電子式互感器動(dòng)態(tài)特性測(cè)試終端嵌入式控制器研究與設(shè)計(jì)
發(fā)布時(shí)間:2018-06-20 22:25
本文選題:電子式互感器 + 嵌入式控制終端; 參考:《電子科技大學(xué)》2014年碩士論文
【摘要】:互感器對(duì)變電站輸電線路上的電壓、電流信號(hào)進(jìn)行變換并傳輸給變電站的二次設(shè)備,使之進(jìn)行計(jì)量、保護(hù)、狀態(tài)檢測(cè)等重要任務(wù)。電子式互感器是近年來(lái)逐漸取代傳統(tǒng)電磁式互感器的新型設(shè)備,相對(duì)電磁式互感器其主要性能指標(biāo)得到提升之外,電子式互感器最大的特點(diǎn)是輸出信號(hào)為數(shù)字信號(hào)。這一特點(diǎn)是實(shí)現(xiàn)變電站二次設(shè)備網(wǎng)絡(luò)化的基礎(chǔ),是變電站實(shí)現(xiàn)智能化和自動(dòng)化的前提。在目前階段,我國(guó)的電子式互感器還處在試運(yùn)行階段。由于測(cè)試、校驗(yàn)方法和項(xiàng)目太過(guò)基礎(chǔ),而且主要針對(duì)的是電子式互感器的傳感器環(huán)節(jié),難以完成對(duì)電子式互感器整體結(jié)構(gòu)的動(dòng)態(tài)響應(yīng)特性進(jìn)行測(cè)試和評(píng)估,已經(jīng)影響了電子式互感器的推廣運(yùn)用進(jìn)程。在此背景下,四川電力科學(xué)研究院與電子科技大學(xué)能源科學(xué)與工程學(xué)院電力系統(tǒng)廣域測(cè)量與控制實(shí)驗(yàn)室展開(kāi)合作,研究電子式互感器動(dòng)態(tài)響應(yīng)特性測(cè)試的方法并開(kāi)發(fā)相關(guān)儀器設(shè)備。電子式互感器動(dòng)態(tài)響應(yīng)特性測(cè)試的方法,是輸出復(fù)雜電磁暫態(tài)仿真信號(hào),測(cè)試電子式互感器設(shè)備中的采集系統(tǒng)在這類(lèi)信號(hào)下的響應(yīng),以此對(duì)電子式互感器的特性做出評(píng)估。電子式互感器動(dòng)態(tài)響應(yīng)測(cè)試儀器包括上位機(jī)平臺(tái)、高壓運(yùn)放模塊和嵌入式控制終端,可以對(duì)一組三相線路上的電壓、電流傳感器輸出進(jìn)行仿真模擬,仿真的信號(hào)輸入到測(cè)試對(duì)象——電子式電壓互感器和電子式電流互感器的數(shù)據(jù)傳送模塊上。電子式互感器的響應(yīng)信號(hào)由合并單元輸出,上位機(jī)平臺(tái)獲取輸出數(shù)據(jù)并對(duì)數(shù)據(jù)進(jìn)行分析。ARM是一種基于RISC的CPU內(nèi)核架構(gòu),基于ARM內(nèi)核的控制器件具有功能強(qiáng)、能耗低、成本低、結(jié)構(gòu)靈活的特點(diǎn),被廣泛的應(yīng)用到了包括嵌入式控制在內(nèi)的各個(gè)領(lǐng)域。搭載Linux操作系統(tǒng)的ARM嵌入式控制器可以很好的完成網(wǎng)絡(luò)通訊的任務(wù)。FPGA是一種并行結(jié)構(gòu)的數(shù)字邏輯器件,可以實(shí)現(xiàn)復(fù)雜的算法底層加速、硬件并行控制和多協(xié)議處理等任務(wù)。隨著IC技術(shù)的發(fā)展,FPGA也越來(lái)越多的應(yīng)用到了系統(tǒng)級(jí)的嵌入式控制任務(wù)。電子式互感器動(dòng)態(tài)響應(yīng)特性測(cè)試儀的嵌入式終端由6套FPGA+ARM架構(gòu)的訂制系統(tǒng)板組成。在深入研究FPGA邏輯控制器和ARM處理器特性和設(shè)計(jì)方式之后,結(jié)合電子式互感器動(dòng)態(tài)特性測(cè)試需要的電磁暫態(tài)信號(hào)特征,本文詳細(xì)介紹了儀器的嵌入式終端的功能設(shè)計(jì)。包括外部與內(nèi)部硬件資源接口設(shè)計(jì)、緩存數(shù)據(jù)流的設(shè)計(jì)、6終端主/從模式的設(shè)計(jì)和相應(yīng)的同步方法。在此基礎(chǔ)上,本文講述了嵌入式控制終端如何與上位機(jī)軟件傳輸?shù)臄?shù)據(jù)與命令協(xié)調(diào)配合,以多種數(shù)據(jù)流操控方式和同步方式輸出仿真數(shù)據(jù),并通過(guò)嵌入式控制器的特性輔助上位機(jī)平臺(tái)的分析。本文的最后對(duì)電子式互感器的動(dòng)態(tài)測(cè)試方法做出展望,并針對(duì)目前研制的儀器的特性提出了改進(jìn)的方案和建議。
[Abstract]:Transformer transforms the voltage and current signals of substation transmission lines and transmits them to the secondary equipment of the substation for important tasks such as metering, protection, state detection and so on. Electronic transformer is a new type of equipment which gradually replaces the traditional electromagnetic transformer in recent years. Compared with the main performance index of electromagnetic transformer, the biggest characteristic of electronic transformer is that the output signal is digital signal. This characteristic is the foundation of realizing the network of secondary equipment in substation and the premise of realizing intelligence and automation in substation. At present, the electronic transformer of our country is still in the trial operation stage. Because the testing, checking methods and items are too basic, and mainly aimed at the sensor link of electronic transformer, it is difficult to test and evaluate the dynamic response characteristics of the whole structure of electronic transformer. Has affected the electronic transformer promotion and application process. In this context, the Sichuan Electric Power Research Institute and the Power system wide area Measurement and Control Laboratory of the School of Energy Science and Engineering, University of Electronic Science and Technology, The method of measuring dynamic response characteristics of electronic transformers is studied and related instruments and equipments are developed. The test method of dynamic response characteristic of electronic transformer is to output complex electromagnetic transient simulation signal and test the response of acquisition system in electronic transformer equipment under this kind of signal so as to evaluate the characteristic of electronic transformer. The dynamic response test instrument of electronic transformer includes upper computer platform, high voltage operational amplifier module and embedded control terminal. It can simulate the output of voltage and current sensors on a group of three-phase lines. The simulated signal is input to the data transfer module of electronic voltage transformer and electronic current transformer. The response signal of electronic transformer is output by the merging unit. The upper computer platform acquires the output data and analyzes the data. Arm is a kind of CPU kernel architecture based on RISC. The control device based on arm kernel has strong function, low energy consumption and low cost. Flexible structure has been widely used in various fields, including embedded control. Arm embedded controller with Linux operating system can accomplish the task of network communication very well. FPGA is a kind of digital logic device with parallel structure, which can realize complex tasks such as algorithm bottom acceleration, hardware parallel control and multi-protocol processing. With the development of IC technology, FPGA is applied more and more to the embedded control task of system level. The embedded terminal of the electronic transformer dynamic response characteristic tester consists of six sets of FPGA arm architecture custom system board. After studying the characteristics and design methods of FPGA logic controller and arm processor, this paper introduces the function design of the embedded terminal of the instrument in detail, combined with the electromagnetic transient signal characteristics needed for the dynamic characteristic testing of electronic transformer. It includes the design of external and internal hardware resource interface, the design of cache data stream, the design of master / slave mode and the corresponding synchronization method. On this basis, this paper describes how the embedded control terminal coordinates with the data and commands transmitted by the host computer software, and outputs the simulation data in a variety of data stream manipulation and synchronization modes. The analysis of PC platform is aided by the characteristic of embedded controller. In the end of this paper, the dynamic testing method of electronic transformer is prospected, and the improvement scheme and suggestion are put forward in view of the characteristics of the instrument developed at present.
【學(xué)位授予單位】:電子科技大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2014
【分類(lèi)號(hào)】:TM45
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