基于驅(qū)動(dòng)時(shí)序的CCD曝光時(shí)間控制技術(shù)研究
[Abstract]:In recent years, with the development of imaging spectral remote sensing technology, spectral imaging technology plays a more and more important role. The development of spectral remote sensing technology depends on the progress of various technologies. CCD (charge coupled device) because of its high sensitivity, Many advantages, such as low noise and large dynamic range, have become the core devices in the field of spectral imaging. Four factors affecting the brightness of the image, such as aperture size, intensity of incident light, exposure time and signal gain, are the best choice. However, for the frame transfer CCD imaging device without the electronic shutter function, when the frame frequency is determined, the exposure time can not be controlled is the technical bottleneck of using this kind of CCD detector at present. For the CCD detector without electron shutter, two kinds of exposure time control methods are proposed in this paper: level setting method and charge releasing method. The level setting method is implemented by setting all the signals in the photosensitive zone to the same zero level for a period of time. Charge release method can effectively control the exposure time by increasing the state of charge release and rapidly discharging the charge from the extra time period within a frame. Two exposure time control methods are implemented based on two different CCD detectors, TH7888A and CCD**, respectively. Firstly, the realization of two exposure time control methods is introduced, including CCD hardware driver circuit and driver timing logic design. In terms of hardware, a reasonable schematic design scheme is given. In the aspect of timing logic design, all kinds of driving timing signals of CCD are realized by VHDL language, and the simulation results are given. Secondly, under the condition of laboratory, by building a concrete test platform and based on the method proposed in this paper, the test waveform and image are collected under different exposure time, and the further analysis of the test results is made. The feasibility and correctness of the proposed method are verified.
【學(xué)位授予單位】:中國(guó)科學(xué)院研究生院(西安光學(xué)精密機(jī)械研究所)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2015
【分類(lèi)號(hào)】:TN386.5
【相似文獻(xiàn)】
相關(guān)期刊論文 前10條
1 張宇寧;徐益勤;雷威;李曉華;張曉兵;;場(chǎng)致發(fā)射顯示驅(qū)動(dòng)時(shí)序優(yōu)化設(shè)計(jì)[J];東南大學(xué)學(xué)報(bào)(自然科學(xué)版);2008年02期
2 張林;胡學(xué)友;李秀娟;徐曉為;;基于CPLD的線陣CCD驅(qū)動(dòng)時(shí)序發(fā)生器的設(shè)計(jì)[J];電測(cè)與儀表;2006年08期
3 王軍波,孫振國(guó),陳強(qiáng),趙江濱;高速CCD攝像機(jī)驅(qū)動(dòng)時(shí)序發(fā)生器的設(shè)計(jì)及基于CPLD技術(shù)的實(shí)現(xiàn)[J];光學(xué)技術(shù);2002年02期
4 張道勇 ,徐杜 ,蔣永平 ,林梓榮;基于FPGA的線陣CCD驅(qū)動(dòng)時(shí)序發(fā)生器設(shè)計(jì)[J];微型機(jī)與應(yīng)用;2004年11期
5 付天舒;趙春暉;;基于Verilog的線陣CCD驅(qū)動(dòng)時(shí)序設(shè)計(jì)[J];光學(xué)技術(shù);2010年05期
6 李晶;袁峰;丁振良;;外姿態(tài)測(cè)量系統(tǒng)中CCD驅(qū)動(dòng)時(shí)序的設(shè)計(jì)及實(shí)現(xiàn)[J];自動(dòng)化儀表;2013年01期
7 周建勇;陳紅兵;袁世順;張婷婷;熊露;;一種CCD驅(qū)動(dòng)時(shí)序參量化設(shè)計(jì)方法[J];半導(dǎo)體光電;2013年06期
8 武琪敬;李自田;胡炳梁;皮海峰;;基于FPGA的CCD驅(qū)動(dòng)設(shè)計(jì)[J];現(xiàn)代電子技術(shù);2010年12期
9 湯勇明,吳忠,鄭姚生,王保平,童林夙;驅(qū)動(dòng)時(shí)序設(shè)計(jì)中影響SMPDP顯示亮度的相關(guān)因素研究[J];電子器件;2004年04期
10 苑穎,常丹華,張寶榮;基于CPLD技術(shù)的彩色線陣CCD的驅(qū)動(dòng)時(shí)序設(shè)計(jì)[J];傳感技術(shù)學(xué)報(bào);2005年03期
相關(guān)會(huì)議論文 前2條
1 曹昕燕;;基于CPLD的CMOS APS驅(qū)動(dòng)時(shí)序的設(shè)計(jì)[A];第十屆全國(guó)敏感元件與傳感器學(xué)術(shù)會(huì)議論文集[C];2007年
2 羅榕思;郭太良;林志賢;葉蕓;張永愛(ài);林金堂;;新型FGD器件驅(qū)動(dòng)時(shí)序的研究[A];中國(guó)電子學(xué)會(huì)真空電子學(xué)分會(huì)第十九屆學(xué)術(shù)年會(huì)論文集(下冊(cè))[C];2013年
相關(guān)碩士學(xué)位論文 前1條
1 劉慧;基于驅(qū)動(dòng)時(shí)序的CCD曝光時(shí)間控制技術(shù)研究[D];中國(guó)科學(xué)院研究生院(西安光學(xué)精密機(jī)械研究所);2015年
,本文編號(hào):2201788
本文鏈接:http://sikaile.net/kejilunwen/dianzigongchenglunwen/2201788.html