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抗輻射容錯(cuò)計(jì)算機(jī)的設(shè)計(jì)與實(shí)現(xiàn)

發(fā)布時(shí)間:2019-06-29 07:06
【摘要】:在航空航天領(lǐng)域,計(jì)算機(jī)系統(tǒng)常常受到輻射的影響。尤其是電磁脈沖,,給計(jì)算機(jī)系統(tǒng)的可靠工作帶來(lái)了極大的威脅。由于計(jì)算機(jī)工作環(huán)境惡劣難于進(jìn)行人工的維護(hù),但又必須保證計(jì)算機(jī)能夠安全穩(wěn)定的工作,所以如何提高計(jì)算機(jī)系統(tǒng)的抗輻射能力,具有重要的現(xiàn)實(shí)意義和經(jīng)濟(jì)價(jià)值。傳統(tǒng)的抗輻射技術(shù)是在機(jī)器層采用無(wú)縫機(jī)殼屏蔽技術(shù)和在部件層使用加固芯片。但是這仍然不能完全屏蔽掉電磁脈沖,耦合進(jìn)入到機(jī)箱中的電磁脈沖依然會(huì)導(dǎo)致硬件失效。如何從計(jì)算機(jī)體系結(jié)構(gòu)的層面提高計(jì)算機(jī)系統(tǒng)抗輻射能力成為計(jì)算機(jī)抗輻射研究的重要內(nèi)容。 本文首先對(duì)輻射效應(yīng)和抗輻射技術(shù)進(jìn)行了研究。引入容錯(cuò)理論,從計(jì)算機(jī)的設(shè)計(jì)角度提出了一種抗輻射容錯(cuò)計(jì)算機(jī)的設(shè)計(jì)方案。系統(tǒng)采用一個(gè)備份源的機(jī)器級(jí)冷備份待命儲(chǔ)備系統(tǒng)方式實(shí)現(xiàn);诶鋫浞荼葻醾浞輰(duì)輻射尤其是電磁脈沖有著更好的抗干擾能力,在備份原狀態(tài)的選擇、供電電路的設(shè)計(jì)及檢測(cè)器的設(shè)置上都做出相應(yīng)的考慮。 然后從CPLD邏輯設(shè)計(jì)及硬件電路兩方面對(duì)原理樣機(jī)進(jìn)行詳細(xì)設(shè)計(jì)與實(shí)現(xiàn)。原理樣機(jī)由2個(gè)主機(jī)板和一個(gè)公共板組成,每個(gè)主機(jī)板上有一個(gè)容錯(cuò)管理模塊。容錯(cuò)管理模塊針對(duì)輻射引發(fā)故障頻繁的處理器和I/O接口電路進(jìn)行故障檢測(cè),并采用瞬時(shí)故障本機(jī)復(fù)位及永久故障系統(tǒng)切換的故障處理機(jī)制。 為驗(yàn)證系統(tǒng)故障檢測(cè)和故障處理的容錯(cuò)機(jī)制,本文開發(fā)了一個(gè)植入式故障注入系統(tǒng)。注入系統(tǒng)可以向用以進(jìn)行處理器和I/O接口故障檢測(cè)的數(shù)據(jù)線注入永久和瞬時(shí)故障,模擬計(jì)算機(jī)在現(xiàn)實(shí)運(yùn)行環(huán)境下發(fā)生的各種常見(jiàn)故障。最后通過(guò)故障注入系統(tǒng),對(duì)原理樣機(jī)的容錯(cuò)機(jī)制進(jìn)行了故障注入實(shí)驗(yàn),驗(yàn)證了系統(tǒng)故障檢測(cè)機(jī)制和故障處理能力。
[Abstract]:In the field of aerospace, computer systems are often affected by radiation. In particular, electromagnetic pulse brings great threat to the reliable work of computer system. Because the computer working environment is difficult to maintain manually, but it is necessary to ensure that the computer can work safely and stably, so how to improve the radiation resistance of the computer system is of great practical significance and economic value. The traditional anti-radiation technology is to use seamless housing shielding technology in the machine layer and reinforcement chip in the component layer. However, the electromagnetic pulse can not be completely shielded, and the electromagnetic pulse coupled into the chassis will still lead to hardware failure. How to improve the radiation resistance of computer system from the level of computer architecture has become an important part of computer radiation resistance research. In this paper, the radiation effect and anti-radiation technology are studied at first. Based on the theory of fault tolerance, a design scheme of anti-radiation fault-tolerant computer is proposed from the point of view of computer design. The system is realized by a machine level cold backup standby reserve system with backup source. Based on the fact that cold backup has better anti-interference ability to radiation, especially electromagnetic pulse, the selection of original state of backup, the design of power supply circuit and the setting of detector are considered accordingly. Then the prototype is designed and implemented in detail from two aspects of CPLD logic design and hardware circuit. The prototype consists of two motherboards and one common board, each of which has a fault-tolerant management module. The fault-tolerant management module detects the fault of the processor and I / O interface circuit with frequent radiation-induced faults, and adopts the fault processing mechanism of instantaneous fault local reset and permanent fault system switching. In order to verify the fault-tolerant mechanism of fault detection and fault processing, an implantable fault injection system is developed in this paper. The injection system can inject permanent and instantaneous faults into the data lines used for processor and I / O interface fault detection, and simulate all kinds of common faults of the computer in the real running environment. Finally, the fault injection experiment of the fault tolerant mechanism of the prototype is carried out through the fault injection system, and the fault detection mechanism and fault processing ability of the system are verified.
【學(xué)位授予單位】:哈爾濱工業(yè)大學(xué)
【學(xué)位級(jí)別】:碩士
【學(xué)位授予年份】:2012
【分類號(hào)】:TP302.8

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