【摘要】：通過(guò)電導(dǎo)率測(cè)量、金相觀察、掃描電鏡分析(SEM)和X線衍射分析(XRD),研究Si和Cu對(duì)Al-Si系合金晶格常數(shù)和電性能的影響規(guī)律。研究結(jié)果表明:隨著Si和Cu質(zhì)量分?jǐn)?shù)的增大,Al基體晶格畸變程度增大,Al-Si合金電導(dǎo)率下降;Cu對(duì)Al-Si合金電導(dǎo)率的影響比Si對(duì)合金電導(dǎo)率的影響顯著;經(jīng)過(guò)450℃×5 h+250℃×2 h熱處理工藝,Al基體晶格畸變程度明顯降低,Al-Si合金電導(dǎo)率明顯提高,增幅最高可達(dá)32.36%;Si和Cu對(duì)Al-Si合金電導(dǎo)率的影響機(jī)制不同,Si質(zhì)量分?jǐn)?shù)的變化對(duì)Al基體晶格畸變程度影響較小,Si對(duì)Al-Si合金電導(dǎo)率的影響可依據(jù)復(fù)合材料電阻率計(jì)算公式推導(dǎo),而Cu的影響可根據(jù)Al晶格常數(shù)偏離量來(lái)推導(dǎo)。
[Abstract]:The effects of Si and Cu on the lattice constants and electrical properties of Al-Si alloys were studied by means of conductivity measurement, metallographic observation, scanning electron microscopy (SEM) and X-ray diffraction (XRD),) analysis. The results show that with the increase of mass fraction of Si and Cu, the lattice distortion degree of Al matrix increases and the conductivity of Al-Si alloy decreases. The effect of Cu on the conductivity of Al-Si alloy is more significant than that of Si on the conductivity of Al-Si alloy. After 450 鈩，

本文編號(hào)：2254736