本文選題：毫米波/亞毫米波天線 + 工業(yè)攝影測量　； 參考：《微波學報》2017年S1期

【摘要】：天線反射面精度是天線系統(tǒng)主要的技術性能指標,一般要求表面精度是天線工作波長的1/16~1/32,而測量精度要達到表面精度的1/3~1/5。對于毫米波/亞毫米波天線,傳統(tǒng)測量方法如經(jīng)緯儀測量等存在很多缺點,本文提出一種新的測量技術,利用工業(yè)攝影測量技術對毫米波/亞毫米波天線形面進行測量,并進行了高精度天線形面測量實踐,結果滿足要求。
[Abstract]:Antenna reflector accuracy is the main technical performance index of antenna system. Generally, the surface accuracy is 1 / 16 / 32 of the antenna working wavelength, and the measurement accuracy should reach 1 / 3 / 1 / 5 of the surface precision. For millimeter-wave / sub-millimeter-wave antenna, traditional measurement methods such as theodolite measurement have many disadvantages. In this paper, a new measuring technique is proposed to measure the shape of millimeter-wave / sub-millimeter-wave antenna using industrial photogrammetry. The practice of high precision antenna profile measurement is carried out, and the results meet the requirements.
【作者單位】： 鄭州辰維科技股份有限公司;華北水利水電大學;
【分類號】：TN822
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本文編號：2075564