本文選題：VDMOS + 傳輸線脈沖發(fā)生器��； 參考：《華北電力大學(xué)(北京)》2017年碩士論文

【摘要】：作為功率開關(guān),VDMOS器件以其高開關(guān)速度、高耐壓、低導(dǎo)通電阻、寬安全工作區(qū)以及很好的熱穩(wěn)定性等特點(diǎn),在電力電子的應(yīng)用中占有舉足輕重的作用,然而問題是功率VDMOS器件其特殊的內(nèi)部結(jié)構(gòu),靜電或相關(guān)的電壓瞬變等外部環(huán)境可能會(huì)形成閂鎖效應(yīng)(latch-up),導(dǎo)致電路失效,甚至燒毀芯片。大量研究工作表明,功率集成電路的現(xiàn)場(chǎng)失效很多都表現(xiàn)為閂鎖效應(yīng)引起的過電應(yīng)力失效,這嚴(yán)重妨礙了我國(guó)民用、軍用電子設(shè)備可靠性的提高。目前功率器件電學(xué)閂鎖效應(yīng)的研究工作一直難以開展,其根本原因在于測(cè)試手段的缺乏。150A傳輸線脈沖發(fā)生器(150A Transmission Line Pulse,150A TLP)是一種間接測(cè)試功率器件電學(xué)閂鎖效應(yīng)的新的研究方向,可以在高壓失效前產(chǎn)生更少的熱量,實(shí)現(xiàn)“冷觸發(fā)”,進(jìn)而測(cè)試VDMOS等功率器件承受脈沖時(shí)的最大關(guān)態(tài)擊穿閂鎖觸發(fā)電流等參數(shù),判斷器件抗閂鎖特性防護(hù)技術(shù)的有效性,節(jié)約了器件研制成本,針對(duì)上述問題開展了對(duì)150A傳輸線脈沖發(fā)生器的研究開發(fā)工作,具體如下:(1)深入研究了TLP測(cè)試系統(tǒng)和150A TLP測(cè)試系統(tǒng)機(jī)制和特點(diǎn),提出了150A TLP的硬件實(shí)現(xiàn)方法,開發(fā)了低阻抗傳輸線,提升了終端極化器、繼電器等的耐壓值,為解決系統(tǒng)過沖或振蕩問題,開發(fā)了先進(jìn)的大功率濾波結(jié)構(gòu),利用繼電器的二級(jí)驅(qū)動(dòng)模式,實(shí)現(xiàn)了150A TLP自動(dòng)化測(cè)試系統(tǒng);(2)使用搭建的150A TLP測(cè)試系統(tǒng),完成了對(duì)系統(tǒng)高壓源開關(guān)時(shí)間的探測(cè)以及充電電壓的校準(zhǔn),得出了系統(tǒng)輸出波形,驗(yàn)證了系統(tǒng)各項(xiàng)參數(shù)是否達(dá)到預(yù)期指標(biāo),為后續(xù)程序控制創(chuàng)造有利條件;(3)根據(jù)測(cè)試系統(tǒng)個(gè)性化定制軟件需求分析,設(shè)計(jì)了系統(tǒng)功能模塊以及實(shí)現(xiàn)流程圖,借助于圖形化編程軟件LabVIEW分別完成了對(duì)底層驅(qū)動(dòng)、中層功能以及高層用戶界面程序的編寫與設(shè)計(jì)工作,實(shí)現(xiàn)了150A TLP測(cè)試系統(tǒng)的自動(dòng)化運(yùn)行;(4)通過150A TLP自動(dòng)化測(cè)試系統(tǒng)應(yīng)用實(shí)驗(yàn),表明該系統(tǒng)運(yùn)行穩(wěn)定,測(cè)試誤差小,可以精確測(cè)試出器件閂鎖電流,評(píng)估器件抗閂鎖性能的優(yōu)劣,通過高可靠芯片抗閂鎖能力篩選測(cè)試,有效衡量出不同產(chǎn)品的抗閂鎖能力,同時(shí)利用150A TLP還可以測(cè)試不同柵壓對(duì)功率器件性能的影響,為超快大功率VDMOS器件可靠性測(cè)試提供了檢測(cè)手段,保障了大功率器件抗閂鎖性能的進(jìn)一步研究。
[Abstract]:As a power switch VDMOS device, with its high switching speed, high voltage, low on-resistance, wide safe working area and good thermal stability, it plays an important role in the application of power electronics. However, the problem is that the special internal structure of power VDMOS devices, electrostatic or related voltage transients and other external environment may form a latch effect (latch-up), resulting in circuit failure, or even destroyed the chip. A large number of researches show that many of the field failures of power integrated circuits are caused by the latch effect, which seriously hinders the improvement of the reliability of civil and military electronic equipment in China. At present, the research work on the electrical latch effect of power devices has been difficult to carry out. The fundamental reason lies in the lack of testing means. 150A Transmission Line Pulse Generator (150A Transmission Line Pulsetrain 150A TLP) is a new research direction for indirectly testing the electrical latch effect of power devices. It can produce less heat before high-voltage failure, realize "cold trigger", and then test the parameters such as maximum on-off latch trigger current when VDMOS and other power devices are subjected to pulse, and judge the effectiveness of the anti-latch characteristic protection technology of the device. The research and development work of 150A transmission line pulse generator is carried out in view of the above problems. The main contents are as follows: (1) the mechanism and characteristics of TLP test system and 150A TLP test system are deeply studied. The hardware realization method of 150A TLP is presented, the low impedance transmission line is developed, the voltage value of the terminal polarizer and relay is raised, and the advanced high power filter structure is developed to solve the problem of overshoot or oscillation of the system. The 150A TLP automatic test system is realized by using the two-stage driving mode of the relay. (2) the 150 A TLP test system is used to detect the switching time of the high voltage source of the system and calibrate the charging voltage, and the output waveform of the system is obtained. It verifies whether the parameters of the system reach the expected targets and creates favorable conditions for the subsequent program control. (3) according to the requirement analysis of customized software of the test system, the function module and the flow chart of the system are designed. With the help of the graphical programming software LabVIEW, the programming and designing of the bottom driver, middle function and high-level user interface program are completed, and the automatic operation of the 150A TLP test system is realized. (4) the application experiment of the 150A TLP automatic test system is carried out. The results show that the system is stable in operation and small in error. It can accurately measure the latch current of the device, evaluate the advantages and disadvantages of the anti-latch performance of the device, and effectively measure the anti-latch ability of different products by screening and testing the anti-latch ability of the high reliability chip. At the same time, 150A TLP can also be used to test the influence of different gate voltages on the performance of power devices, which provides a means for reliability testing of ultra-fast and high-power VDMOS devices and ensures further research on the anti-latch performance of high-power devices.
【學(xué)位授予單位】：華北電力大學(xué)(北京)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2017
【分類號(hào)】：TN782

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