本文選題：石墨烯 + 物理法�。� 參考：《哈爾濱工業(yè)大學(xué)》2011年碩士論文

【摘要】：石墨烯是目前發(fā)現(xiàn)的最薄的材料,具有許多獨特的物理及化學(xué)性質(zhì),有著極為廣泛的應(yīng)用前景。通過物理法制備石墨烯,可以最大限度地保持石墨晶格的完整性,但石墨烯產(chǎn)率較低。本文總結(jié)對比了幾種常用的制備石墨烯的物理方法。發(fā)現(xiàn)將機械摩擦法制備的樣品在水中超聲分散,可以實現(xiàn)石墨樣品的層間剝離,獲得較薄的石墨烯樣品,提高了制備效率。 本文重點研究基底對石墨烯表面形貌的影響,主要使用光學(xué)顯微鏡和原子力顯微鏡做為表征手段。用光學(xué)顯微鏡對石墨烯厚度做出估計,然后利用原子力顯微鏡的高縱向分辨率特性對少層石墨烯的厚度做精確表征。我們以高定向性裂解石墨為原材料,使用膠帶解離法在氧化單晶硅、氧化鋁單晶、玻璃及云母基底上制備石墨烯,詳細研究基底表面形貌對少層石墨烯形貌的影響。我們發(fā)現(xiàn),較薄的石墨烯能很好地與基底貼合,石墨烯的形貌可反映出基底的表面形貌;但對于厚度5nm以上的較厚石墨烯,石墨烯的形貌不能反映出基底的表面形貌。此外,發(fā)現(xiàn)使用膠帶解離法制備的少層石墨樣品和基底之間有鼓包狀突起,其高度起伏不隨石墨烯的厚度變化。 通過將石墨烯粘附在原子力顯微鏡探針上,首次自制石墨烯探針。通過測量石墨烯探針與石墨和不同基底間的作用力,發(fā)現(xiàn)石墨與石墨間的作用力小于與單晶硅、單晶氧化鋁和云母間的作用力。該發(fā)現(xiàn)較好地解釋了膠帶解離法可以把石墨烯轉(zhuǎn)移到這些基體上的原因;而石墨與石墨間的作用力大于與玻璃基體間的作用力,這與不同基體表面粗糙度有關(guān):玻璃表面較粗糙,石墨烯探針與基體之間接觸面積小于其它基體,導(dǎo)致較低的作用力。
[Abstract]:Graphene is the thinnest material found at present. It has many unique physical and chemical properties and has a wide application prospect. Graphene can be prepared by physical method, and the integrity of graphite lattice can be maintained as much as possible, but the yield of graphene is low. In this paper, several common physical methods of preparing graphene are summarized and compared. It is found that ultrasonic dispersion of the samples prepared by mechanical friction method in water can realize the interlaminar stripping of graphite samples and obtain thin graphene samples and improve the preparation efficiency. In this paper, the influence of substrate on the surface morphology of graphene is studied. Optical microscope and atomic force microscope are used to characterize the surface morphology of graphene. The thickness of graphene was estimated by optical microscope, and the thickness of less layer graphene was accurately characterized by atomic force microscope (AFM) with high longitudinal resolution. Graphene was prepared on the substrate of oxidized monocrystalline silicon, alumina single crystal, glass and mica by using highly oriented pyrolytic graphite as raw material. The influence of the surface morphology of substrate on the morphology of less layer graphene was studied in detail. It is found that the thin graphene fits well with the substrate, and the morphology of graphene can reflect the surface morphology of the substrate, but for the thicker graphene above the thickness of 5nm, the morphology of graphene can not reflect the surface morphology of the substrate. In addition, it is found that there are bulge protrusions between the thin layer graphite sample and the substrate prepared by tape dissociation method, and the height fluctuation does not change with the thickness of graphene. Graphene probe was first made by adhesion of graphene to atomic force microscope (AFM) probe. By measuring the interaction force between graphene probe and graphite and different substrates, it is found that the interaction force between graphite and graphite is less than that between graphite and monocrystalline silicon, single crystal alumina and mica. The results show that the adhesive tape dissociation method can transfer graphene onto these substrates, and the interaction force between graphite and graphite is greater than that between graphite and glass matrix. This is related to the surface roughness of different substrates: the surface of glass is rough, and the contact area between graphene probe and matrix is smaller than that of other substrates, which leads to lower interaction force.
【學(xué)位授予單位】：哈爾濱工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2011
【分類號】：O613.71

【共引文獻】

相關(guān)博士學(xué)位論文 前1條

1 魏征;基于掃描探針表面原子識別的前期實驗研究[D];中國科學(xué)技術(shù)大學(xué);2007年

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