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高分辨率離面位移檢測(cè)中的若干問(wèn)題研究

發(fā)布時(shí)間:2018-11-24 11:34
【摘要】:隨著我國(guó)的綜合國(guó)力不斷增強(qiáng),各類(lèi)結(jié)構(gòu)在航空航天、造船、汽車(chē)等制造領(lǐng)域里的應(yīng)用日益增多,總體而言這些結(jié)構(gòu)都朝著大型且精細(xì)化的方向發(fā)展,這些需求也迫使測(cè)量技術(shù)朝向高分辨率、大面積和大量程的方向發(fā)展。光測(cè)方法雖以其非接觸、高靈敏度的特性成為各類(lèi)結(jié)構(gòu)離面信息檢測(cè)的重要手段,但目前仍然沒(méi)有一類(lèi)成熟的測(cè)試方法能夠較好的解決在測(cè)量中高分辨率與大面積,以及高分辨率與大量程之間的矛盾問(wèn)題。本文以光測(cè)方法為基礎(chǔ),同時(shí)結(jié)合離面位移為測(cè)量背景,分別提出了解決高分辨率與大面積,高分辨率與大量程矛盾問(wèn)題的測(cè)量方案,并分別搭建了相應(yīng)離面位移測(cè)量系統(tǒng),最后通過(guò)實(shí)驗(yàn)驗(yàn)證了各測(cè)量系統(tǒng)的特性。離面位移的測(cè)量方法種類(lèi)較多,本文將目前常用的離面位移測(cè)量方法按接觸式和非接觸式進(jìn)行歸類(lèi)劃分,并逐一總結(jié)了各方法的工作原理、測(cè)量分辨率以及測(cè)量量程,然后分析討論了各方法在解決高分辨率與大面積,以及高分辨率與大量程這兩對(duì)矛盾中的局限性和所面臨的主要難題。投影柵線法是結(jié)構(gòu)光測(cè)中最為常用的方法,但數(shù)字器件給該測(cè)量方法帶來(lái)了明顯的周期性紋波噪聲,本文針對(duì)這樣的噪聲做了詳細(xì)分析,并分別基于條紋特征分析和基于多次定步長(zhǎng)相移提出了兩種紋波噪聲消除算法,之后通過(guò)實(shí)驗(yàn)證實(shí)了兩個(gè)算法的有效性,同時(shí)對(duì)比總結(jié)算法各自的特點(diǎn)和適應(yīng)場(chǎng)景,為投影柵線法的高精度應(yīng)用提供了可靠支撐。結(jié)合投影柵線和幾何云紋的特點(diǎn),本文提出利用投影云紋的方法來(lái)解決高測(cè)量分辨率和大面積的矛盾問(wèn)題,用純光學(xué)系統(tǒng)建立投影柵線測(cè)量系統(tǒng),實(shí)現(xiàn)在被測(cè)大面積物體表面的高密度柵線投影并對(duì)其進(jìn)行精確成像,再將高密度柵線影像與參考光柵幾何干涉形成平面云紋,從而克服了在目前硬件條件下大面積與高空間分辨率的困難,同時(shí)搭建了相應(yīng)的測(cè)量系統(tǒng),通過(guò)時(shí)間相移并結(jié)合移動(dòng)最小二乘擬合方法進(jìn)行了現(xiàn)場(chǎng)測(cè)量,為在高分辨率和大面積的測(cè)量應(yīng)用中提供了有效方案。利用光學(xué)波長(zhǎng)干涉量級(jí)的超高分辨率和壓電陶瓷技術(shù),本文提出了基于光學(xué)位移跟蹤的離面位移檢測(cè)方法來(lái)解決高測(cè)量分辨率和大量程的矛盾問(wèn)題,而為了兼顧測(cè)量系統(tǒng)的實(shí)時(shí)工作特性,本文基于圖像處理技術(shù)提出了高效位移追蹤算法,同時(shí)分別針對(duì)漫反射表面和鏡面干涉測(cè)量搭建了相應(yīng)的測(cè)量系統(tǒng),并各自進(jìn)行了測(cè)量實(shí)驗(yàn),為在高分辨率和大量程的測(cè)量應(yīng)用中提供了有效方案。
[Abstract]:With the increasing comprehensive national strength of our country, the application of all kinds of structures in aerospace, shipbuilding, automobile and other manufacturing fields is increasing day by day. In general, these structures are developing in the direction of large and refined. These requirements also force measurement technology to develop in the direction of high resolution, large area and large range. Although photogrammetry has become an important method for detecting off-plane information of all kinds of structures due to its non-contact and high-sensitivity characteristics, there is still no mature method to solve the problem of high resolution and large area in measurement. And the contradiction between high resolution and large range. Based on the optical measurement method and the off-plane displacement as the measurement background, this paper proposes a measurement scheme to solve the problems of high resolution and large area, high resolution and a large range, and sets up the corresponding off-plane displacement measurement system. Finally, the characteristics of each measuring system are verified by experiments. There are many kinds of off-plane displacement measurement methods. In this paper, the common off-plane displacement measurement methods are classified according to contact and non-contact methods, and the working principle, measuring resolution and measuring range of each method are summarized one by one. Then the limitations and main problems of each method in solving the contradiction between high resolution and large area and between high resolution and large range are analyzed and discussed. Projection grating method is the most commonly used method in structured light measurement, but digital devices bring obvious periodic ripple noise to the measurement method. This paper makes a detailed analysis of such noise. Two kinds of ripple noise cancellation algorithms are proposed based on fringe feature analysis and multiple fixed step size phase shift respectively. Then the effectiveness of the two algorithms is verified by experiments. At the same time, the characteristics and adaptive scenarios of the algorithms are compared and summarized. It provides reliable support for the high precision application of projection grid method. Combined with the characteristics of projection grating and geometric moire, this paper presents a method of projecting moire to solve the contradiction between high measurement resolution and large area, and sets up a projective grid line measurement system with pure optical system. The high density grating line is projected on the measured surface of a large object and accurately imaged. Then the high density grating image is interacted with the reference grating to form a plane moire. In order to overcome the difficulty of large area and high spatial resolution under the current hardware condition, the corresponding measurement system is built, and the field measurement is carried out by time phase shift and moving least square fitting method. It provides an effective scheme for high resolution and large area measurement applications. Based on the ultra-high resolution and piezoelectric ceramic technology of optical wavelength interferometry, an off-plane displacement detection method based on optical displacement tracking is proposed to solve the contradiction between high measurement resolution and a large range. In order to take into account the real-time working characteristics of the measurement system, an efficient displacement tracking algorithm is proposed based on image processing technology, and the corresponding measurement system is built for diffuse reflection surface and mirror interferometry, respectively. The experiments are carried out respectively, which provides an effective scheme for the application of high resolution and large range measurement.
【學(xué)位授予單位】:中國(guó)科學(xué)技術(shù)大學(xué)
【學(xué)位級(jí)別】:博士
【學(xué)位授予年份】:2017
【分類(lèi)號(hào)】:O348.1

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