發(fā)布時(shí)間：2018-05-07 05:07

  本文選題：邊界掃描 + Wiener級(jí)數(shù)　； 參考：《哈爾濱理工大學(xué)》2015年碩士論文

【摘要】：模擬電路故障診斷在電路測(cè)試領(lǐng)域占據(jù)著重要地位，一直以來都是研究人員關(guān)注的對(duì)象。隨著科技的發(fā)展，電路板已經(jīng)進(jìn)入大型化與高度集成化的時(shí)代，電路可及節(jié)點(diǎn)少使得電路故障診斷變得越來越困難，能否高效準(zhǔn)確的解決可及節(jié)點(diǎn)少的問題、獲得大型集成模擬電路的故障信息顯得尤為重要。本文針對(duì)這一問題提出了基于邊界掃描的模擬電路故障診斷方法，用“虛擬探針”代替?zhèn)鹘y(tǒng)的物理探針，大大提高了電路的可測(cè)試性，利用Wiener級(jí)數(shù)描述非線性模擬電路，并通過訓(xùn)練神經(jīng)網(wǎng)絡(luò)實(shí)現(xiàn)電路狀態(tài)的在線識(shí)別，完成電路故障診斷。 本文分析了邊界掃描技術(shù)中混合信號(hào)測(cè)試的IEEE1149.4標(biāo)準(zhǔn)，介紹了在模擬電路診斷中邊界掃描所使用的指令。在此基礎(chǔ)上，為了將邊界掃描更好的應(yīng)用于模擬電路，提出了三種基于邊界掃描IEEE1149.4標(biāo)準(zhǔn)的電路可測(cè)性設(shè)計(jì)方法，，為利用邊界掃描進(jìn)行各種模擬電路的故障診斷奠定了基礎(chǔ)。 針對(duì)模擬電路的非線性問題，用Wiener泛函級(jí)數(shù)描述模擬電路并研究了Wiener核的獲取方法。用MATLAB編程提取了基于邊界掃描的電路各狀態(tài)Wiener核，又將前三階Wiener核及相應(yīng)狀態(tài)的編碼作為訓(xùn)練樣本訓(xùn)練神經(jīng)網(wǎng)絡(luò)，通過訓(xùn)練好的神經(jīng)網(wǎng)絡(luò)在線識(shí)別出電路狀態(tài)，達(dá)到智能故障診斷的目的。 在進(jìn)行理論研究和仿真的同時(shí)，本文設(shè)計(jì)了基于ATmega128單片機(jī)的故障診斷系統(tǒng)，其中硬件包括JTAG控制器、信號(hào)發(fā)生模塊、數(shù)據(jù)采樣模塊、數(shù)據(jù)存儲(chǔ)模塊等。軟件設(shè)計(jì)包括故障診斷系統(tǒng)、上位機(jī)軟件、神經(jīng)網(wǎng)絡(luò)庫的生成�？蓪�(shí)現(xiàn)獲取Wiener核、提取核特征以及訓(xùn)練學(xué)習(xí)神經(jīng)網(wǎng)絡(luò)等功能。最后以包含了具有邊界掃描特性的STA400芯片在內(nèi)的實(shí)際電路為例，對(duì)電路的各故障狀態(tài)進(jìn)行診斷，在上位機(jī)界面顯示故障類型和故障元件編號(hào)，實(shí)驗(yàn)結(jié)果驗(yàn)證了基于邊界掃描與Wiener核的電路故障診斷方法的可行性。
[Abstract]:Analog circuit fault diagnosis plays an important role in the field of circuit testing. With the development of science and technology, the circuit board has entered the era of large-scale and highly integrated. The lack of accessible nodes makes the circuit fault diagnosis more and more difficult, and can solve the problem of less nodes efficiently and accurately. It is very important to obtain fault information of large integrated analog circuits. In this paper, a fault diagnosis method for analog circuits based on boundary scan is proposed. The "virtual probe" is used to replace the traditional physical probe, which greatly improves the testability of the circuit. The nonlinear analog circuit is described by Wiener series. The on-line recognition of circuit state is realized by training neural network, and circuit fault diagnosis is completed. In this paper, the IEEE1149.4 standard of mixed signal testing in boundary scan technology is analyzed, and the instructions used in boundary scan in analog circuit diagnosis are introduced. On this basis, in order to better apply boundary scan to analog circuits, three circuit testability design methods based on boundary scan IEEE1149.4 standard are proposed, which lays a foundation for fault diagnosis of various analog circuits using boundary scanning. In order to solve the nonlinear problem of analog circuits, the Wiener functional series is used to describe the analog circuits and the method of obtaining Wiener cores is studied. The Wiener kernel of each state of the circuit based on boundary scan is extracted by MATLAB programming, and the coding of the first three Wiener cores and corresponding states is used as the training sample to train the neural network, and the circuit state is recognized online by the trained neural network. To achieve the purpose of intelligent fault diagnosis. At the same time of theoretical research and simulation, a fault diagnosis system based on ATmega128 microcontroller is designed. The hardware includes JTAG controller, signal generation module, data sampling module, data storage module and so on. Software design includes fault diagnosis system, upper computer software, neural network library generation. It can obtain Wiener kernel, extract kernel feature and train learning neural network. Finally, taking the actual circuit including the STA400 chip with the characteristic of boundary scan as an example, each fault state of the circuit is diagnosed, and the fault type and fault component number are displayed in the upper computer interface. The experimental results verify the feasibility of the circuit fault diagnosis method based on boundary scan and Wiener core.
【學(xué)位授予單位】：哈爾濱理工大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類號(hào)】：TN710

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