本文選題：虛擬儀器 + 微波測量��； 參考：《國防科學技術大學》2015年碩士論文

【摘要】：微波測量技術是電磁場與微波技術領域的一個重要組成部分,無論在軍用領域還是民用領域都有著極為廣泛的應用。傳統(tǒng)意義上的微波測量主要指的是信號特性參數(shù)測量以及網(wǎng)絡特性參數(shù)測量,但隨著時代的發(fā)展與技術的進步,傳統(tǒng)測量方法已不能滿足實際需求。計算機技術與控制理論的高速發(fā)展則為這一問題的解決提供了一個良好的契機,將微波測量與自動測量系統(tǒng)相結合已成為微波測量領域的一個發(fā)展方向。而虛擬儀器技術的出現(xiàn)更是推動了這一方向的發(fā)展。本文以虛擬儀器技術為基礎,深入研究了與其相關的各種開發(fā)技術,并且根據(jù)實際需求搭建了一個綜合測試平臺。其中包括總線選取、儀器程控、硬件配置等多個技術要點。平臺設計的重點是通用性,即在同一個測試平臺上完成多個測試項目,這樣不僅可以增加儀器的利用率,還可以降低總體的測試成本。此外還考慮了測試智能化的問題,即在軟件開發(fā)過程中做一些有針對性的設計,簡化測試流程,降低使用難度。在總體測試平臺的基礎上,文章主要設計了三個測試分系統(tǒng)。分別為“軍用設備電磁發(fā)射自動測量系統(tǒng)”、“雙頻自動測量系統(tǒng)”以及“緊縮場天線方向圖自動測量系統(tǒng)”,其主要內容概述如下。“軍用設備電磁發(fā)射自動測量系統(tǒng)”主要指的是暗室環(huán)境下電磁兼容測量中的電磁發(fā)射測試項,其依據(jù)標準是GJB151B。解決的問題主要包括硬件調配與測控軟件開發(fā),并增加了智能化設置,降低了操作難度�！半p頻自動測量系統(tǒng)”解決了接收機以及相關射頻器件非線性特性的測量問題。主要包括硬件平臺的配置、測試流程設計以及測控軟件開發(fā)三個方面的內容�！熬o縮場天線方向圖自動測量系統(tǒng)”解決了天線方向圖的測量問題,此外還有增益、半功率波束寬度等參數(shù)的測量分析。完成的工作主要是軟件開發(fā),包括轉臺控制模塊設計,矢網(wǎng)控制模塊設計以及測量流程的實現(xiàn)。技術上解決了串口通信以及PLC控制問題,能夠比較好地完成測量任務。
[Abstract]:Microwave measurement is an important part of electromagnetic field and microwave technology. It is widely used in both military and civil fields. The traditional microwave measurement mainly refers to the signal characteristic parameter measurement and the network characteristic parameter measurement, but with the development of the times and the progress of the technology, the traditional measurement method can not meet the actual demand. The rapid development of computer technology and control theory provides a good opportunity to solve this problem. The combination of microwave measurement and automatic measurement system has become a developing direction in the field of microwave measurement. The emergence of virtual instrument technology has promoted the development of this direction. Based on the virtual instrument technology, this paper deeply studies various development technologies related to virtual instrument, and builds a comprehensive test platform according to the actual demand. Including bus selection, instrument programming, hardware configuration and other technical points. The emphasis of platform design is generality, that is, many test items are completed on the same test platform, which can not only increase the utilization rate of the instrument, but also reduce the overall test cost. In addition, the problem of intelligent testing is considered, that is, to do some targeted design in the process of software development, to simplify the testing process, and to reduce the difficulty of use. On the basis of the overall test platform, three test subsystems are designed in this paper. The main contents are summarized as follows: "automatic measurement system for electromagnetic emission of military equipment", "automatic measurement system for dual frequency" and "automatic measurement system for antenna pattern of compact field". The "automatic measurement system for electromagnetic emission of military equipment" mainly refers to the electromagnetic emission test item in electromagnetic compatibility measurement in dark room environment, which is based on the standard GJB151B. The main problems solved include hardware deployment and development of measurement and control software, and the intelligent setting is added to reduce the difficulty of operation. The dual frequency automatic measurement system solves the problem of measuring the nonlinear characteristics of receiver and related RF devices. It mainly includes the configuration of hardware platform, the design of test flow and the development of measurement and control software. The "Auto-measurement system of Antenna pattern of Compact Field" solves the problem of antenna pattern measurement, in addition to the measurement and analysis of gain, half-power beamwidth and other parameters. The main work is software development, including turntable control module design, vector control module design and the realization of measurement flow. The problem of serial communication and PLC control is solved technically, and the measurement task can be completed well.
【學位授予單位】：國防科學技術大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN015;O441

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本文編號：1845422