基于AFM膠體探針測(cè)量液固界面DLVO力及表面電勢(shì)
發(fā)布時(shí)間:2018-01-12 10:23
本文關(guān)鍵詞:基于AFM膠體探針測(cè)量液固界面DLVO力及表面電勢(shì) 出處:《實(shí)驗(yàn)流體力學(xué)》2017年04期 論文類型:期刊論文
更多相關(guān)文章: AFM 膠體探針 液固界面 DLVO力 表面電勢(shì)
【摘要】:表面電勢(shì)是微納流控芯片中流體流動(dòng)的重要參數(shù)。本文介紹了基于AFM膠體探針技術(shù)測(cè)量液固界面DLVO力并進(jìn)一步測(cè)量表面電勢(shì)及表面電荷密度的方法。本文改進(jìn)了膠體探針制作的技術(shù)手段,并提出用雙探針法測(cè)量膠體探針的彈性系數(shù)。在0.1~1mM濃度范圍內(nèi)的NaCl溶液中,測(cè)量了硅、二氧化硅和氮化硅液固界面雙電層內(nèi)的DLVO力及表面電勢(shì)。實(shí)驗(yàn)結(jié)果表明膠體探針技術(shù)可以很好地測(cè)量液固界面的DLVO力,尤其對(duì)靜電力指數(shù)變化段非常敏感。通過DLVO力曲線可以間接測(cè)量表面電勢(shì)、表面電荷密度等重要參數(shù),是微納流動(dòng)及界面屬性測(cè)量的有效手段。此外,在不同硅基材料表面的測(cè)量結(jié)果顯示了硅烷醇基密度對(duì)表面電勢(shì)起主導(dǎo)作用,可以通過選用不同硅烷醇基密度的材料來有效調(diào)控表面電勢(shì),從而在硅基材料制作的微流控芯片中調(diào)控電動(dòng)流動(dòng)的強(qiáng)弱。
[Abstract]:Surface potential is an important parameter of fluid flow in micronanofluidic chip. This paper introduces the method of measuring DLVO force at liquid-solid interface based on AFM colloid probe technology and further measuring surface potential and surface charge density. In this paper, the technique of making colloidal probe is improved. The elastic coefficient of colloidal probe was measured by double probe method. Silicon was measured in NaCl solution with 0.1 渭 m of concentration. The DLVO force and surface potential in the double electric layer of the liquid-solid interface between silicon dioxide and silicon nitride. The experimental results show that the colloidal probe technique can measure the DLVO force of the liquid-solid interface very well. DLVO force curve can indirectly measure surface potential, surface charge density and other important parameters, which is an effective means to measure micro-nano flow and interface properties. The measurement results on the surface of different silicon based materials show that the silane alcohol-based density plays a leading role in the surface potential, and the surface potential can be effectively controlled by selecting the materials with different silane alcohol-based densities. In order to control the strength of electric flow in the microfluidic chip made of silicon-based material.
【作者單位】: 大連理工大學(xué)機(jī)械工程學(xué)院;中國科學(xué)院力學(xué)研究所非線性力學(xué)國家重點(diǎn)實(shí)驗(yàn)室;
【基金】:自然科學(xué)基金項(xiàng)目(11202219) 遼寧省教育廳重點(diǎn)實(shí)驗(yàn)室基礎(chǔ)研究項(xiàng)目(LZ2014005)
【分類號(hào)】:O363.2
【正文快照】: 0引言水和氣體、固體間的界面問題無處不在,且在生活及大多數(shù)工業(yè)領(lǐng)域都十分重要[1]。近年來隨著流動(dòng)尺度的進(jìn)一步減小,納流控應(yīng)運(yùn)而生,在生物芯片技術(shù)、新能源領(lǐng)域及微納尺度化學(xué)分析等方面都有廣闊的應(yīng)用前景[2]。溶液中,固體表面會(huì)從溶液中選擇性地吸附離子或是固體表面的
【相似文獻(xiàn)】
相關(guān)期刊論文 前2條
1 朱定一;戴品強(qiáng);羅曉斌;張遠(yuǎn)超;;潤(rùn)濕性表征體系及液固界面張力計(jì)算的新方法(Ⅰ)[J];科學(xué)技術(shù)與工程;2007年13期
2 朱定一;張遠(yuǎn)超;戴品強(qiáng);羅曉斌;;潤(rùn)濕性表征體系及液固界面張力計(jì)算的新方法(Ⅱ)[J];科學(xué)技術(shù)與工程;2007年13期
,本文編號(hào):1413845
本文鏈接:http://sikaile.net/kejilunwen/lxlw/1413845.html
最近更新
教材專著