【摘要】：熱敏打印頭(Thermal Print Head簡稱TPH)為熱打印機(jī)關(guān)鍵部件,是采用焦耳熱效應(yīng)原理并通過相關(guān)邏輯部件進(jìn)行控制,實(shí)現(xiàn)信息打印的部件。由于熱敏打印頭屬于專用器件,精密且控制邏輯復(fù)雜,市場(chǎng)上沒有通用的測(cè)試裝置,也沒有成熟的解決方案,為滿足在線及成品檢測(cè)的要求,設(shè)計(jì)并開發(fā)熱敏打印頭綜合測(cè)試裝置顯得尤為重要。文中根據(jù)TPH的性能、參數(shù),進(jìn)行了測(cè)試需求的分析。測(cè)試需求主要包括兩個(gè)方面:一是熱敏打印頭的各個(gè)輸入、輸出端子的短路、斷路、漏電檢測(cè)以及電流電壓(IV)擬合特性測(cè)試;二是熱敏打印頭邏輯、時(shí)序功能及發(fā)熱體阻值的測(cè)試。本文首先通過對(duì)熱敏打印頭的特性,尤其是專用邏輯控制集成電路(IC)特性的研究,針對(duì)測(cè)試需求制定了有針對(duì)性的測(cè)試方案,特別是引入并集成了IV測(cè)試法以檢出IC隱含缺陷;選通至輸出的時(shí)序測(cè)量法以測(cè)試IC的應(yīng)答特性。其次采用專用的IV測(cè)試電路、獨(dú)有的IC功能測(cè)試電路及精確的恒流測(cè)阻電路,并配合高效的現(xiàn)場(chǎng)可編程門陣列(FPGA),簡單易用的ARM處理器,以及圖形化且穩(wěn)定的LabVIEW,實(shí)現(xiàn)了準(zhǔn)確的IV測(cè)試、穩(wěn)定的IC的性能測(cè)試、精確的阻值測(cè)試等產(chǎn)品集成測(cè)試功能。最后為驗(yàn)證系統(tǒng)的可靠性和可行性,對(duì)系統(tǒng)進(jìn)行了實(shí)驗(yàn)、測(cè)試,實(shí)驗(yàn)表明此裝置彌補(bǔ)了現(xiàn)有拼湊式的熱敏打印頭檢測(cè)裝置的功能單一、精度差、效率低、誤測(cè)率高的不足,提高了產(chǎn)品不良檢測(cè)能力。
[Abstract]:Thermal printer (Thermal Print Head (TPH) is a key part of thermal printer. It adopts the principle of Joule thermal effect and controls the related logic parts to realize information printing. Because thermosensitive printhead is a special device, precision and complex control logic, there is no universal testing device on the market and no mature solution. In order to meet the requirements of on-line and finished product detection, It is particularly important to design and develop a comprehensive test device for thermal print head. According to the performance and parameters of TPH, the test requirements are analyzed in this paper. The testing requirements mainly include two aspects: one is the input of the thermal printer, the short circuit of the output terminal, the broken circuit, the leakage detection and the current and voltage (IV) fitting characteristic test; The second is the test of thermal printer logic, timing function and heater resistance value. Firstly, through the study of the characteristics of the thermal printer, especially the (IC) characteristics of the ASIC, a specific test scheme is designed to meet the test requirements. In particular, the IV test method is introduced and integrated to detect the hidden defects of IC. The timing measurement method from strobe to output is used to test the response characteristics of IC. Secondly, the special IV test circuit, the unique IC function test circuit and the accurate constant current resistance measuring circuit are adopted, and the high efficiency field programmable gate array (FPGA), simple and easy to use ARM processor, as well as graphic and stable LabVIEW, are used. The product integration testing functions such as accurate IV test, stable IC performance test, accurate resistance test and so on are implemented. Finally, in order to verify the reliability and feasibility of the system, the system is tested and tested. The experiment shows that this device makes up for the shortcomings of the existing piecewise thermal printer detector, such as single function, poor precision, low efficiency and high rate of error measurement. Improved product inspection ability.
【學(xué)位授予單位】：哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2017
【分類號(hào)】：TP334.8

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