【摘要】：為了評估星載相控陣T/R組件的電性能、溫度傳感器及通道一致性溫度補償功能和抗單粒子效應能力,本文針對星載X波段T/R組件中一款自主研發(fā)的CMOS多功能控制芯片,設計開發(fā)了一套基于PXI總線的綜合測試系統(tǒng)。系統(tǒng)采用高速數(shù)字I/O技術,提高了芯片電性能測試速度;同時系統(tǒng)具備高精度自動溫度測試功能,能夠精確評估芯片溫度傳感器性能;另外系統(tǒng)集成了單粒子效應測試功能,能夠?qū)崟r監(jiān)測并記錄芯片試驗過程中參數(shù)變化情況,同時具備數(shù)據(jù)自動處理功能,能夠完成芯片電性能測試數(shù)據(jù)和設計指標的比對、溫度測試數(shù)據(jù)和標定溫度的誤差分析以及單粒子效應試驗前后數(shù)據(jù)變化量統(tǒng)計。最后采用本系統(tǒng)對芯片電性能、溫度傳感器、溫度補償和抗單粒子效應能力進行了實測分析,測試結(jié)果表明該芯片功能正常、性能良好,可用于溫度劇烈變化和充滿空間輻射的航天環(huán)境,同時測試系統(tǒng)具備操作簡單、可移植性好、測試速度快和測試精度高等優(yōu)勢。
[Abstract]:In order to evaluate the electrical performance of spaceborne phased array T / R module, the temperature compensation function of temperature sensor and channel consistency, and the ability to resist single particle effect, this paper focuses on a self-developed CMOS multifunctional control chip in spaceborne X band T / R module. A comprehensive test system based on PXI bus is designed and developed. The system adopts high-speed digital I / O technology to improve the testing speed of the chip's electrical performance. At the same time, the system has the function of high precision automatic temperature measurement, which can accurately evaluate the performance of the chip's temperature sensor. In addition, the system integrates the function of single particle effect test. It can monitor and record the change of parameters in the process of chip test in real time, at the same time, it has the function of automatic data processing, and can complete the comparison between the test data and the design index of the chip electrical performance. Error analysis of temperature test data and calibration temperature and statistics of data change before and after single particle effect test. Finally, the electrical performance, temperature sensor, temperature compensation and anti-single particle effect ability of the chip are measured and analyzed by the system. The test results show that the chip has normal function and good performance. It can be used in spaceflight environment with drastic change of temperature and full of space radiation. At the same time, the test system has the advantages of simple operation, good portability, high test speed and high precision.
【學位授予單位】：浙江大學
【學位級別】：碩士
【學位授予年份】：2017
【分類號】：TP274;TN407

【參考文獻】

相關期刊論文 前5條

1 劉童;陳華;邱僅朋;王志宇;劉小敏;王立平;郁發(fā)新;;星載溫度傳感控制芯片的自動測試系統(tǒng)[J];傳感技術學報;2016年09期

2 李聰;代后兆;張亞寧;黃明鍵;;一種新型低成本高精度熱電阻測溫模塊的研制[J];電子測量與儀器學報;2013年06期

3 陳立;潘誼春;鄭凱;;相控陣雷達的發(fā)展[J];艦船電子工程;2009年05期

4 李桃生;陳軍;王志強;;空間輻射環(huán)境概述[J];輻射防護通訊;2008年02期

5 丁義剛;;空間輻射環(huán)境單粒子效應研究[J];航天器環(huán)境工程;2007年05期

，

本文編號：2129070