【摘要】：隨著晶體管特征尺寸的減小,負(fù)偏壓溫度不穩(wěn)定性(negative bias temperature instability,NBTI)已經(jīng)成為影響電路老化的關(guān)鍵因素,準(zhǔn)確地衡量老化程度是抗老化設(shè)計(jì)前提條件。通過對(duì)NBTI效應(yīng)和老化監(jiān)測原理的研究,提出一種數(shù)字型高精度老化監(jiān)測電路方案。首先,利用兩個(gè)結(jié)構(gòu)相同的壓控振蕩器(voltage controlled oscillator,VCO)產(chǎn)生基準(zhǔn)頻率f0和老化頻率fx;然后,采用等精度測量將老化頻率與基準(zhǔn)頻率進(jìn)行對(duì)比,結(jié)合放大因子等方法降低截?cái)嗾`差,達(dá)到高精度監(jiān)測的目的。實(shí)驗(yàn)結(jié)果表明,在1.2 V電源電壓27℃下監(jiān)測電路的精度可達(dá)到0.02%。
[Abstract]:With the reduction of the characteristic size of transistors, the negative bias temperature instability (negative bias temperature instability,NBTI) has become the key factor to affect the aging of the circuit. The accurate measurement of the aging degree is the precondition of anti-aging design. Based on the study of NBTI effect and aging monitoring principle, a digital high precision aging monitoring circuit is proposed. First, two voltage-controlled oscillator (voltage controlled oscillator,VCO) with the same structure are used to generate the reference frequency f _ 0 and the aging frequency fx;. Then, the aging frequency is compared with the reference frequency by the equal precision measurement, and the truncation error is reduced by combining the amplification factor and other methods. To achieve the purpose of high precision monitoring. The experimental results show that the precision of the monitoring circuit can reach 0.02 鈩，

本文編號(hào)：2285028