發(fā)布時(shí)間：2018-10-10 06:56

【摘要】：X射線條紋相機(jī)作為一種高時(shí)空分辨率的診斷設(shè)備被廣泛應(yīng)用于超快診斷領(lǐng)域。在激光聚變實(shí)驗(yàn)中,X射線攜帶有其中許多物理過程的重要信息;并且激光聚變實(shí)驗(yàn)時(shí)間尺度小(納秒量級(jí))、空間尺度小(百微米量級(jí))。因此利用X射線條紋相機(jī)對(duì)X射線進(jìn)行診斷顯得尤為重要。隨著實(shí)驗(yàn)的深入,需要更高性能的診斷設(shè)備來(lái)更加細(xì)致的分析激光聚變復(fù)雜的物理過程。掃描電路通過使電子束在垂直方向上隨時(shí)間線性偏轉(zhuǎn),從而使條紋相機(jī)獲得了將時(shí)間信息轉(zhuǎn)換為空間信息存儲(chǔ)的能力。提升掃描電壓的斜率能夠提高掃描速度,從而提高條紋相機(jī)的時(shí)間分辨率。此外,分析掃描電路的工作原理有助于條紋相機(jī)的適應(yīng)性調(diào)整;分析掃描脈沖波形質(zhì)量對(duì)測(cè)量結(jié)果的影響有利于誤差分析。為了提升現(xiàn)有掃描電路性能,本文設(shè)計(jì)并制作了一個(gè)基于雪崩三極管的高速掃描電路,主要工作內(nèi)容如下:1.分析了影響條紋相機(jī)時(shí)間分辨率的因素,指出提升掃描速度是最可能的提高時(shí)間分辨率的途徑,而提升掃描速度依賴于提升掃描電壓的斜率。2.建立了RLC等效電路,分析各個(gè)設(shè)計(jì)參數(shù)與掃描電壓波形的關(guān)系。3.建立一維模型來(lái)描述雪崩三極管中因雪崩倍增效應(yīng)而急速增長(zhǎng)的電流引發(fā)二次擊穿導(dǎo)通的過程。4.選取雪崩三極管ZetexFMMT417作為核心器件,設(shè)計(jì)制作了掃描電路,面積僅為現(xiàn)有掃描電路的一半。5.搭建測(cè)試平臺(tái)。首先是利用示波器對(duì)制作的掃描電路的輸出幅值、邊沿、觸發(fā)閾值、延遲進(jìn)行測(cè)試,與現(xiàn)有掃描電路3 ns檔比較,有兩點(diǎn)明顯改進(jìn):延遲降低了12 ns;降低了欠沖(或者過沖)的影響,消除了“回掃”問題。然后搭載條紋相機(jī)對(duì)掃描速度和掃描非線性進(jìn)行了測(cè)試,取得了優(yōu)秀的結(jié)果:掃描非線性為1.95%,掃描速度為61.4 ps/mm。
[Abstract]:X-ray stripe camera is widely used in the field of ultra-fast diagnosis as a high spatial-temporal resolution diagnostic equipment. In the laser fusion experiment, the X-ray carries many important information about the physical process, and the time scale of laser fusion experiment is small (nanosecond order) and the space scale is small (100 micron order of magnitude). So it is very important to use X-ray stripe camera to diagnose X-ray. With the development of the experiment, higher performance diagnostic equipment is needed to analyze the complicated physical process of laser fusion in more detail. The scanning circuit enables the stripe camera to gain the ability to convert time information into spatial information by making the electron beam deflection linearly with time in the vertical direction. Increasing the slope of the scan voltage can improve the scanning speed and improve the temporal resolution of the stripe camera. In addition, analyzing the working principle of the scanning circuit is helpful to the adaptive adjustment of the stripe camera, and the analysis of the effect of the quality of the scanning pulse waveform on the measurement results is beneficial to the error analysis. In order to improve the performance of the existing scanning circuit, a high-speed scanning circuit based on avalanche transistor is designed and fabricated in this paper. The main work is as follows: 1. The factors affecting the temporal resolution of the stripe camera are analyzed, and it is pointed out that raising the scanning speed is the most likely way to improve the temporal resolution, and the lifting speed depends on the slope of the rising scan voltage. The RLC equivalent circuit is established, and the relationship between each design parameter and the scan voltage waveform is analyzed. A one-dimensional model is established to describe the process of secondary breakdown induced by a rapidly increasing current in avalanche Triode due to avalanche multiplication effect. The ZetexFMMT417 of avalanche transistor is selected as the core device, and the scanning circuit is designed and fabricated. The area is only half of that of the existing scanning circuit. Build the test platform. First of all, the output amplitude, edge, trigger threshold and delay of the scan circuit are tested by oscilloscope, and compared with the existing scan circuit 3 ns file. There are two significant improvements: the delay reduces 12 ns; to reduce the undershoot (or overshoot) effect, eliminating the "backsweep" problem. Then the scanning speed and the scanning nonlinearity were tested with the stripe camera, and the excellent results were obtained: the scanning nonlinearity was 1.95 and the scanning speed was 61.4 ps/mm..
【學(xué)位授予單位】：電子科技大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2014
【分類號(hào)】：TB852

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