高頻熔融-X射線熒光光譜法測定擬薄水鋁石中多種微量和痕量雜質(zhì)成分
發(fā)布時間:2018-03-02 05:38
本文關(guān)鍵詞: 高頻熔樣 X射線熒光光譜法 擬薄水鋁石 微量 痕量 雜質(zhì) 出處:《濕法冶金》2017年04期 論文類型:期刊論文
【摘要】:研究了采用高頻熔融-X射線熒光光譜法測定擬薄水鋁石中SiO_2、Fe_2O_3、Na_2O、K_2O、CaO、ZnO、TiO_2、V_2O_5、P_2O_5等微量和痕量雜質(zhì)含量。樣品以四硼酸鋰-偏硼酸鋰混合熔劑熔融,以溴化鋰為脫模劑,分別在800℃和1 000℃下加熱3min,之后在1 150℃下熔融8min,冷卻后制成玻璃片,進行測定。用與擬薄水鋁石基體及雜質(zhì)含量相近的氧化鋁和氫氧化鋁國家標(biāo)準(zhǔn)物質(zhì)繪制校準(zhǔn)曲線,在相同條件下熔融成玻璃片測定各成分熒光強度。當(dāng)雜質(zhì)質(zhì)量分?jǐn)?shù)大于0.001%時,本法測定值與ICP-AES法和AAS法測定值相近,9種雜質(zhì)成分檢出限在0.000 084%~0.005 6%之間,不同成分測定值的相對標(biāo)準(zhǔn)偏差(n=10)在0.36%~8.3%之間。
[Abstract]:The determination of trace and trace impurity contents in pseudo-boehmite by high-frequency melting X-ray fluorescence spectrometry, such as SiO2Fe2O3, Na2OTiK2OK2OK2OK, CaO2O2TiOTiO2V2O5P2O5, and so on, was studied. The samples were melted with lithium tetraboride and lithium metaborate, and lithium bromide was used as the release agent. They were heated at 800 鈩,
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