電路工作模式下惰性節(jié)點(diǎn)的確定
發(fā)布時(shí)間：2018-08-16 09:16
【摘要】：集成電路設(shè)計(jì)和制造的全球化趨勢(shì)使得木馬電路可以在集成電路設(shè)計(jì)制造的任何階段被插入,這引發(fā)了對(duì)硬件安全的廣泛關(guān)注.從防御者的角度出發(fā),木馬電路在宿主電路使用過(guò)程中絕大多數(shù)時(shí)間是靜默無(wú)害的,但是一旦被激活就會(huì)造成如信息泄露、功能異常或系統(tǒng)崩潰等嚴(yán)重危害;從攻擊者的角度出發(fā),避免木馬電路被"誤觸發(fā)"是其最重要的一個(gè)設(shè)計(jì)目標(biāo)之一.普遍認(rèn)為,電路中那些具有較低狀態(tài)翻轉(zhuǎn)概率的惰性節(jié)點(diǎn)最有可能成為木馬電路的插入點(diǎn).因此目前檢測(cè)的主要手段之一是試圖尋找到這些惰性點(diǎn),以便有針對(duì)性地嘗試以激活木馬電路.然而,目前的方法僅專注于尋找被測(cè)電路在測(cè)試模式下的惰性點(diǎn).提出了一種尋找被測(cè)電路在工作模式下的惰性點(diǎn)的方法.從攻擊者的角度出發(fā),兩者的交集將是木馬電路的最佳插入點(diǎn)——可以較好地避免其插入的木馬電路在宿主電路的測(cè)試階段以及試運(yùn)行階段被"誤觸發(fā)".因此從防御者的角度出發(fā),找到測(cè)試模式和工作模式下共有的惰性節(jié)點(diǎn)并對(duì)其進(jìn)行檢測(cè),有助于有效提高檢測(cè)效率.
[Abstract]:The globalization of integrated circuit design and manufacture makes Trojan circuit can be inserted at any stage of IC design and manufacture, which has aroused widespread concern about hardware security. From the point of view of the defender, the Trojan circuit is silent and harmless in the course of the host circuit use, but once activated, it will cause serious harm such as information leakage, abnormal function or system collapse. From the point of view of the attacker, one of the most important design goals is to avoid the misfiring of Trojan circuit. It is generally believed that those inert nodes with lower state turnover probability are most likely to be the insertion point of Trojan circuit. Therefore, one of the main methods of detection is to try to find these inert points in order to activate Trojan circuit. However, the current method only focuses on finding the lazy point of the circuit under test mode. This paper presents a method to find the inert point of the circuit under operation mode. From the point of view of the attacker, the intersection of the two will be the best insertion point of the Trojan circuit, which can avoid the misfiring of the Trojan circuit in the test stage and the trial stage of the host circuit. Therefore, from the point of view of the defender, finding and detecting the common inert nodes in test mode and working mode is helpful to improve the efficiency of detection.
【作者單位】： 重慶大學(xué)計(jì)算機(jī)學(xué)院;信息物理社會(huì)可信服務(wù)計(jì)算教育部重點(diǎn)實(shí)驗(yàn)室(重慶大學(xué));
【基金】：國(guó)家自然科學(xué)基金項(xiàng)目(61472052) 國(guó)家“八六三”高技術(shù)研究發(fā)展計(jì)劃基金項(xiàng)目(2015AA015304,2013AA013202)~~
【分類號(hào)】：TN407
，
本文編號(hào)：2185548
[Abstract]:The globalization of integrated circuit design and manufacture makes Trojan circuit can be inserted at any stage of IC design and manufacture, which has aroused widespread concern about hardware security. From the point of view of the defender, the Trojan circuit is silent and harmless in the course of the host circuit use, but once activated, it will cause serious harm such as information leakage, abnormal function or system collapse. From the point of view of the attacker, one of the most important design goals is to avoid the misfiring of Trojan circuit. It is generally believed that those inert nodes with lower state turnover probability are most likely to be the insertion point of Trojan circuit. Therefore, one of the main methods of detection is to try to find these inert points in order to activate Trojan circuit. However, the current method only focuses on finding the lazy point of the circuit under test mode. This paper presents a method to find the inert point of the circuit under operation mode. From the point of view of the attacker, the intersection of the two will be the best insertion point of the Trojan circuit, which can avoid the misfiring of the Trojan circuit in the test stage and the trial stage of the host circuit. Therefore, from the point of view of the defender, finding and detecting the common inert nodes in test mode and working mode is helpful to improve the efficiency of detection.
【作者單位】： 重慶大學(xué)計(jì)算機(jī)學(xué)院;信息物理社會(huì)可信服務(wù)計(jì)算教育部重點(diǎn)實(shí)驗(yàn)室(重慶大學(xué));
【基金】：國(guó)家自然科學(xué)基金項(xiàng)目(61472052) 國(guó)家“八六三”高技術(shù)研究發(fā)展計(jì)劃基金項(xiàng)目(2015AA015304,2013AA013202)~~
【分類號(hào)】：TN407
，
本文編號(hào)：2185548
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