【摘要】：暗物質(zhì)得到了國(guó)際上很多頂尖科學(xué)家的關(guān)注,并且提出了一系列測(cè)量暗物質(zhì)的方法,主要包括:間接法和直接法測(cè)量暗物質(zhì),然而這些測(cè)量暗物質(zhì)的實(shí)驗(yàn)方法必須在一個(gè)本底非常低的情況下才有可能測(cè)量到暗物質(zhì),所以世界上有許多實(shí)驗(yàn)組為了給測(cè)量暗物質(zhì)提供良好的測(cè)量環(huán)境都把實(shí)驗(yàn)室從地上搬到地下,這樣做的主要目的是為了屏蔽宇宙射線的干擾。而我國(guó)錦屏地下實(shí)驗(yàn)室正好做到了這一點(diǎn),本次論文主要研究的是屏蔽體材料及大廳中的氡濃度對(duì)極低本底裝置的影響,本論文研究了以下幾點(diǎn):(1)本文研究了鉛銅屏蔽體中放射性核素對(duì)極低本底裝置的影響,分別模擬了鉛、銅中238U系、232Tu系、40K對(duì)極低本底裝置的影響;(2)本文通過使用Alpha Guard電離室測(cè)氡儀測(cè)量了實(shí)驗(yàn)大廳中的氡濃度,探討了在其他條件一致的情況下,通風(fēng)設(shè)備對(duì)實(shí)驗(yàn)大廳中氡濃度的影響,同時(shí)用高純鍺探測(cè)器測(cè)量了低本底裝置中的氡及氡子體的γ射線,探討了實(shí)驗(yàn)大廳氡濃度對(duì)極低本底裝置的影響;(3)根據(jù)高純鍺探測(cè)器探測(cè)出的氡子體214Pb(351.9ke V)的計(jì)數(shù)率,并根據(jù)測(cè)量時(shí)氡及子體處于長(zhǎng)期平衡計(jì)算出樣品腔中氡含量,根據(jù)計(jì)算的結(jié)果討論了試驗(yàn)大廳中氡濃度對(duì)極低本底裝置的影響。
[Abstract]:Dark matter has attracted the attention of many top scientists in the world, and has put forward a series of methods to measure dark matter, including indirect method and direct method. But these methods of measuring dark matter have to be very low in background to make it possible to measure dark matter. So many experimental groups in the world have moved the laboratory from the ground to the ground in order to provide a good measuring environment for the measurement of dark matter. The main purpose of this is to shield against cosmic ray interference. China's Jinping underground laboratory has done just that. This paper mainly studies the effects of shielding materials and radon concentration in the hall on the very low background device. The main contributions of this thesis are as follows: (1) the effects of radionuclides in lead-copper shield on very low background devices are studied. The effect of 238U system 232Tu system 40K on the very low background device; (2) the radon concentration in the experimental hall was measured by using the Alpha Guard ionization chamber instrument, and the effect of ventilation equipment on the radon concentration in the experimental hall was discussed under the same conditions. At the same time, the high purity germanium detector was used to measure the 緯 rays of radon and radon progeny in the low background device, and the effect of radon concentration on the very low background device in the laboratory hall was discussed. (3) according to the counting rate of radon daughter 214Pb (351.9ke V) detected by the high purity germanium detector, The radon content in the sample cavity was calculated according to the long term equilibrium of radon and its progeny, and the effect of radon concentration in the test hall on the very low background device was discussed.
【學(xué)位授予單位】：東華理工大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2014
【分類號(hào)】：P145.9

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本文編號(hào)：2191369