【摘要】：為了研究被測(cè)目標(biāo)在氧氣A帶的自發(fā)射光譜與透射率的關(guān)系,根據(jù)透射率的計(jì)算方法,提出了采用偏最小二乘回歸法對(duì)氧氣A帶的光譜進(jìn)行基線擬合,搭建了實(shí)驗(yàn)系統(tǒng),驗(yàn)證了該方法擬合基線的準(zhǔn)確度。首先,以黑體輻射理論為依據(jù),給出氧氣A帶平均透射率計(jì)算方法,以實(shí)際被測(cè)目標(biāo)光譜為研究對(duì)象,以帶外數(shù)據(jù)為依據(jù),利用偏最小二乘法擬合被測(cè)目標(biāo)在氧氣A帶的基線。為提高擬合精度,剔除了測(cè)量奇異點(diǎn),并利用基線擬合不確定度來(lái)評(píng)價(jià)偏最小二乘回歸法擬合基線的準(zhǔn)確度。為了驗(yàn)證該方法的準(zhǔn)確性,以鹵素?zé)魹楣庠?在0~130m范圍內(nèi),獲得不同距離處的光譜曲線,以及相同距離不同分辨率下的光譜曲線,將各種曲線分別進(jìn)行基線擬合,分析各自的標(biāo)準(zhǔn)偏差。結(jié)果表明,同一距離處不同分辨率下的平均標(biāo)準(zhǔn)偏差為0.23%,隨著分辨率的降低,基線擬合不確定度變小,信噪比增大;基線擬合不確定度還與測(cè)試設(shè)備的分辨率有關(guān),分辨率越高,帶外信息基線擬合不確定度越大,反之,帶外基線擬合不確定度越小。
[Abstract]:In order to study the relationship between the self-emission spectrum and transmittance of the target in the oxygen A band, according to the calculation method of transmittance, the partial least square regression method is proposed to fit the baseline of the oxygen A band spectrum, and an experimental system is set up. The accuracy of the method is verified. Firstly, based on the blackbody radiation theory, the calculation method of average transmittance of oxygen A band is given. Taking the actual measured target spectrum as the research object and the out-of-band data as the basis, the partial least square method is used to fit the baseline of the measured target in the oxygen A band. In order to improve the fitting accuracy, the singular points were eliminated, and the accuracy of partial least square regression was evaluated by using the uncertainty of baseline fitting. In order to verify the accuracy of the method, the spectral curves at different distances and the spectral curves at the same distance and different resolution were obtained in the range of 0 ~ 130 m using halogen lamp as the light source. Analyze their respective standard deviations. The results show that the average standard deviation at different resolution at the same distance is 0.23. With the decrease of resolution, the uncertainty of baseline fitting becomes smaller and SNR increases, and the uncertainty of baseline fitting is related to the resolution of test equipment. The higher the resolution, the greater the uncertainty of baseline fitting with out-of-band information, and the less the uncertainty of out-of-band baseline fitting.
【作者單位】： 中北大學(xué)山西省光電信息與儀器工程技術(shù)研究中心;中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所應(yīng)用光學(xué)國(guó)家重點(diǎn)實(shí)驗(yàn)室;
【基金】：國(guó)際科技合作項(xiàng)目(2013DFR10150) 國(guó)家自然科學(xué)基金儀器專項(xiàng)基金(61127015);國(guó)家自然科學(xué)基金青年科學(xué)基金項(xiàng)目(61505180)
【分類號(hào)】：O433

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