一種片上可測(cè)試FLASH存儲(chǔ)器的設(shè)計(jì)
發(fā)布時(shí)間：2018-10-09 17:49
【摘要】：介紹了一種片上FLASH存儲(chǔ)器的設(shè)計(jì)與實(shí)現(xiàn)。通過對(duì)FLASH IP接口功能及時(shí)序的分析,實(shí)現(xiàn)了特定FLASH的控制邏輯;對(duì)FLASH增加了片外測(cè)試接口,便于片外測(cè)試。仿真結(jié)果表明,該設(shè)計(jì)可實(shí)現(xiàn)對(duì)FLASH的操作與片外測(cè)試功能。
[Abstract]:This paper introduces the design and implementation of a kind of on-chip FLASH memory. Through the analysis of the function and timing of FLASH IP interface, the control logic of specific FLASH is realized, and the off-chip test interface is added to FLASH to facilitate the off-chip test. The simulation results show that the design can realize the function of FLASH operation and out-of-chip testing.
【作者單位】： 江南大學(xué)物聯(lián)網(wǎng)工程學(xué)院;中國電子科技集團(tuán)公司第五十八研究所;
【分類號(hào)】：TP333
[Abstract]:This paper introduces the design and implementation of a kind of on-chip FLASH memory. Through the analysis of the function and timing of FLASH IP interface, the control logic of specific FLASH is realized, and the off-chip test interface is added to FLASH to facilitate the off-chip test. The simulation results show that the design can realize the function of FLASH operation and out-of-chip testing.
【作者單位】： 江南大學(xué)物聯(lián)網(wǎng)工程學(xué)院;中國電子科技集團(tuán)公司第五十八研究所;
【分類號(hào)】：TP333
【參考文獻(xiàn)】
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