【摘要】：隨著電子芯片產(chǎn)業(yè)的迅猛發(fā)展,芯片質(zhì)量的優(yōu)劣直接影響到了產(chǎn)品性能的好壞。因而對芯片進行自動化測試的研究已經(jīng)非常必要。NRF24L01是一款常用的頻率在2.45GHz左右能進行無線收發(fā)的芯片,本文設(shè)計了一套針對該芯片的自動化測試平臺。論文首先介紹了測試平臺的意義和本文結(jié)構(gòu)安排,然后介紹了為芯片檢測提供外部溫度環(huán)境的儀器——高低溫試驗箱,以及NRF24L01射頻芯片的工作模式和本文利用測試平臺要控制的發(fā)射模式,給出了自動化測試平臺的整體設(shè)計框架。接著,論文講述了虛擬儀器的概念、虛擬儀器體系結(jié)構(gòu)、控制指令和總線技術(shù)等,基于這些原理實現(xiàn)了該測量系統(tǒng)中對頻譜儀的控制。首先為上位機界面的實現(xiàn),基于數(shù)據(jù)庫訪問技術(shù)和VISA函數(shù)的應用,設(shè)計了一款界面,該界面可以實現(xiàn)初始化頻譜儀、自動控制測試平臺和自動管理測試數(shù)據(jù)等。然后為下位機平臺的實現(xiàn),通過串口通信方式實現(xiàn)基于STM32F103芯片的測試平臺對NRF24L01射頻芯片的工作模式的設(shè)置,完成了上位機對射頻芯片的控制。測試平臺實現(xiàn)了測試系統(tǒng)的常規(guī)功能：如對測試平臺的控制,數(shù)據(jù)自動化存儲,頻譜儀的控制,波形顯示等。最后對本文設(shè)計的自動化測試平臺進行了應用測試,并基于最小二乘法,分析了溫度對輸出功率的影響,為使用者提供參考。測試結(jié)果表明：該測試平臺界面友好,操作方便,該測試平臺的設(shè)計成功,大大縮小了芯片測試的周期,提高了測試的效率,具有較好的可靠性。
[Abstract]:With the rapid development of the electronic chip industry, the quality of the chip directly affects the performance of the product. NRF24L01 is a commonly used chip which can transmit and receive wireless at 2.45GHz or so. In this paper, a set of automatic test platform for the chip is designed. This paper first introduces the significance of the test platform and the structure arrangement of this paper, and then introduces the high and low temperature test chamber, which provides the external temperature environment for the chip detection. As well as the working mode of NRF24L01 RF chip and the transmission mode to be controlled by the test platform, the overall design framework of the automated test platform is presented. Then, the paper describes the concept of virtual instrument, virtual instrument architecture, control instructions and bus technology. Based on these principles, the control of spectrum spectrometer in the measurement system is realized. Firstly, based on the database access technology and the application of VISA function, an interface is designed for the realization of upper computer interface. The interface can realize initialization spectrum spectrometer, automatic control test platform and automatic management of test data, etc. Then, for the realization of the lower computer platform, the test platform based on STM32F103 chip sets the working mode of the NRF24L01 RF chip through serial communication, and completes the control of the RF chip by the upper computer. The test platform realizes the general functions of the test system, such as the control of the test platform, the automatic storage of the data, the control of the spectrum spectrometer, the display of the waveform, and so on. Finally, the automatic test platform designed in this paper is tested, and based on the least square method, the influence of temperature on output power is analyzed, which provides a reference for users. The test results show that the test platform has friendly interface and convenient operation. The design of the test platform is successful, which greatly reduces the cycle of the chip test, improves the efficiency of the test, and has a good reliability.
【學位授予單位】：蘇州大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN407

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