“正交”便攜反射式光彈性儀誤差分析
發(fā)布時間:2018-01-14 05:31
本文關(guān)鍵詞:“正交”便攜反射式光彈性儀誤差分析 出處:《河南理工大學(xué)學(xué)報(bào)(自然科學(xué)版)》2014年05期 論文類型:期刊論文
更多相關(guān)文章: 誤差 正交 反射式光彈性儀 應(yīng)力光圖
【摘要】:為滿足工程現(xiàn)場觀測高應(yīng)變梯度區(qū)域、裂紋尖端區(qū)域應(yīng)力光圖以及用光彈貼片鉆孔法測殘余應(yīng)力的需要,研究了基于光彈貼片技術(shù)原理的反射式光彈性儀,分析了"正交"反射式光彈性儀偏光系統(tǒng)的工作原理,運(yùn)用誤差理論論證了儀器設(shè)計(jì)的可行性及有效性,本儀器正、反兩測回所得的測量數(shù)據(jù)是等精度的,給出了儀器測試結(jié)果的極限誤差.結(jié)果表明,使用該儀器能得到光彈性方法中的全部試驗(yàn)數(shù)據(jù),極限誤差滿足原理誤差要求.
[Abstract]:In order to meet the need of field observation of high strain gradient region, crack tip region stress light map and the measurement of residual stress by photoelastic patch drilling method, a reflective photoelastic meter based on photoelastic patch technique is studied. This paper analyzes the working principle of the polarizing system of the "orthogonal" reflection photoelastic meter, and proves the feasibility and validity of the design of the instrument by using the error theory. The measured data obtained from the positive and negative measurements of this instrument are of equal accuracy. The limit error of the test results of the instrument is given. The results show that all the experimental data in the photoelastic method can be obtained by using the instrument, and the limit error can meet the requirements of the principle error.
【作者單位】: 鄭州航空工業(yè)管理學(xué)院;
【基金】:河南省科技攻關(guān)計(jì)劃項(xiàng)目(102102210148)
【分類號】:TH70
【正文快照】: 0引言光彈貼片技術(shù)在機(jī)械、建筑、航天、航空、核工業(yè)、礦山、汽車等領(lǐng)域已得到廣泛應(yīng)用.基于光彈貼片技術(shù)原理的“V”型光路的反射式光彈性儀是用于測量結(jié)構(gòu)表面應(yīng)力、應(yīng)變的儀器,它的獨(dú)特優(yōu)點(diǎn)是能全場、直觀、非接觸式地測量結(jié)構(gòu)表面的應(yīng)力、應(yīng)變場,它既可以直接對原型結(jié)構(gòu),
本文編號:1422256
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