本文選題：迪文串口液晶屏 + 弱電壓放大模塊��； 參考：《科學(xué)技術(shù)與工程》2014年06期

【摘要】：針對冶金行業(yè)對半導(dǎo)體材料特性測試的要求,設(shè)計了一種基于STC單片機(micro control unit,MCU)和DMT48270T050_01W迪文串口液晶屏的在不同溫度下測量半導(dǎo)體材料電阻率和電動勢率特性的儀器,該儀器采用ADAM—3014專用弱電壓放大模塊,最低輸入電壓范圍在0~10 mV,能精確測量設(shè)計電路中各階段待測材料兩端電壓,同時設(shè)計一種階梯升溫的算法,實現(xiàn)了在一次升溫過程中在多個溫度點保持穩(wěn)定以滿足測試的要求。實驗結(jié)果表明,采用該設(shè)計能夠測得精度較高的電阻率和電動勢率,并實現(xiàn)了爐溫控制精度在±2℃。
[Abstract]:In order to meet the requirements of the metallurgical industry for testing the characteristics of semiconductor materials, an instrument for measuring the resistivity and EMF characteristics of semiconductor materials at different temperatures is designed based on micro control unit MCU (STC single chip microcomputer) and DMT48270T050_01W Devine serial port liquid crystal screen. This instrument uses ADAM-3014 special weak voltage amplifier module, the minimum input voltage range is 0 ~ 10 MV, it can accurately measure the voltage at both ends of the material to be tested in each stage of the design circuit, and at the same time, design a step warming algorithm. In order to meet the requirements of test, the stability at multiple temperature points is realized during one heating process. The experimental results show that the high precision resistivity and EMF can be obtained by this design, and the furnace temperature control accuracy is 鹵2 鈩，

本文編號：1884965