基于多維特征的典型電子電路故障診斷技術(shù)研究
發(fā)布時(shí)間：2018-11-24 21:10
【摘要】：隨著系統(tǒng)集成化程度的高速發(fā)展,國防軍事等關(guān)鍵領(lǐng)域內(nèi)電子系統(tǒng)的功能愈加完善,同時(shí)也帶來了系統(tǒng)中電路模塊可及測點(diǎn)少、電路信息獲取困難、測試激勵(lì)難以施加、故障檢測率低等問題。因此必須深入研究典型電子電路的故障診斷技術(shù),利用盡量少的測點(diǎn)提取盡可能多的故障特征信息,提高系統(tǒng)的可靠性,實(shí)現(xiàn)系統(tǒng)故障及時(shí)準(zhǔn)確的定位。本文在分析典型電子電路結(jié)構(gòu)特性的基礎(chǔ)上,開展基于多維特征的故障診斷技術(shù)的研究,進(jìn)行多維故障特征的構(gòu)造與融合,優(yōu)化電路可測性設(shè)計(jì),提高系統(tǒng)故障診斷率。主要研究內(nèi)容如下:首先,研究基于多維特征的故障診斷算法。通過單一測點(diǎn)提取表征電路特性的多維故障特征,解決集成電路測點(diǎn)少、單一電壓信號信息含量少的問題;對多維故障特征進(jìn)行相關(guān)性分析,提取表征信號特征的主成分,簡化算法的計(jì)算復(fù)雜度;對電路進(jìn)行容差分析和裕度設(shè)定,從而識別并排除器件容差、外界環(huán)境等對電路特征的影響。其次,對典型電子電路進(jìn)行原理和故障特性分析,根據(jù)電路輸出響應(yīng)的特點(diǎn),應(yīng)用基于多維特征的故障診斷算法,對電路進(jìn)行故障特征提取與優(yōu)化,建立故障-特征依賴矩陣,縮短實(shí)際故障診斷時(shí)間。計(jì)算典型電子電路的故障診斷指標(biāo),驗(yàn)證算法的實(shí)用性和有效性。再次,設(shè)計(jì)典型電子電路故障診斷系統(tǒng)。設(shè)計(jì)系統(tǒng)上位機(jī)和下位機(jī),實(shí)現(xiàn)用戶流程可控化、故障診斷過程可視化和自動化的設(shè)計(jì);通過劃分系統(tǒng)級和模塊級兩個(gè)故障診斷模式,實(shí)現(xiàn)系統(tǒng)故障快速定位;對系統(tǒng)各模塊進(jìn)行聯(lián)調(diào),保證系統(tǒng)功能的完備性。最后,搭建電子電路典型應(yīng)用系統(tǒng),應(yīng)用層次化的可測性建模方法,評估系統(tǒng)可測性設(shè)計(jì),完成典型電子電路的故障診斷實(shí)物驗(yàn)證。實(shí)驗(yàn)結(jié)果表明,本文提出的基于多維特征的故障診斷技術(shù)能夠及時(shí)、準(zhǔn)確的完成電路故障診斷功能。
[Abstract]:With the rapid development of system integration, the functions of electronic systems in key fields such as national defense and military are becoming more and more perfect. At the same time, it brings less circuit modules and measuring points, difficulty in obtaining circuit information, and difficult to apply test incentives. Problems such as low fault detection rate. Therefore, it is necessary to deeply study the fault diagnosis technology of typical electronic circuits, extract as many fault feature information as possible by using as few measuring points as possible, improve the reliability of the system, and realize the timely and accurate location of the system faults. On the basis of analyzing the structural characteristics of typical electronic circuits, this paper studies the fault diagnosis technology based on multidimensional features, constructs and merges multi-dimensional fault features, optimizes the design of circuit testability, and improves the fault diagnosis rate of the system. The main research contents are as follows: firstly, the fault diagnosis algorithm based on multidimensional features is studied. In order to solve the problem of less measuring points and less information content of single voltage signal, the multi-dimension fault features characterized by the characteristics of the circuit are extracted by a single measuring point. The correlation analysis of multi-dimension fault features is carried out to extract the principal components representing the signal features and simplify the computational complexity of the algorithm. The tolerance analysis and margin setting of the circuit are carried out to identify and eliminate the effects of device tolerance and external environment on the characteristics of the circuit. Secondly, the principle and fault characteristics of typical electronic circuits are analyzed. According to the characteristics of output response, fault diagnosis algorithm based on multidimensional features is applied to extract and optimize the fault features of the circuit, and the fault feature dependence matrix is established. Shorten the time of actual fault diagnosis. The fault diagnosis indexes of typical electronic circuits are calculated to verify the practicability and validity of the algorithm. Thirdly, a typical electronic circuit fault diagnosis system is designed. The design of the upper computer and the lower computer of the system realizes the design of the user flow controllable, the visualization and automation of the fault diagnosis process, and realizes the fast location of the system fault by dividing the system level and module level into two fault diagnosis modes. All modules of the system are combined and adjusted to ensure the completeness of the system functions. Finally, the typical electronic circuit application system is built, and the hierarchical testability modeling method is applied to evaluate the testability design of the system, and the physical verification of fault diagnosis of typical electronic circuit is completed. The experimental results show that the proposed fault diagnosis technology based on multidimensional features can complete the circuit fault diagnosis function in time and accurately.
【學(xué)位授予單位】：哈爾濱工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN710
本文編號：2355069
[Abstract]:With the rapid development of system integration, the functions of electronic systems in key fields such as national defense and military are becoming more and more perfect. At the same time, it brings less circuit modules and measuring points, difficulty in obtaining circuit information, and difficult to apply test incentives. Problems such as low fault detection rate. Therefore, it is necessary to deeply study the fault diagnosis technology of typical electronic circuits, extract as many fault feature information as possible by using as few measuring points as possible, improve the reliability of the system, and realize the timely and accurate location of the system faults. On the basis of analyzing the structural characteristics of typical electronic circuits, this paper studies the fault diagnosis technology based on multidimensional features, constructs and merges multi-dimensional fault features, optimizes the design of circuit testability, and improves the fault diagnosis rate of the system. The main research contents are as follows: firstly, the fault diagnosis algorithm based on multidimensional features is studied. In order to solve the problem of less measuring points and less information content of single voltage signal, the multi-dimension fault features characterized by the characteristics of the circuit are extracted by a single measuring point. The correlation analysis of multi-dimension fault features is carried out to extract the principal components representing the signal features and simplify the computational complexity of the algorithm. The tolerance analysis and margin setting of the circuit are carried out to identify and eliminate the effects of device tolerance and external environment on the characteristics of the circuit. Secondly, the principle and fault characteristics of typical electronic circuits are analyzed. According to the characteristics of output response, fault diagnosis algorithm based on multidimensional features is applied to extract and optimize the fault features of the circuit, and the fault feature dependence matrix is established. Shorten the time of actual fault diagnosis. The fault diagnosis indexes of typical electronic circuits are calculated to verify the practicability and validity of the algorithm. Thirdly, a typical electronic circuit fault diagnosis system is designed. The design of the upper computer and the lower computer of the system realizes the design of the user flow controllable, the visualization and automation of the fault diagnosis process, and realizes the fast location of the system fault by dividing the system level and module level into two fault diagnosis modes. All modules of the system are combined and adjusted to ensure the completeness of the system functions. Finally, the typical electronic circuit application system is built, and the hierarchical testability modeling method is applied to evaluate the testability design of the system, and the physical verification of fault diagnosis of typical electronic circuit is completed. The experimental results show that the proposed fault diagnosis technology based on multidimensional features can complete the circuit fault diagnosis function in time and accurately.
【學(xué)位授予單位】：哈爾濱工業(yè)大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN710
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