【摘要】：隨著半導體制造工藝的進步與革新,以及消費電子產品對低功耗的要求進一步提高,Flash存儲器無論是在存取速度和制作體積上,越來越不能滿足當前的需求,新型阻變存儲器應運而生。其結構簡單、訪問速度快的優(yōu)勢更加凸顯。但存在編程／擦除不成功、耐受性差等可靠性問題,對測試設備的測試精度和速度提出了很高的要求。目前商用的測試模塊主要存在兩個問題：速度快精度差或速度慢精度高,均不能很好滿足測試需求。并且這種商用的測試模塊所配置的上位機軟件也存在界面不夠友好和不能深度定制驅動波形等缺點,大大降低了測試的效率。基于以上現(xiàn)狀,本文以設計快速、靈活、可靠的阻變存儲單元測試系統(tǒng)為目的,設計并實現(xiàn)阻變存儲器測試系統(tǒng),主要工作包括：1、通過需求分析,電路原理設計,軟件仿真驗證,原理圖生成,PCB制作的過程完成系統(tǒng)硬件電路,使其具有可變驅動波形的發(fā)生和返回信號的高速高精度測量的功能,達到輸出脈沖模式下脈沖寬度100ns-lms可調,幅度±5V可調；直流模式下-5V-5V的電壓掃描。2、調試并優(yōu)化模擬部分電路,完成電路電源系統(tǒng)、脈沖輸出能力和電壓電流檢測能力測試,驗證電路的穩(wěn)定性與可靠性。測試結果顯示波形發(fā)生速度可達50ns,驅動能力達100mA,并具有較高的檢測精度。
[Abstract]:With the progress and innovation of semiconductor manufacturing technology and the further improvement of consumer electronic products' demand for low power consumption, Flash memory is increasingly unable to meet the current demand in terms of access speed and fabrication volume. A new type of resistive memory came into being. Its structure is simple, the advantage of fast access speed more prominent. However, there are some reliability problems, such as unsuccessful programming / erasure, poor tolerance and so on. Therefore, the test accuracy and speed of the test equipment are very high. At present, there are two main problems in commercial test modules: low speed and low precision, which can not meet the test requirements. Moreover, the software of this commercial test module also has some disadvantages, such as the interface is not friendly and the driving waveform can not be deeply customized, which greatly reduces the efficiency of the test. Based on the above situation, this paper aims to design a fast, flexible and reliable test system for the resistive memory unit. The main work includes: 1. Through the requirement analysis, the design of the circuit principle. The software simulation verifies, the schematic diagram is generated, the PCB process completes the system hardware circuit, makes it has the variable drive waveform generation and the return signal high speed high precision measurement function, achieves the output pulse mode pulse width 100ns-lms to be adjustable. The amplitude 鹵5V is adjustable; Voltage scan of 5V-5V in DC mode. 2. Debug and optimize the analog circuit, complete the circuit power system, pulse output ability and voltage and current detection ability test, verify the stability and reliability of the circuit. The test results show that the waveform generation speed can reach 50 ns, the driving ability is up to 100 Ma, and the detection accuracy is high.
【學位授予單位】：山東大學
【學位級別】：碩士
【學位授予年份】：2016
【分類號】：TP333

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本文編號：2370509