高分辨率離面位移檢測中的若干問題研究
[Abstract]:With the increasing comprehensive national strength of our country, the application of all kinds of structures in aerospace, shipbuilding, automobile and other manufacturing fields is increasing day by day. In general, these structures are developing in the direction of large and refined. These requirements also force measurement technology to develop in the direction of high resolution, large area and large range. Although photogrammetry has become an important method for detecting off-plane information of all kinds of structures due to its non-contact and high-sensitivity characteristics, there is still no mature method to solve the problem of high resolution and large area in measurement. And the contradiction between high resolution and large range. Based on the optical measurement method and the off-plane displacement as the measurement background, this paper proposes a measurement scheme to solve the problems of high resolution and large area, high resolution and a large range, and sets up the corresponding off-plane displacement measurement system. Finally, the characteristics of each measuring system are verified by experiments. There are many kinds of off-plane displacement measurement methods. In this paper, the common off-plane displacement measurement methods are classified according to contact and non-contact methods, and the working principle, measuring resolution and measuring range of each method are summarized one by one. Then the limitations and main problems of each method in solving the contradiction between high resolution and large area and between high resolution and large range are analyzed and discussed. Projection grating method is the most commonly used method in structured light measurement, but digital devices bring obvious periodic ripple noise to the measurement method. This paper makes a detailed analysis of such noise. Two kinds of ripple noise cancellation algorithms are proposed based on fringe feature analysis and multiple fixed step size phase shift respectively. Then the effectiveness of the two algorithms is verified by experiments. At the same time, the characteristics and adaptive scenarios of the algorithms are compared and summarized. It provides reliable support for the high precision application of projection grid method. Combined with the characteristics of projection grating and geometric moire, this paper presents a method of projecting moire to solve the contradiction between high measurement resolution and large area, and sets up a projective grid line measurement system with pure optical system. The high density grating line is projected on the measured surface of a large object and accurately imaged. Then the high density grating image is interacted with the reference grating to form a plane moire. In order to overcome the difficulty of large area and high spatial resolution under the current hardware condition, the corresponding measurement system is built, and the field measurement is carried out by time phase shift and moving least square fitting method. It provides an effective scheme for high resolution and large area measurement applications. Based on the ultra-high resolution and piezoelectric ceramic technology of optical wavelength interferometry, an off-plane displacement detection method based on optical displacement tracking is proposed to solve the contradiction between high measurement resolution and a large range. In order to take into account the real-time working characteristics of the measurement system, an efficient displacement tracking algorithm is proposed based on image processing technology, and the corresponding measurement system is built for diffuse reflection surface and mirror interferometry, respectively. The experiments are carried out respectively, which provides an effective scheme for the application of high resolution and large range measurement.
【學(xué)位授予單位】:中國科學(xué)技術(shù)大學(xué)
【學(xué)位級別】:博士
【學(xué)位授予年份】:2017
【分類號】:O348.1
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