【摘要】：臨界電流密度(Jc)是超導(dǎo)薄膜、塊材、帶材等材料的基本性能參數(shù),決定了超導(dǎo)器件及設(shè)備的性能和穩(wěn)定性,簡(jiǎn)易、準(zhǔn)確的無損Jc測(cè)量方法對(duì)超導(dǎo)材料特性研究及超導(dǎo)器件的性能保障具有重要意義。本文介紹一種基于三次諧波測(cè)量的高溫超導(dǎo)薄膜局部臨界電流密度測(cè)量方法和測(cè)量裝置。研究顯示,在一定幅值的初級(jí)線圈交流磁場(chǎng)激勵(lì)下,Ⅱ型超導(dǎo)體會(huì)產(chǎn)生非線性響應(yīng),通過分析次級(jí)線圈中三次諧波分量的幅值變化,可以推算超導(dǎo)體的局部臨界電流密度。我們搭建了一套基于此原理、適用于液氮條件的測(cè)量裝置。通過對(duì)比實(shí)驗(yàn),對(duì)測(cè)量的準(zhǔn)確性進(jìn)行了驗(yàn)證,尤其針對(duì)微弱的微納伏量級(jí)被測(cè)信號(hào),采取了必要的噪聲抑制措施,并通過對(duì)測(cè)量數(shù)據(jù)的校正,提高了測(cè)量的準(zhǔn)確度。實(shí)驗(yàn)研究顯示,基于三次諧波測(cè)量的方法對(duì)于超導(dǎo)薄膜的臨界電流密度的測(cè)量準(zhǔn)確度較高,進(jìn)行誤差修正后,測(cè)量裝置的誤差小于10%。超導(dǎo)薄膜感應(yīng)法測(cè)量裝置的搭建十分方便,而且應(yīng)用靈活,對(duì)于大面積超導(dǎo)薄膜的臨界電流密度分布測(cè)量具有十分顯著的優(yōu)勢(shì)。
[Abstract]:Critical current density (Jc) is the basic performance parameter of superconducting film, bulk and strip, which determines the performance and stability of superconducting devices and devices. Accurate nondestructive Jc measurement method is of great significance to the study of superconducting material characteristics and the performance guarantee of superconducting devices. This paper introduces a local critical current density measurement method and a measuring device for HTS thin films based on the third harmonic measurement. The results show that the type 鈪，

本文編號(hào)：2253358