【摘要】：在飛機(jī)、船舶、汽車等建造工業(yè)領(lǐng)域生產(chǎn)中,無(wú)損檢測(cè)作為其關(guān)鍵部位零器件缺損情況檢測(cè)最重要的手段之一,無(wú)損檢測(cè)技術(shù)在探測(cè)關(guān)鍵部位零器件缺陷、消除潛在的安全隱患、保障設(shè)備的安全運(yùn)行等方面發(fā)揮著極其重要的作用。其中,如何提高檢測(cè)精度是目前亟需解決的一大難題。本文將以此為背景,應(yīng)用無(wú)損電渦流檢測(cè)原理,引入高靈敏度的巨磁電阻(GMR)芯片,設(shè)計(jì)了一款新型的無(wú)損探測(cè)系統(tǒng)。本文首先對(duì)電渦流探頭的結(jié)構(gòu)進(jìn)行了研究,傳統(tǒng)的線圈式探頭其靈敏度隨著工作頻率的降低而減少,現(xiàn)有的基于傳感器芯片的電渦流探頭,內(nèi)部采用一個(gè)單一的激勵(lì)線圈,當(dāng)通入交流電時(shí)激發(fā)的磁場(chǎng)會(huì)對(duì)渦流信號(hào)造成干擾,進(jìn)而影響缺陷檢測(cè)。鑒于此,本文對(duì)探頭的結(jié)構(gòu)作了改進(jìn)即在激勵(lì)線圈的基礎(chǔ)上再額外增加一個(gè)消除線圈,以此降低激勵(lì)場(chǎng)對(duì)渦流信號(hào)的干擾,從而提高檢測(cè)精度。本文利用有限元軟件ANSOFT MAXWELL模擬仿真了一個(gè)無(wú)損檢測(cè)模型,在其中渦流檢測(cè)探頭的結(jié)構(gòu)上增加了一個(gè)消除線圈,通過(guò)仿真結(jié)果得出:相比于常規(guī)式只有單一激勵(lì)線圈的探頭,新型的GMR探頭采用了雙線圈,且線圈中心芯片放置處磁場(chǎng)變化量更大而周圍磁場(chǎng)較弱。隨后實(shí)物制作了這款具有高信噪比的巨磁電阻(GMR)電渦流探頭。其次本文還針對(duì)新型的探頭設(shè)計(jì)并改進(jìn)了一個(gè)無(wú)損檢測(cè)系統(tǒng),系統(tǒng)設(shè)計(jì)主要分為硬件電路和軟件兩個(gè)部分,其中硬件電路設(shè)計(jì)主要有正弦波發(fā)生電路、功率放大電路以及信號(hào)調(diào)理電路。正弦波發(fā)生電路采用單片機(jī)控制DDS芯片的方式來(lái)產(chǎn)生一定頻率的正弦波,信號(hào)調(diào)理電路則采用鎖相放大、放大和低通濾波的方式對(duì)探頭的原始輸出信號(hào)作相應(yīng)的調(diào)理;軟件方面集中在單片機(jī)編程控制芯片產(chǎn)生正弦波和后續(xù)數(shù)據(jù)處理上利用數(shù)據(jù)采集卡和LABVIEW編程實(shí)現(xiàn)數(shù)據(jù)信息的實(shí)時(shí)處理和觀測(cè)。通過(guò)后期PCB板的調(diào)試,系統(tǒng)中各模塊能發(fā)揮各自良好的功能。最后對(duì)以上所設(shè)計(jì)的無(wú)損檢測(cè)系統(tǒng)進(jìn)行了試件缺陷檢測(cè),通過(guò)多組實(shí)驗(yàn)數(shù)據(jù)的對(duì)比得出結(jié)論:新型結(jié)構(gòu)的GMR探頭能夠檢測(cè)試件中的缺陷并且檢測(cè)精度較高。
[Abstract]:Nondestructive testing (NDT) is one of the most important methods to detect the defect of zero devices in the key parts of aircraft, ships, automobiles and other construction industries, and the technology of nondestructive testing is used to detect the defects of zero devices in the key parts. Eliminating potential hidden dangers and ensuring the safe operation of equipment play an extremely important role. Among them, how to improve the detection accuracy is a big problem that needs to be solved. In this paper, a new nondestructive detection system is designed based on the principle of nondestructive eddy current testing and the introduction of a high sensitivity Giant Magnetoresistance (GMR) (GMR) chip. In this paper, the structure of the eddy current probe is studied. The sensitivity of the traditional coil probe decreases with the decrease of the working frequency. A single exciting coil is used in the existing eddy current probe based on the sensor chip. The magnetic field excited by the AC current will interfere with the eddy current signal and affect the defect detection. In view of this, the structure of the probe is improved, that is, an additional elimination coil is added on the basis of the exciting coil to reduce the disturbance of the excitation field to the eddy current signal, thus improving the detection accuracy. In this paper, a nondestructive testing model is simulated by using the finite element software ANSOFT MAXWELL, in which an elimination coil is added to the structure of the eddy current detection probe. The simulation results show that compared with the conventional probe with only a single excitation coil, The new GMR probe uses double coils, and the magnetic field in the central chip of the coil is much larger and the magnetic field around it is weaker. Subsequently, the GMR (GMR) eddy current probe with high signal-to-noise ratio was fabricated. Secondly, this paper also designs and improves a nondestructive testing system for the new probe. The system design is mainly divided into two parts: hardware circuit and software, in which the hardware circuit design mainly includes sine wave generation circuit. Power amplifier circuit and signal conditioning circuit. The sinusoidal wave generating circuit uses the single chip computer to control the DDS chip to produce the sine wave of a certain frequency, and the signal conditioning circuit uses the phase-locked amplification, amplification and low-pass filter to adjust the original output signal of the probe. The software is focused on the sine wave generation and subsequent data processing on the single chip microcomputer programming control chip. The data acquisition card and LABVIEW program are used to realize the real-time processing and observation of the data information. Through the later debugging of PCB board, each module in the system can play its own good function. Finally, the defect detection of the NDT system designed above is carried out, and the conclusion is drawn through the comparison of many groups of experimental data: the new structure GMR probe can detect the defects in the specimen and the detection accuracy is high.
【學(xué)位授予單位】：電子科技大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2017
【分類號(hào)】：TP212;TP274

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本文編號(hào)：2158290