雜而多變,內(nèi)部充放電效應(yīng)是威脅其安全的重要環(huán)境效應(yīng)之一。放電不僅會(huì)對(duì)航天器介質(zhì)本身造成損傷,影響介質(zhì)的絕緣性能,其產(chǎn)生的ESD(Electro-Static Discharge)脈沖還會(huì)干擾航天器上電子系統(tǒng)的正常工作,嚴(yán)重時(shí)使航天器發(fā)生故障。地面模擬試驗(yàn)是研究充放電效應(yīng)的有效手段,其中介質(zhì)所能達(dá)到的充電電位是地面模擬試驗(yàn)和材料電導(dǎo)率測(cè)量試驗(yàn)中需要獲取的主要參數(shù)。因此,在地面模擬試驗(yàn)中對(duì)材料的充電電位進(jìn)行準(zhǔn)確測(cè)量具有重要意義。文章基于介質(zhì)充電電位的非接觸式轉(zhuǎn)接測(cè)量方法,分析了測(cè)量中引起誤差的各個(gè)因素,提出了減小測(cè)量誤差和提高轉(zhuǎn)接測(cè)量分辨率的方法,并進(jìn)行試驗(yàn)驗(yàn)證。據(jù)此設(shè)計(jì)了一套介質(zhì)電位非接觸式轉(zhuǎn)接測(cè)量系統(tǒng),其測(cè)量分辨率達(dá)到10V以下,且由電荷泄漏引起的測(cè)量誤差1%,能夠滿足航天器介質(zhì)充電電位的測(cè)量要求。同時(shí),本文選取了環(huán)氧樹脂和聚酰亞胺這兩種航天器常用介質(zhì)材料,利用作者設(shè)計(jì)的介質(zhì)電位非接觸式轉(zhuǎn)接測(cè)量系統(tǒng),對(duì)電荷貯存衰減法測(cè)量介質(zhì)電導(dǎo)率的影響因素進(jìn)行了探究。試驗(yàn)結(jié)果表明,采用相同輻照源不同初始電位所得的介質(zhì)電導(dǎo)率基本一致,采用不同輻照源相近初始電位所得的電導(dǎo)率也基本一致。這說(shuō)明采用電荷貯存衰減法測(cè)量介質(zhì)電導(dǎo)率時(shí),可以忽略不同輻照源(放射源和電子槍)和不同初始衰減電位對(duì)測(cè)量結(jié)果的影響。
[Abstract]:The space radiation environment of spacecraft is complex and changeable, and the internal charge and discharge effect is one of the important environmental effects threatening its safety. The ESD (Electro-Static Discharge) pulse generated by the discharge will not only damage the spacecraft dielectric itself and affect the dielectric insulation, but also interfere with the normal operation of the electronic system on the spacecraft and cause the spacecraft to fail seriously. Ground simulation test is an effective means to study charge and discharge effect. The charge potential which can be achieved by medium is the main parameter to be obtained in ground simulation test and material conductivity measurement test. Therefore, it is of great significance to accurately measure the charging potential of the material in the ground simulation test. Based on the non-contact measurement method of dielectric charging potential, the factors causing errors in measurement are analyzed, and a method to reduce the measurement error and improve the resolution of transfer measurement is put forward, and the experimental results are verified. Based on this, a non-contact measuring system for dielectric potential is designed. The measuring resolution is less than 10V, and the measurement error caused by charge leakage is 1, which can meet the requirement of measuring dielectric charging potential of spacecraft. At the same time, this paper selects epoxy resin and polyimide, two kinds of spacecraft commonly used dielectric materials, using the dielectric potential non-contact measurement system designed by the author. The factors influencing the measurement of dielectric conductivity by charge storage attenuation method are discussed. The results show that the conductivities of different initial potentials of the same irradiation sources are basically the same, and the conductivities of the same initial potentials of different radiation sources are basically the same. This shows that the influence of different irradiation sources (radiation sources and electron guns) and different initial attenuation potentials on the measurement results can be neglected when using charge storage attenuation method to measure dielectric conductivity.
【學(xué)位授予單位】:中國(guó)科學(xué)院國(guó)家空間科學(xué)中心
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2016
【分類號(hào)】:V416

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