本文選題：NOR型FLASH + DSIO��； 參考：《電子與封裝》2016年03期

【摘要】：NOR型FLASH存儲器因其能夠長久地保持數(shù)據(jù)的非易失性(Non-Volatile)特點,被廣泛用作各類便攜型數(shù)字設(shè)備的存儲介質(zhì),但由于此類器件的編程及擦寫均需寫入特定指令,以啟動內(nèi)置編程/擦除算法,從而使得采用自動測試系統(tǒng)對其進行測試也具有較高難度。因此,研究NOR型FLASH存儲器的測試技術(shù),并開發(fā)此類器件的測試平臺具有十分重要的意義。首先以AMD公司的AM29LV160DT為例,介紹了NOR型FLASH存儲器的基本工作原理,接著詳細闡述了一種采用J750EX系統(tǒng)的DSIO模塊動態(tài)生成測試矢量的方法,從而能夠更為簡便、高效地對NOR型FLASH存儲器的功能進行評價。
[Abstract]:The NOR type FLASH memory is widely used as a storage medium for various portable digital devices because it can keep the data for a long time. However, the programming and erasing of these devices are required to write specific instructions. In order to start the built-in programming / erasure algorithm, it is difficult to use automatic test system to test it. Therefore, it is of great significance to study the testing technology of NOR type FLASH memory and to develop the test platform of this kind of device. Taking AM29LV160DT of AMD Company as an example, this paper introduces the basic working principle of NOR type FLASH memory, and then describes a method of dynamically generating test vector using DSIO module of J750EX system, which can be more convenient. The function of NOR type FLASH memory is evaluated efficiently.
【作者單位】： 中國電子科技集團公司第58研究所;
【分類號】：TP333

【相似文獻】

相關(guān)期刊論文 前1條

1 張登軍;;一種消除閃存芯片(NOR)擦除干擾的算法[J];微處理機;2014年01期

，

本文編號：1843032