本文關(guān)鍵詞： 單粒子效應(yīng) 存儲(chǔ)器 虛擬儀器 LabVIEW FPGA　出處：《湖南大學(xué)》2012年碩士論文　論文類型：學(xué)位論文

【摘要】：存儲(chǔ)器作為一種重要的存儲(chǔ)介質(zhì),已經(jīng)被廣泛應(yīng)用到計(jì)算機(jī)、移動(dòng)電子設(shè)備、航空工業(yè)等領(lǐng)域�？臻g單粒子效應(yīng)對(duì)航天電子器件工作的穩(wěn)定可靠性有很大的影響,保證高可靠航天存儲(chǔ)器的功能穩(wěn)定與性能高效變的越來越重要。為驗(yàn)證航天級(jí)存儲(chǔ)器的功能及性能可靠性需要在地面模擬空間實(shí)驗(yàn)環(huán)境下進(jìn)行,因而設(shè)計(jì)開發(fā)出一種滿足在地面模擬空間實(shí)驗(yàn)環(huán)境下進(jìn)行測(cè)試的系統(tǒng)對(duì)驗(yàn)證高可靠性存儲(chǔ)器的設(shè)計(jì)應(yīng)用十分重要。 本文以在地面模擬空間實(shí)驗(yàn)環(huán)境下對(duì)存儲(chǔ)器測(cè)試為背景要求,分析介紹了存儲(chǔ)器的測(cè)試方法,提出了測(cè)試環(huán)境下的系統(tǒng)的設(shè)計(jì)方案,并做出了相應(yīng)的結(jié)構(gòu)設(shè)計(jì)實(shí)現(xiàn),完善了高可靠性存儲(chǔ)器測(cè)試系統(tǒng)。 本文所做的研究與設(shè)計(jì)工作包括：本文首先介紹了自動(dòng)測(cè)試系統(tǒng)的發(fā)展方向及虛擬儀器技術(shù)概念；然后對(duì)存儲(chǔ)器的故障模型及常用測(cè)試算法進(jìn)行分析介紹；其次結(jié)合地面模擬空間實(shí)驗(yàn)環(huán)境下的測(cè)試要求,對(duì)本系統(tǒng)的結(jié)構(gòu)設(shè)計(jì)及模塊規(guī)劃進(jìn)行了詳細(xì)的分析；接著重點(diǎn)介紹了基于本測(cè)試系統(tǒng)測(cè)試要求采用Verilog HDL語言完成實(shí)現(xiàn)的FPGA算法測(cè)試模塊；最后詳細(xì)分析了采用LabVIEW圖形化編程語言完成系統(tǒng)的控制界面設(shè)計(jì)的實(shí)現(xiàn)過程,并完善了整個(gè)系統(tǒng)的自動(dòng)化控制。 本文所設(shè)計(jì)的測(cè)試系統(tǒng)不僅通過了普通實(shí)驗(yàn)室驗(yàn)證而且通過地面模擬空間實(shí)驗(yàn)環(huán)境下的實(shí)測(cè)。對(duì)于本文所采用的集成電路測(cè)試技術(shù)與虛擬儀器技術(shù)相結(jié)合的的系統(tǒng)實(shí)現(xiàn)方法,提升了系統(tǒng)的可擴(kuò)展性及操作靈活性。
[Abstract]:As an important storage medium, memory has been widely used in computer, mobile electronic equipment, aviation industry and other fields. Single particle effect in space has a great impact on the stability and reliability of aerospace electronic devices. It is more and more important to ensure the functional stability and high efficiency change of high reliability space memory. In order to verify the function and reliability of spaceflight memory, it is necessary to do it in the ground simulated space experiment environment. Therefore, it is very important to design and develop a test system which can be used to test the high reliability memory in the ground simulation space experiment environment. In this paper, based on the background requirements of memory testing in the ground simulated space experiment environment, this paper analyzes and introduces the memory testing method, puts forward the design scheme of the system under the test environment, and makes the corresponding structure design and implementation. The high reliability memory test system is perfected. The research and design work of this paper includes: firstly, this paper introduces the development direction of automatic test system and the concept of virtual instrument, then analyzes the fault model of memory and common test algorithms. Secondly, the structure design and module planning of the system are analyzed in detail according to the test requirements under the ground simulation space experimental environment. Then it introduces the test module of FPGA algorithm based on the test requirement of Verilog HDL, and finally analyzes the realization process of the control interface design of the system with LabVIEW graphical programming language in detail. And perfect the automation control of the whole system. The test system designed in this paper has not only been verified by the general laboratory but also measured in the ground simulated space experimental environment. The system implementation method of the integrated circuit test technology and virtual instrument technology used in this paper is discussed. The expansibility and operation flexibility of the system are improved.
【學(xué)位授予單位】：湖南大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2012
【分類號(hào)】：TP333;TP274

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