本文選題：白光LED陣列　切入點(diǎn)：結(jié)溫　出處：《中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所》2017年博士論文

【摘要】：LED照明產(chǎn)品因其綠色、節(jié)能、壽命長(zhǎng)等優(yōu)勢(shì)正逐步取代傳統(tǒng)照明產(chǎn)品。雖然人們對(duì)其節(jié)能、環(huán)保等優(yōu)勢(shì)已普遍認(rèn)可,但對(duì)其長(zhǎng)壽命和高可靠性方面一直存在質(zhì)疑。在LED可靠性方面很關(guān)鍵的問(wèn)題之一在于解決LED器件PN結(jié)的熱學(xué)問(wèn)題。LED結(jié)溫的升高會(huì)直接導(dǎo)致其發(fā)光效率和壽命的降低,從而阻礙其在照明領(lǐng)域的發(fā)展與推廣。針對(duì)目前LED產(chǎn)品大功率、大密度的特點(diǎn),LED產(chǎn)品的結(jié)溫成為影響LED可靠性以及使用壽命的關(guān)鍵因素,因而LED產(chǎn)品的結(jié)溫準(zhǔn)確測(cè)量以及壽命預(yù)測(cè)具有重要意義。本論文主要完成了以下4個(gè)方面的工作。1、研究了白光LED陣列結(jié)溫檢測(cè)技術(shù),對(duì)傳統(tǒng)正向電壓法以及基于藍(lán)白比的光學(xué)方法分別進(jìn)行了研究。1)搭建了正向電壓法LED結(jié)溫測(cè)試平臺(tái),分析了結(jié)溫測(cè)試的不確定度。當(dāng)LED陣列工作于實(shí)際照明系統(tǒng)中時(shí),針對(duì)LED驅(qū)動(dòng)電路輸出電流的變化提出了結(jié)溫修正方法。2)針對(duì)由單一熒光粉轉(zhuǎn)化的白光LED,采用基于藍(lán)白比W/B的結(jié)溫測(cè)試方法,搭建了實(shí)驗(yàn)平臺(tái)并完成了驗(yàn)證。結(jié)果表明W/B隨結(jié)溫變化具有較高線性度,擬合度R-square高于0.99。3)針對(duì)由兩種熒光粉轉(zhuǎn)化的白光LED,本論文基于光譜分解,提出了一種藍(lán)白比(B+Y+R)/B的計(jì)算方法,給出了光譜分解以及計(jì)算過(guò)程中所產(chǎn)生的不確定度。結(jié)果表明采用(B+Y+R)/B計(jì)算結(jié)溫,可將結(jié)溫誤差由5.7℃縮小為2.2℃。2、在LED溫度加速老化實(shí)驗(yàn)中基于結(jié)溫的測(cè)量,研究了LED在線測(cè)試與非在線測(cè)試兩種方法在壽命預(yù)測(cè)上的差異。1)首先根據(jù)短期階梯應(yīng)力老化實(shí)驗(yàn)中LED結(jié)溫的變化,確定溫度應(yīng)力的“突變點(diǎn)”,從而在不改變LED失效機(jī)理的前提下合理選擇溫度應(yīng)力。2)在LED溫度加速老化實(shí)驗(yàn)中,根據(jù)LED加載不同熱沉?xí)r結(jié)溫的變化,提出了LED在線測(cè)試與非在線測(cè)試的對(duì)比實(shí)驗(yàn)方法,給出了兩種測(cè)試條件下LED光衰、色漂移以及壽命的對(duì)比分析結(jié)果。結(jié)果表明在線測(cè)試的壽命小于非在線測(cè)試,相差8%至13%。3針對(duì)LED加速老化過(guò)程中結(jié)溫逐漸上升的現(xiàn)象,提出了結(jié)溫修正的光衰退化模型,從而將LED的光衰退化歸一到其初始結(jié)溫下的變化,去除了結(jié)溫變化對(duì)于推算壽命的影響。研究中5個(gè)LED測(cè)試樣品,在80℃下老化3000小時(shí),在環(huán)境溫度25℃下的結(jié)溫上升6℃至8℃,此結(jié)溫的上升使得所預(yù)測(cè)的壽命偏低9%至21%。4提出了一種LED燈具中各組件的退化分析方法,將影響LED燈具光衰的組件分為L(zhǎng)ED驅(qū)動(dòng)、燈罩和LED光源三部分,分別以輸出功率、透過(guò)率和光通量作為三個(gè)組件的退化參數(shù)進(jìn)行退化分析。對(duì)一款白光LED球泡燈進(jìn)行了實(shí)驗(yàn)研究,結(jié)果表明,LED光源是影響LED燈具光衰退化最為嚴(yán)重的組件,占LED燈具整體退化量的70%左右;燈罩的退化則占燈具整體退化量的21%左右;LED驅(qū)動(dòng)電路的退化對(duì)LED燈具的影響不大。本文對(duì)白光LED進(jìn)行了結(jié)溫測(cè)試、加速老化實(shí)驗(yàn)以及壽命預(yù)測(cè)分析,在相關(guān)方面取得了一定進(jìn)展,對(duì)將來(lái)LED結(jié)溫測(cè)試以及可靠性分析的標(biāo)準(zhǔn)制定具有一定的參考意義。
[Abstract]:LED lighting products for its green, energy saving, long life and other advantages are gradually replacing traditional lighting products. Although the energy saving, environmental protection and other advantages has been widely recognized, but the long life and high reliability there has been questioned. One of the key problems in LED reliability is the junction temperature of.LED thermal problem solving LED device the increase of PN junction will directly lead to reduce the luminous efficiency and service life, thus hindering its development and promotion in the lighting field. Aiming at the characteristics of high power LED products, high density, the junction temperature of LED products become the key factors influencing the LED reliability and service life, thus LED products and accurate measurement of junction temperature the life prediction has important significance. This thesis consists of the following 4 aspects of the work of.1, white LED array junction temperature detection technology, the traditional voltage method and based on the ratio of the light blue and white Study on the.1 method respectively) set up the voltage method LED junction temperature test platform, analyzes the temperature measurement uncertainty of LED array. When working in real lighting system, according to the changes of the driving circuit of LED output current of the junction temperature correction method for.2) by a single phosphor converted white LED the junction temperature test method, blue white ratio based on W/B experimental platform is built and verified. The results show that the W/B junction temperature change with high linearity, fitting degree R-square higher than 0.99.3) directed by two kinds of fluorescent powder into the white LED, this paper based on spectral decomposition, a blue and white ratio (B+Y+R) the calculation method of /B generated by the given spectral decomposition and calculation of uncertainty. The results show that the use of /B (B+Y+R) to calculate the junction temperature, the junction temperature error reduced from 5.7 DEG C to 2.2 degrees.2, the experiment in the LED accelerated aging temperature In the measurement of junction temperature based on the difference of.1 of LED online test and non online test of two methods in the life prediction of the first step) according to the short-term stress aging changes of LED junction temperature in the experiment, determine the temperature stress of "mutation", thus without changing the LED failure mechanism under the reasonable choice the temperature stress of.2) in the LED temperature accelerated aging experiment, according to the change of LED loaded with different heat sink when the junction temperature, the experiment method of LED online testing and non online test, given the two test conditions LED decay, contrast color drift and life analysis results. The results show that the online test of the life less than the online test, a difference of 8% to 13%.3 for the LED junction temperature rises gradually accelerated aging phenomenon in the process of decay, and puts forward the end temperature correction degradation model, which will be LED light degradation normalized to its initial node temperature change, go to In addition to junction temperature change for calculation of life. 5 LED test samples in the study, aged for 3000 hours at 80 DEG C, the junction temperature at ambient temperature under 25 DEG C to rise 6 to 8 DEG C, the rise in junction temperature makes the predicted life is low to 9% 21%.4 presents a degradation analysis method LED the lamps of various components, will affect the assembly lumen LED lamps are divided into LED drive, LED light shade and the three part respectively to the output power, as the degradation parameters of three components of the transmittance and luminous flux degradation analysis. On a white LED bulb lamp was studied, the results show that the LED light source is the degradation effect of LED lamp is the most serious decay component, accounting for about 70% of the amount of LED light degradation; the degradation of the whole lamp shade accounted for about 21% of the amount of degradation; LED degradation effect on the driving circuit of LED lamp. The little white LED for over temperature measurement Accelerated aging test and life prediction analysis have made some progress in related aspects. It has a certain reference value for the future LED junction temperature test and reliability analysis.

【學(xué)位授予單位】：中國(guó)科學(xué)院長(zhǎng)春光學(xué)精密機(jī)械與物理研究所
【學(xué)位級(jí)別】：博士
【學(xué)位授予年份】：2017
【分類號(hào)】：TN312.8

【參考文獻(xiàn)】

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本文編號(hào)：1693047