一種紅外焦平面陣列相對(duì)光譜響應(yīng)自動(dòng)測(cè)試系統(tǒng)
發(fā)布時(shí)間:2018-10-20 16:52
【摘要】:目前測(cè)試紅外焦平面陣列相對(duì)光譜響應(yīng)參數(shù)時(shí),需要人工測(cè)量波段中每個(gè)波長(zhǎng)點(diǎn)的光譜響應(yīng),針對(duì)測(cè)試過(guò)程繁瑣和測(cè)試時(shí)間長(zhǎng)的問(wèn)題,在基于現(xiàn)有的不同開發(fā)平臺(tái)開發(fā)的單色儀和數(shù)據(jù)采集系統(tǒng)的基礎(chǔ)上,利用動(dòng)態(tài)鏈接庫(kù)技術(shù),研制了一種紅外焦平面陣列相對(duì)光譜響應(yīng)自動(dòng)測(cè)試系統(tǒng),該系統(tǒng)測(cè)試過(guò)程簡(jiǎn)化,自動(dòng)化程度提高。經(jīng)過(guò)對(duì)比分析,自動(dòng)測(cè)試與人工測(cè)試結(jié)果具有較好的一致性,自動(dòng)測(cè)試比人工測(cè)試更加可靠。
[Abstract]:At present, when measuring the relative spectral response parameters of infrared focal plane arrays, it is necessary to manually measure the spectral response of each wavelength point in the wave band. Based on the development of Monochromator and data acquisition system based on different development platforms, an automatic measurement system for relative spectral response of infrared focal plane array is developed by using dynamic link library technology. The test process of the system is simplified. The degree of automation is improved. Through comparison and analysis, the results of automatic test and manual test are consistent, and automatic test is more reliable than manual test.
【作者單位】: 中國(guó)電子科技集團(tuán)公司第四十一研究所電子測(cè)試技術(shù)重點(diǎn)實(shí)驗(yàn)室;
【分類號(hào)】:TN215
本文編號(hào):2283778
[Abstract]:At present, when measuring the relative spectral response parameters of infrared focal plane arrays, it is necessary to manually measure the spectral response of each wavelength point in the wave band. Based on the development of Monochromator and data acquisition system based on different development platforms, an automatic measurement system for relative spectral response of infrared focal plane array is developed by using dynamic link library technology. The test process of the system is simplified. The degree of automation is improved. Through comparison and analysis, the results of automatic test and manual test are consistent, and automatic test is more reliable than manual test.
【作者單位】: 中國(guó)電子科技集團(tuán)公司第四十一研究所電子測(cè)試技術(shù)重點(diǎn)實(shí)驗(yàn)室;
【分類號(hào)】:TN215
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