極化光譜發(fā)射率測量裝置的研制
發(fā)布時(shí)間：2019-03-25 18:43
【摘要】：發(fā)射率是表征材料熱物性的參數(shù)之一,代表了物體對外輻射能力的強(qiáng)弱,在輻射測溫、航空航天、遙感、軍事隱身、醫(yī)學(xué)理療等方面都有著重要的應(yīng)用。相比全波長發(fā)射率,材料的光譜發(fā)射率攜帶的信息更加全面,應(yīng)用也更加廣泛,目前已成功應(yīng)用于分子識(shí)別、隱身材料輻射特性評價(jià)以及紅外基礎(chǔ)研究等領(lǐng)域。例如在輻射測溫中,材料準(zhǔn)確的發(fā)射率數(shù)據(jù)決定了輻射測溫儀的測量精度。但在不同的測量條件下,材料的發(fā)射率是一個(gè)易變的量,受溫度、波長、粗糙度等諸多因素的影響,這嚴(yán)重制約了輻射測溫的快速發(fā)展。與非極化的發(fā)射率相比。材料的極化光譜發(fā)射率具有一些特殊性質(zhì),通過研究材料極化光譜發(fā)射率的變化規(guī)律可以探索其在輻射測溫以及遙感等領(lǐng)域的應(yīng)用。近年來,國內(nèi)外開始加強(qiáng)了對材料極化輻射性質(zhì)的研究。但不得不承認(rèn):極化發(fā)射率相關(guān)的測量設(shè)備依舊很少,相應(yīng)的極化發(fā)射率數(shù)據(jù)也十分匱乏。因此本文在國家自然科學(xué)基金的支持下,建立了一套極化光譜發(fā)射率測量實(shí)驗(yàn)裝置,并對純鋁以及鈦合金的輻射性質(zhì)做了深入的研究。本文主要工作如下:1、基于能量法建立了一套極化光譜發(fā)射率測量實(shí)驗(yàn)裝置,裝置一共包括樣品加熱和控溫系統(tǒng)、黑體、光學(xué)系統(tǒng)、機(jī)械系統(tǒng)、電測系統(tǒng)以及信號采集系統(tǒng)。其中樣品加熱系統(tǒng)和黑體爐屬于裝置中的輻射信號源;光學(xué)系統(tǒng)主要包括由濾波片、偏振分束立方、輻射探頭、光纖和光開關(guān);機(jī)械系統(tǒng)主要用于控制樣品和黑體的轉(zhuǎn)換以及實(shí)現(xiàn)不同角度的輻射測量;電測系統(tǒng)由以下兩部分組成:1、探測器;2、由斬波器和鎖相放大器組成的放大系統(tǒng);信號采集系統(tǒng)基于Labview軟件控制了電機(jī)的旋轉(zhuǎn),并對鎖相放大器的輸出信號做了采集和存儲(chǔ)。2、對裝置幾個(gè)重要方面,包括樣品溫度均勻性、黑體爐軸向溫度均勻性以及系統(tǒng)的響應(yīng)系數(shù)進(jìn)行了測試評價(jià)。通過將實(shí)驗(yàn)測得的硅片極化光譜發(fā)射率數(shù)據(jù)與理論模擬和國外實(shí)驗(yàn)數(shù)據(jù)做對比,驗(yàn)證了裝置的可靠性。3、提出了一種模擬粗糙金屬表面方向發(fā)射率的方法,通過理論計(jì)算和實(shí)驗(yàn)數(shù)據(jù)的對比說明了該方法可用于估算粗糙金屬氧化過程中0-70°的方向發(fā)射率,同時(shí)得到結(jié)論:隨著氧化程度的增加,粗糙純鋁表面0-70°的方向發(fā)射率逐漸增大,70°的發(fā)射率幾乎保持不變。運(yùn)用模擬計(jì)算的方向發(fā)射率去校準(zhǔn)粗糙純鋁的表面溫度,實(shí)驗(yàn)結(jié)果和熱電偶測量結(jié)果的對比證明了這種方向發(fā)射率模擬方法可用于輻射測溫,且在70°計(jì)算的發(fā)射率更適用于校準(zhǔn)氧化過程中的粗糙純鋁樣品的表面溫度。4、研究了熱氧化過程中Ti-6Al-4V合金的法向光譜發(fā)射率以及氧化過程中發(fā)射率波動(dòng)變化的具體原因。實(shí)驗(yàn)得出,氧化前Ti-6Al-4V合金的光譜發(fā)射率在823-973 K之間隨溫度呈近似線性的增長;當(dāng)氧化溫度低于873 K時(shí),發(fā)射率會(huì)隨氧化時(shí)間慢慢增長,當(dāng)溫度高于923 K時(shí),發(fā)射率會(huì)隨時(shí)間呈不同程度的波動(dòng)變化;表面粗糙度是影響發(fā)射率波動(dòng)曲線振幅變化的因素之一,由氧化膜和基底產(chǎn)生的干涉作用則是引起發(fā)射率波動(dòng)變化的主要原因;Ti-6Al-4V合金在空氣中進(jìn)行熱氧化時(shí),表面氧化膜遵循拋物線增長規(guī)律,且氧化速率在溫度大于923 K時(shí)會(huì)迅速增長。
[Abstract]:The emissivity is one of the parameters characterizing the thermal physical property of the material, which represents the strength of the external radiation ability of the object, and has an important application in the aspects of radiation temperature measurement, aerospace, remote sensing, military stealth, medical physical therapy and the like. Compared with the full-wavelength emissivity, the information carried by the spectral emissivity of the material is more comprehensive, the application is more extensive, and the invention has been successfully applied to the fields of molecular recognition, radiation characteristic evaluation of stealth materials and infrared-based research. For example, in the radiation temperature measurement, the accurate emissivity data of the material determines the measurement accuracy of the radiation thermometer. However, under different measuring conditions, the emissivity of the material is a variable quantity, influenced by many factors such as temperature, wavelength and roughness, which seriously restricts the rapid development of the radiation temperature measurement. In contrast to non-polarized emissivity. The polarization spectral emissivity of the material has some special properties, and its application in the fields of radiation temperature measurement and remote sensing can be explored by studying the variation of the polarization spectral emissivity of the material. In recent years, the research on the properties of the material's polarized radiation has been strengthened at home and abroad. However, it has to be admitted that the measurement equipment related to the polarization emissivity is still very small, and the corresponding polarized emissivity data is also very scarce. Based on the support of the National Natural Science Foundation of China, a set of experimental apparatus for measuring the emissivity of the polarization spectrum is set up, and the radiation properties of pure aluminum and titanium alloy are studied. The main work of this paper is as follows:1. An experimental device for measuring the emissivity of a set of polarization spectrum is established based on the energy method. The device includes a sample heating and temperature control system, a blackbody, an optical system, a mechanical system, an electric system and a signal acquisition system. wherein the sample heating system and the blackbody furnace belong to a radiation signal source in the device; the optical system mainly comprises a filter plate, a polarization beam splitting cube, a radiation probe, an optical fiber and an optical switch, wherein the mechanical system is mainly used for controlling the conversion of the sample and the black body and realizing the radiation measurement at different angles; the electric system consists of the following two parts:1, a detector;2, an amplification system consisting of a chopper and a phase-locked amplifier; the signal acquisition system controls the rotation of the motor based on the Labview software, and acquires and stores the output signal of the phase-locked amplifier; and 2, Including the uniformity of the temperature of the sample, the uniformity of the axial temperature of the blackbody furnace and the response coefficient of the system. the reliability of the device is verified by comparing the measured spectral emissivity data of the silicon wafer with the theoretical simulation and the foreign experimental data, and 3, a method for simulating the direction emissivity of the rough metal surface is provided, Through the comparison of the theoretical calculation and the experimental data, the method can be used to estimate the direction emissivity of 0-70 擄 in the rough metal oxidation process, and it is concluded that with the increase of the oxidation degree, The emissivity of the rough pure aluminum surface in the direction of 0-70 DEG is gradually increased, and the emissivity of 70 DEG is almost unchanged. The surface temperature of the rough pure aluminum, the experimental results and the comparison of the measurement results of the thermocouple are proved by using the directional emissivity of the simulation. The method can be used for the radiation temperature measurement. And the emissivity of the Ti-6Al-4V alloy in the thermal oxidation process and the specific cause of the change of the emissivity in the oxidation process are studied. The results show that the spectral emissivity of the pre-oxidized Ti-6Al-4V alloy increases linearly with the temperature in the range of 823-973K; when the oxidation temperature is lower than 873 K, the emissivity increases with the oxidation time, and when the temperature is higher than 923 K, the emissivity changes with the time; The surface roughness is one of the factors that affect the change of the amplitude of the emissivity fluctuation curve. The interference between the oxide film and the substrate is the main cause of the change of the emissivity. When the Ti-6Al-4V alloy is thermally oxidized in the air, the surface oxide film follows the law of the parabola growth. And the oxidation rate will increase rapidly when the temperature is greater than 923 k.
【學(xué)位授予單位】：河南師范大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2017
【分類號】：O433.1
本文編號：2447216
[Abstract]:The emissivity is one of the parameters characterizing the thermal physical property of the material, which represents the strength of the external radiation ability of the object, and has an important application in the aspects of radiation temperature measurement, aerospace, remote sensing, military stealth, medical physical therapy and the like. Compared with the full-wavelength emissivity, the information carried by the spectral emissivity of the material is more comprehensive, the application is more extensive, and the invention has been successfully applied to the fields of molecular recognition, radiation characteristic evaluation of stealth materials and infrared-based research. For example, in the radiation temperature measurement, the accurate emissivity data of the material determines the measurement accuracy of the radiation thermometer. However, under different measuring conditions, the emissivity of the material is a variable quantity, influenced by many factors such as temperature, wavelength and roughness, which seriously restricts the rapid development of the radiation temperature measurement. In contrast to non-polarized emissivity. The polarization spectral emissivity of the material has some special properties, and its application in the fields of radiation temperature measurement and remote sensing can be explored by studying the variation of the polarization spectral emissivity of the material. In recent years, the research on the properties of the material's polarized radiation has been strengthened at home and abroad. However, it has to be admitted that the measurement equipment related to the polarization emissivity is still very small, and the corresponding polarized emissivity data is also very scarce. Based on the support of the National Natural Science Foundation of China, a set of experimental apparatus for measuring the emissivity of the polarization spectrum is set up, and the radiation properties of pure aluminum and titanium alloy are studied. The main work of this paper is as follows:1. An experimental device for measuring the emissivity of a set of polarization spectrum is established based on the energy method. The device includes a sample heating and temperature control system, a blackbody, an optical system, a mechanical system, an electric system and a signal acquisition system. wherein the sample heating system and the blackbody furnace belong to a radiation signal source in the device; the optical system mainly comprises a filter plate, a polarization beam splitting cube, a radiation probe, an optical fiber and an optical switch, wherein the mechanical system is mainly used for controlling the conversion of the sample and the black body and realizing the radiation measurement at different angles; the electric system consists of the following two parts:1, a detector;2, an amplification system consisting of a chopper and a phase-locked amplifier; the signal acquisition system controls the rotation of the motor based on the Labview software, and acquires and stores the output signal of the phase-locked amplifier; and 2, Including the uniformity of the temperature of the sample, the uniformity of the axial temperature of the blackbody furnace and the response coefficient of the system. the reliability of the device is verified by comparing the measured spectral emissivity data of the silicon wafer with the theoretical simulation and the foreign experimental data, and 3, a method for simulating the direction emissivity of the rough metal surface is provided, Through the comparison of the theoretical calculation and the experimental data, the method can be used to estimate the direction emissivity of 0-70 擄 in the rough metal oxidation process, and it is concluded that with the increase of the oxidation degree, The emissivity of the rough pure aluminum surface in the direction of 0-70 DEG is gradually increased, and the emissivity of 70 DEG is almost unchanged. The surface temperature of the rough pure aluminum, the experimental results and the comparison of the measurement results of the thermocouple are proved by using the directional emissivity of the simulation. The method can be used for the radiation temperature measurement. And the emissivity of the Ti-6Al-4V alloy in the thermal oxidation process and the specific cause of the change of the emissivity in the oxidation process are studied. The results show that the spectral emissivity of the pre-oxidized Ti-6Al-4V alloy increases linearly with the temperature in the range of 823-973K; when the oxidation temperature is lower than 873 K, the emissivity increases with the oxidation time, and when the temperature is higher than 923 K, the emissivity changes with the time; The surface roughness is one of the factors that affect the change of the amplitude of the emissivity fluctuation curve. The interference between the oxide film and the substrate is the main cause of the change of the emissivity. When the Ti-6Al-4V alloy is thermally oxidized in the air, the surface oxide film follows the law of the parabola growth. And the oxidation rate will increase rapidly when the temperature is greater than 923 k.
【學(xué)位授予單位】：河南師范大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2017
【分類號】：O433.1
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