【摘要】：薄膜晶體管液晶顯示器(Thin Film Transistor-Liquid Crystal Display: TFT-LCD)已經(jīng)廣泛應(yīng)用到各個(gè)領(lǐng)域,并且逐步進(jìn)入千家萬(wàn)戶。而隨著LCD制造業(yè)的發(fā)展以及LCD設(shè)計(jì)技術(shù)的革新?lián)Q代,對(duì)TFT液晶顯示器的測(cè)試能力提出了新的要求。多年來(lái)LCD測(cè)試技術(shù)一直被國(guó)外所掌握,測(cè)試設(shè)備主要以外購(gòu)為主,比如韓國(guó)的J600和J1000,高昂的設(shè)備經(jīng)費(fèi)也成為必然。由此可見(jiàn),掌握TFT-LCD測(cè)試核心技術(shù)并開(kāi)發(fā)專業(yè)的測(cè)試設(shè)備的意義尤為重要。 本論文主要基于現(xiàn)場(chǎng)可編程門陣列(Field-Programmable Gate Array, FPGA)開(kāi)發(fā)平臺(tái)進(jìn)行研究,設(shè)計(jì)開(kāi)發(fā)新的TFT-LCD測(cè)試系統(tǒng),主要工作包括： (1)在深入研究了TFT-LCD的顯示原理和國(guó)內(nèi)外測(cè)試設(shè)備開(kāi)發(fā)現(xiàn)狀的基礎(chǔ)上,根據(jù)實(shí)際的功能需求制定了系統(tǒng)的整體開(kāi)發(fā)方案； (2)搭建了FPGA硬件實(shí)現(xiàn)平臺(tái),對(duì)硬件模塊進(jìn)行了對(duì)比選型,并分別實(shí)現(xiàn)了電源控制、時(shí)鐘控制、時(shí)序控制以及MIPI橋接等多個(gè)功能模塊； (3)實(shí)現(xiàn)了軟件編程,制定多處理器之間的通信協(xié)議,配合對(duì)數(shù)字電源模塊、時(shí)鐘控制模塊以及MIPI橋接等功能模塊的控制,并通過(guò)參數(shù)配置的方式實(shí)現(xiàn)多種邏輯圖片在TFT-LCD上顯示,達(dá)到了實(shí)際需求的畫面檢測(cè)功能； (4)應(yīng)用設(shè)計(jì)的TFT液晶顯示模組測(cè)試系統(tǒng)進(jìn)行了信號(hào)測(cè)試,主要對(duì)各個(gè)功能模塊及MIPI信號(hào)的實(shí)現(xiàn)效果進(jìn)行了實(shí)際評(píng)估,驗(yàn)證了本測(cè)試系統(tǒng)的實(shí)際效果。 本論文設(shè)計(jì)的設(shè)備為一種可同時(shí)驅(qū)動(dòng)兩塊模組的驅(qū)動(dòng)方式的國(guó)產(chǎn)測(cè)試設(shè)備,最終實(shí)現(xiàn)的測(cè)試設(shè)備已在某液晶顯示器模組制造工廠使用。論文的研究結(jié)果表明,隨著國(guó)內(nèi)LCD制造業(yè)的興起,包括測(cè)試技術(shù)的多個(gè)核心技術(shù)都被國(guó)內(nèi)企業(yè)所掌握,并逐漸發(fā)展壯大,測(cè)試技術(shù)作為L(zhǎng)CD制造工藝的一項(xiàng)重要技術(shù),已經(jīng)具備行業(yè)內(nèi)較高的水準(zhǔn),并逐步實(shí)現(xiàn)國(guó)產(chǎn)化。
[Abstract]:Thin Film Transistor liquid Crystal display (Thin Film Transistor-Liquid Crystal Display: TFT-LCD) has been widely used in various fields, and gradually into thousands of households. With the development of LCD manufacturing industry and the innovation of LCD design technology, the testing ability of TFT liquid crystal display (LCD) is required. For many years, LCD testing technology has been mastered abroad, the main test equipment is mainly purchased from outside, such as J600 and J1000 in South Korea, the high cost of equipment has also become inevitable. It can be seen that it is very important to master the core technology of TFT-LCD testing and develop professional testing equipment. This paper is mainly based on the field programmable gate array (Field-Programmable Gate Array, FPGA) development platform for research, design and development of a new TFT-LCD test system, The main work includes: (1) on the basis of in-depth study of the display principle of TFT-LCD and the status quo of the development of test equipment at home and abroad, the overall development scheme of the system is formulated according to the actual functional requirements; (2) the FPGA hardware implementation platform is built, and the hardware modules are compared and selected, and several functional modules, such as power control, clock control, timing control and MIPI bridging, are realized respectively. (3) the software programming is realized, the communication protocol between multi-processors is made, and the digital power module, clock control module and MIPI bridging module are controlled. And through the configuration of parameters to achieve a variety of logical pictures on the TFT-LCD display, to achieve the actual needs of the screen detection function; (4) the test system of TFT liquid crystal display module is used to test the signal, and the realization effect of each function module and MIPI signal is evaluated, and the actual effect of the test system is verified. The equipment designed in this paper is a kind of domestic test equipment which can drive two modules at the same time. Finally, the test equipment has been used in a liquid crystal display module manufacturing factory. The research results show that, with the rise of domestic LCD manufacturing industry, many core technologies, including test technology, are mastered by domestic enterprises and gradually developed. As an important technology of LCD manufacturing process, test technology is one of the most important technologies. Has already had the industry within the higher level, and gradually realized localization.
【學(xué)位授予單位】：中國(guó)科學(xué)院大學(xué)（工程管理與信息技術(shù)學(xué)院）
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2014
【分類號(hào)】：TN791;TN873.93

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