發(fā)布時間：2018-02-02 11:53

  本文關(guān)鍵詞： 像管 場致發(fā)射 表面狀態(tài) 耐壓性能　出處：《真空科學(xué)與技術(shù)學(xué)報》2017年06期 　論文類型：期刊論文

【摘要】：像增強器(簡稱像管)的耐壓性能是影響其增益,背景噪聲和分辨力的一個重要因素。引起像管電擊穿的原因很多,其中,電極的表面形態(tài)在其擊穿的起始階段發(fā)揮著重要的作用。本文針對像管特有的高場強微間隙電場結(jié)構(gòu),通過對不同電極進(jìn)行耐壓測試實驗,研究其對像管耐壓性能的影響。運用表面形貌測試儀對電極表面進(jìn)行3D形貌測試,結(jié)果表明電極表面微凸起形狀和尺寸的不同對像管耐壓性能的影響差異顯著,提高材料表面光潔度對于提高像管耐壓性能有著重要的促進(jìn)作用,最終為突破高場強微間隙像管工藝制作技術(shù)提供理論依據(jù)。
[Abstract]:The voltage performance of image intensifier is an important factor affecting its gain, background noise and resolution. There are many reasons for the breakdown of image tube. The surface morphology of the electrode plays an important role in the initial stage of breakdown. In this paper, the characteristics of the high field microgap electric field structure of the image tube are tested by the voltage test of different electrodes. The effect on the voltage resistance of the image tube was studied. The 3D morphology of the electrode surface was measured by using the surface topography tester. The results show that the different shape and size of the electrode surface have a significant effect on the voltage resistance of the image tube. Improving the surface finish of the material plays an important role in improving the voltage resistance of the image tube. Finally, it provides a theoretical basis for breaking through the fabrication technology of high field microgap image tube.
【作者單位】： 微光夜視技術(shù)重點實驗室;北方夜視科技集團(tuán)有限公司;
【基金】：微光夜視技術(shù)重點實驗室項目(GY201627)
【分類號】：TN144
【正文快照】： 真空中距離較短的電極之間,加以高電壓,常會出現(xiàn)微弱的極間電流,隨著極間電壓的不斷增大直至某一定值時,極間電流急劇增大,并伴隨有輕微的火花放電現(xiàn)象,即發(fā)生了真空擊穿。擊穿時,極間絕緣性能全部被破壞,極間電流可逾數(shù)千安[1]。軍用微光夜視儀的核心器件—微光像增強器(簡稱

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相關(guān)期刊論文 前1條

1 蔡蘭勤，，李智良;可控硅的耐壓性能不容忽視[J];工業(yè)計量;1998年02期

本文編號：1484443