【摘要】：高分辨透射電鏡已成為一項常規(guī)實驗儀器,對大多數(shù)高分辨照片而言,不經(jīng)過圖像的模擬,對原子尺度的晶體結(jié)構(gòu)和各種微觀缺陷很難得出科學(xué)的、準確的、令人信服的結(jié)果。筆者在VC++6.0軟件平臺上根據(jù)多層法原理,編制了可商品化的中文界面高分辨像模擬軟件,有助于電鏡工作者更好地利用透射電鏡進行高分辨研究工作。
[Abstract]:High-resolution transmission electron microscopy (HREM) has become a conventional experimental instrument. For most high-resolution photographs, it is difficult to obtain scientific, accurate and convincing results for atomic-scale crystal structure and various micro-defects without image simulation. According to the principle of multi-layer method, a commercial Chinese interface high-resolution image simulation software is developed on the platform of VC 6.0.This software is helpful for electron microscope workers to make better use of transmission electron microscope for high-resolution research.
【作者單位】： 東北大學(xué)新材料技術(shù)研究院分析測試中心;
【分類號】：TN16
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本文編號：2438022