翻邊壓電晶片激勵(lì)Lamb波聲場研究
發(fā)布時(shí)間:2018-09-13 13:21
【摘要】:壓電晶片廣泛應(yīng)用于超聲波檢測領(lǐng)域,是激勵(lì)和接收超聲波的最主要器件之一。本文用實(shí)驗(yàn)、有限元壓電模擬和半解析數(shù)值模擬方法,研究翻邊壓電晶片在板中激勵(lì)Lamb波聲場。三種方法得到的Lamb波信號吻合性好,僅A0模式由于頻散有少量差異。同時(shí)分析了翻邊電極面積對聲場分布以及聲場能量的影響。翻邊電極造成了Lamb波聲場不對稱,減少了聲場的能量,同時(shí)降低了壓電晶片的電容、機(jī)電耦合系數(shù)和品質(zhì)因子等參數(shù)。
[Abstract]:Piezoelectric wafer is widely used in ultrasonic detection field, and it is one of the most important devices to excite and receive ultrasonic wave. In this paper, the acoustic field of Lamb wave excited by a flanged piezoelectric wafer in a plate is studied by means of experiments, finite element piezoelectric simulation and semi-analytical numerical simulation. The Lamb signals obtained by the three methods are in good agreement with each other, but only the A0 mode has a little difference due to dispersion. At the same time, the influence of flanging electrode area on sound field distribution and sound field energy is analyzed. The flanging electrode causes the asymmetry of Lamb wave sound field, reduces the energy of sound field, and reduces the parameters such as capacitance, electromechanical coupling coefficient and quality factor of piezoelectric wafer.
【作者單位】: 江蘇科技大學(xué)數(shù)理學(xué)院;
【分類號】:TG115.285
本文編號:2241295
[Abstract]:Piezoelectric wafer is widely used in ultrasonic detection field, and it is one of the most important devices to excite and receive ultrasonic wave. In this paper, the acoustic field of Lamb wave excited by a flanged piezoelectric wafer in a plate is studied by means of experiments, finite element piezoelectric simulation and semi-analytical numerical simulation. The Lamb signals obtained by the three methods are in good agreement with each other, but only the A0 mode has a little difference due to dispersion. At the same time, the influence of flanging electrode area on sound field distribution and sound field energy is analyzed. The flanging electrode causes the asymmetry of Lamb wave sound field, reduces the energy of sound field, and reduces the parameters such as capacitance, electromechanical coupling coefficient and quality factor of piezoelectric wafer.
【作者單位】: 江蘇科技大學(xué)數(shù)理學(xué)院;
【分類號】:TG115.285
【相似文獻(xiàn)】
相關(guān)期刊論文 前2條
1 袁魁;沈希忠;;基于幾種超聲壓電晶片陣列的金屬板缺陷成像[J];無損檢測;2013年03期
2 ;[J];;年期
相關(guān)會議論文 前1條
1 唐會彥;王麗坤;秦雷;;柱狀壓電晶片堆的有限元分析[A];2010’全國半導(dǎo)體器件技術(shù)研討會論文集[C];2010年
相關(guān)碩士學(xué)位論文 前1條
1 梁建波;基于微小閥圓形壓電晶片驅(qū)動(dòng)器的作用機(jī)理與試驗(yàn)研究[D];吉林大學(xué);2011年
,本文編號:2241295
本文鏈接:http://sikaile.net/kejilunwen/jinshugongy/2241295.html
最近更新
教材專著