本文選題：可測性設(shè)計 + 可調(diào)試性設(shè)計��； 參考：《國防科學(xué)技術(shù)大學(xué)》2012年碩士論文

【摘要】：隨著集成電路尺寸的日益減小和復(fù)雜程度的逐步提高，調(diào)測試已經(jīng)成為芯片設(shè)計迫切需要解決的問題。 嵌入式存儲器在SoC中所占比例逐漸增大，為有效檢測嵌入式存儲器中的缺陷和故障，必須設(shè)計一種高質(zhì)量的嵌入式存儲器測試方法，從而能夠改善整體成品率并實(shí)質(zhì)性節(jié)省測試和制造成本。與此同時，由于傳統(tǒng)的存儲器測試不能定位并觀察故障，必須設(shè)計高效的調(diào)試手段，才能更好地調(diào)試設(shè)計中的錯誤，從而達(dá)到修正功能設(shè)計錯誤的目的。 本文主要有三個方面的貢獻(xiàn)：一是提出一種March YY算法。該算法以業(yè)內(nèi)應(yīng)用廣泛的March算法研究為背景，以各種單一單元故障類型和耦合故障類型的研究為前提，根據(jù)每種故障發(fā)生時的狀態(tài)轉(zhuǎn)換圖提出解決故障所需的March元素，并根據(jù)總結(jié)出的March元素在March C+算法的基礎(chǔ)上進(jìn)行優(yōu)化合并。March YY算法繼承了March C+算法六步對稱結(jié)構(gòu)的優(yōu)點(diǎn)，在合理的算法復(fù)雜度開銷的前提下增加了對WDF、CFdsxwx、CFwd三種故障的覆蓋率。二是設(shè)計并實(shí)現(xiàn)基于MarchYY算法的存儲器內(nèi)建自測試（Memory Built In Self Test，簡稱MBIST）控制器。本文設(shè)計了基于MarchYY算法的MBIST電路，并通過軟件模擬驗(yàn)證了March YY算法的全部功能。三是設(shè)計并實(shí)現(xiàn)基于MBIST控制器的宏測試（Macro Test，簡稱MT）結(jié)構(gòu)。本文開創(chuàng)性地利用MBIST電路原有的讀寫邏輯，實(shí)現(xiàn)了基于MBIST控制器的MT功能。 實(shí)踐證明，本文設(shè)計的March YY算法完全覆蓋了目前所有已知的簡單故障類型，具有良好的工程應(yīng)用前景；基于該算法的MBIST電路設(shè)計功能正確，具有很好的理論參考價值；基于MBIST控制器的宏測試結(jié)構(gòu)在有效減少電路開銷的同時實(shí)現(xiàn)了對存儲器的宏測試功能，，具有較高的實(shí)際應(yīng)用價值。
[Abstract]:With the gradual decrease of the size of IC and the gradual increase of its complexity, modulation testing has become an urgent problem to be solved in chip design.
The proportion of embedded memory in SoC is increasing. In order to detect the defects and faults in embedded memory effectively, it is necessary to design a high quality embedded memory test method, which can improve the overall yield and save the cost of testing and manufacturing. To observe faults, we must design efficient debugging methods to better debug the errors in the design, so as to achieve the purpose of correcting functional design errors.
The main contributions of this paper are three aspects: first, a March YY algorithm is proposed. The algorithm is based on the research of March algorithm widely used in the industry. Based on the research of the type of single unit fault and the type of coupling fault, the March elements needed to solve the fault are put forward according to the state conversion diagram of each fault. On the basis of the March C+ algorithm, the March element is optimized and merged with the.March YY algorithm to inherit the advantages of the six step symmetric structure of the March C+ algorithm. The coverage rate of the three faults for WDF, CFdsxwx, CFwd is increased under the premise of reasonable algorithm complexity overhead. Two is to design and implement the built-in self-test of the memory based on MarchYY algorithm. Test (Memory Built In Self Test, abbreviated as MBIST) controller. This paper designs MBIST circuit based on MarchYY algorithm, and verifies all functions of March YY algorithm through software simulation. Three, design and implement macro test based on MBIST controller. The MT function based on the MBIST controller is realized.
The practice shows that the March YY algorithm designed in this paper completely covers all the known simple fault types and has good engineering application prospect. The MBIST circuit based on this algorithm has the right function and has good theoretical reference value. The macro test structure based on the MBIST controller can effectively reduce the circuit overhead. The macro test function of memory has high practical application value.
【學(xué)位授予單位】：國防科學(xué)技術(shù)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2012
【分類號】：TP333

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相關(guān)期刊論文 前3條

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