本文選題：復(fù)介電常數(shù) + 帶狀線諧振器　； 參考：《電子科技大學(xué)》2015年碩士論文

【摘要】：高頻PCB基板在微波電路與天線設(shè)計領(lǐng)域使用極其廣泛,目前,我國低損耗高頻微波PCB基板市場基本被羅杰斯,雅龍等國外公司壟斷,為了打破這一現(xiàn)狀,國內(nèi)一些機構(gòu)正在研究制造國產(chǎn)低損耗高頻PCB基板。衡量高頻PCB基板性能的一個重要指標(biāo)是其在變溫情況下復(fù)介電常數(shù)的溫度系數(shù),即隨溫度的變化。本文的主要工作即是基于帶狀線諧振器法為衡量低損耗高頻PCB基板性能提供一套變溫復(fù)介電常數(shù)測試系統(tǒng)。本文首先闡明了帶狀線諧振器法的基本理論,并在HFSS軟件中驗證了影響低損耗材料帶狀線諧振器品質(zhì)因數(shù)的一個關(guān)鍵參數(shù):金屬表面電阻,以及一些其他參數(shù),包括空氣耦合間隙,金屬表面粗糙度,探針尺寸,封閉腔體雜模等對諧振器頻率響應(yīng)的影響�；谝陨侠碚撆c仿真分析,針對低損耗高頻PCB基板的介質(zhì)損耗測試問題,提出了利用平行板介質(zhì)諧振器法對帶狀線諧振器金屬材料進(jìn)行變溫條件下的微波表面電阻測試,并基于變溫測試數(shù)據(jù)對測得的復(fù)介電常數(shù)重新修正的新方案。然后,采用低溫冷卻液循環(huán)制冷與電加熱方式分別組建了變溫條件下的微波復(fù)介電常數(shù)與金屬微波表面電阻測試系統(tǒng),對包括Rogers 6006,聚四氟乙烯等低損耗高頻PCB基板進(jìn)行了變溫條件(-50℃-120℃),寬帶范圍(1-18GHz)內(nèi)的復(fù)介電常數(shù)測試,通過修正金屬材料的表面電阻,對變溫條件下的介質(zhì)損耗數(shù)據(jù)進(jìn)行了誤差修正,最終測試結(jié)果與羅杰斯公司提供的參考數(shù)據(jù)比對呈現(xiàn)了較好的一致性。
[Abstract]:High frequency PCB substrate is widely used in the field of microwave circuit and antenna design. At present, the market of low loss high frequency microwave PCB substrate is monopolized by Rogers, Yalong and other foreign companies. Some domestic institutions are studying and manufacturing domestic low-loss high-frequency PCB substrates. An important index to evaluate the performance of high frequency PCB substrate is the temperature coefficient of the complex dielectric constant, that is, the change of the complex permittivity with temperature. The main work of this paper is to provide a variable temperature complex dielectric constant measuring system for low loss high frequency PCB substrate based on the strip line resonator method. In this paper, the basic theory of the strip line resonator method is first expounded, and a key parameter affecting the quality factor of the strip line resonator with low loss material is verified in HFSS software: metal surface resistance, and some other parameters. The effects of air coupling gap, metal surface roughness, probe size and impurity modes on the frequency response of the resonator are discussed. Based on the above theory and simulation analysis, aiming at the problem of dielectric loss measurement of low loss high frequency PCB substrate, a method of parallel plate dielectric resonator is proposed to measure microwave surface resistance of strip wire resonator metal material at variable temperature. Based on the measured data, the complex dielectric constant is revised. Then, the microwave complex dielectric constant and the metal microwave surface resistance measurement system under the condition of variable temperature were constructed by using the low temperature coolant cycle refrigeration and electric heating method, respectively. The complex permittivity of low loss high frequency PCB substrates, including Rogers 6006 and PTFE, was measured in the range of 1 ~ 18 GHz under varying temperature conditions (-50 鈩，

本文編號：1913081