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集成電路布圖設(shè)計獨創(chuàng)性的認(rèn)定

發(fā)布時間:2019-03-02 07:54
【摘要】:由于集成電路布圖設(shè)計產(chǎn)業(yè)的發(fā)展迅速,知識產(chǎn)權(quán)法律體系也相應(yīng)設(shè)置了新的知識產(chǎn)權(quán)類型——集成電路布圖設(shè)計專有權(quán)。目前,這種新型權(quán)利的保護(hù)體系尚存在諸多不足,而無論在理論上還是實務(wù)上,集成電路布圖設(shè)計獨創(chuàng)性的認(rèn)定都是難題。布圖設(shè)計的獨創(chuàng)性包含兩個方面:創(chuàng)作人原始創(chuàng)作的布圖設(shè)計的獨創(chuàng)性和通過反向工程而來的布圖設(shè)計的獨創(chuàng)性。由于我國集成電路布圖設(shè)計授權(quán)采用登記制度,并不進(jìn)行類似專利法上的實質(zhì)性審查程序,因此,一個布圖設(shè)計是否具有獨創(chuàng)性大多只能在集成電路布圖設(shè)計侵權(quán)司法實踐中被討論和評價。然而,迄今為止,國內(nèi)外尚未形成一個完整而規(guī)范的獨創(chuàng)性認(rèn)定方法和規(guī)則。本文共有四章: “第一章集成電路布圖設(shè)計的獨創(chuàng)性認(rèn)定現(xiàn)狀”,本章通過比較各國集成電路布圖設(shè)計的立法現(xiàn)狀,提出獨創(chuàng)性概念,然而因為該概念過于原則化,司法實踐中對集成電路布圖設(shè)計獨創(chuàng)性的認(rèn)定存在困難。 “第二章集成電路布圖設(shè)計獨創(chuàng)性的內(nèi)涵”,本章對集成電路布圖設(shè)計獨創(chuàng)性內(nèi)涵進(jìn)行分解,為獨立完成和達(dá)到一定的創(chuàng)作高度。其中,獨立完成的內(nèi)涵通過布圖設(shè)計的獨創(chuàng)性與著作權(quán)作品的獨創(chuàng)性相比可得出,而創(chuàng)作高度的內(nèi)涵通過布圖設(shè)計的創(chuàng)作高度與著作權(quán)作品及發(fā)明創(chuàng)造的創(chuàng)作高度相對比可得出。獨創(chuàng)性的內(nèi)涵確定后,方能進(jìn)行獨創(chuàng)性認(rèn)定。 “第三章司法實踐中集成電路布圖設(shè)計的獨創(chuàng)性認(rèn)定”,本章結(jié)合國內(nèi)外相關(guān)典型案例,分析在司法實踐中獨創(chuàng)性認(rèn)定的情形,針對司法實踐中對于獨創(chuàng)性認(rèn)定的不足提出建議,并適當(dāng)借鑒反向工程侵權(quán)抗辯認(rèn)定的實踐標(biāo)準(zhǔn)和理論標(biāo)準(zhǔn),試圖將這些標(biāo)準(zhǔn)帶來的啟示用于集成電路布圖設(shè)計的獨創(chuàng)性認(rèn)定。 “第四章對我國集成電路布圖設(shè)計獨創(chuàng)性認(rèn)定的建議”,本章基于前三章對布圖設(shè)計獨創(chuàng)性內(nèi)涵及可借鑒的認(rèn)定方法和規(guī)則,參考、借鑒國外著作權(quán)作品獨創(chuàng)性認(rèn)定的理論,結(jié)合我國布圖設(shè)計產(chǎn)業(yè)的技術(shù)發(fā)展現(xiàn)狀和產(chǎn)業(yè)需求,對我國布圖設(shè)計獨創(chuàng)性認(rèn)定,,提出一套具有可操作性的方法。隨著22/20納米時代的到來,集成電路布圖設(shè)計產(chǎn)業(yè)將面臨前所未有的挑戰(zhàn),布圖設(shè)計獨創(chuàng)性認(rèn)定也到了需要轉(zhuǎn)換思路的重要時刻。我國作為世界上集成電路產(chǎn)品消耗量最大的國家,必須引起重視,做到未雨綢繆,盡早思考新時期集成電路布圖設(shè)計獨創(chuàng)性的認(rèn)定方法和規(guī)則,才能真正為我國集成電路產(chǎn)業(yè)的健康、快速發(fā)展保駕護(hù)航。
[Abstract]:Due to the rapid development of integrated circuit layout design industry, a new type of intellectual property right, integrated circuit layout design exclusive right, has been set up in the legal system of intellectual property rights. At present, there are still many shortcomings in the protection system of this new type of rights, and the original identification of the layout design of integrated circuits is a difficult problem both in theory and in practice. The originality of layout design consists of two aspects: the originality of the original layout design created by the creator and the originality of the layout design through reverse engineering. Since China authorizes the adoption of a registration system for layout designs of integrated circuits and does not conduct substantive review procedures similar to those in the patent law, Whether a layout design is original or not can only be discussed and evaluated in the judicial practice of IC layout design infringement. However, up to now, there has not been a complete and normative original identification method and rules at home and abroad. There are four chapters in this paper: "the first chapter is the status quo of original identification of integrated circuit layout design". By comparing the legislative status of integrated circuit layout design in various countries, this chapter puts forward the concept of originality, however, because the concept is too principled, In judicial practice, it is difficult to identify the originality of integrated circuit layout design. "the second chapter is the original connotation of integrated circuit layout design", this chapter decomposes the original connotation of integrated circuit layout design so as to complete and achieve a certain height of creation independently. Among them, the connotation of independent completion can be obtained by comparing the originality of layout design with the originality of copyright works. The connotation of creation height can be obtained by comparing the creation height of layout design with that of copyright works and invention-creation. Only when the connotation of originality is determined can the originality be identified. "the third chapter of the original identification of integrated circuit layout design in judicial practice", this chapter combined with the relevant typical cases at home and abroad, analyze the unique identification in judicial practice. In view of the deficiency of original identification in judicial practice, this paper attempts to apply the inspiration of these standards to the original identification of layout design of integrated circuits by drawing on the practical and theoretical standards of reverse engineering tort defense identification, and tries to apply the enlightenment brought by these standards to the original identification of layout design of integrated circuits. "the fourth chapter of our integrated circuit layout design originality of the proposal", this chapter based on the first three chapters of the original connotation of layout design and can learn from the methods and rules, reference, use for reference, foreign copyright works of the original identification theory, the first three chapters of the layout design originality of the original connotation of layout design and the identification methods and rules for reference, Combined with the present situation of technology development and industrial demand of China's layout design industry, this paper puts forward a set of maneuverable methods for the original identification of China's layout design. With the arrival of the 22 / 20 nanometre era, the layout design industry of integrated circuits will face unprecedented challenges, and the original identification of layout design has reached an important time when the train of thought needs to be converted. China, as the country with the largest consumption of integrated circuit products in the world, must attach great importance to it, make preparations ahead of time, and consider as soon as possible the methods and rules for identifying the originality of layout design of integrated circuits in the new era. In order to truly protect the healthy and rapid development of China's integrated circuit industry.
【學(xué)位授予單位】:華東政法大學(xué)
【學(xué)位級別】:碩士
【學(xué)位授予年份】:2014
【分類號】:D923.4

【參考文獻(xiàn)】

相關(guān)期刊論文 前3條

1 于鵬;杜嬌;游濤;謝學(xué)軍;;集成電路反向工程知識產(chǎn)權(quán)問題探析[J];中國集成電路;2010年11期

2 張成立;;論侵犯集成電路布圖設(shè)計的法律救濟(jì)[J];科技創(chuàng)業(yè)月刊;2006年09期

3 盛大銓;論集成電路及其布圖設(shè)計的法律保護(hù)[J];南京郵電學(xué)院學(xué)報(社會科學(xué)版);2002年04期



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