本文選題：紅外焦平面陣列 + 測試方法��； 參考：《中國科學(xué)院大學(xué)（工程管理與信息技術(shù)學(xué)院）》2015年碩士論文

【摘要】：紅外探測技術(shù)在軍事民用領(lǐng)域應(yīng)用越來越廣泛,紅外焦平面陣列是探測器系統(tǒng)的核心器件,對其關(guān)鍵參數(shù)測試技術(shù)的研究需求也越來越迫切。紅外焦平面陣列由大量敏感像元構(gòu)成,像元參數(shù)與探測器系統(tǒng)整體性能密切相關(guān)。目前紅外焦平面陣列的測試工作主要集中在系統(tǒng)級參數(shù)測試部分,對像元級參數(shù)測試的研究較少且大多處于理論分析層面,因此關(guān)于紅外焦平面陣列像元級參數(shù)測試方法的研究急需加強。 論文所做的工作包括： (1)論文對目前紅外焦平面陣列測試技術(shù)國內(nèi)外研究現(xiàn)狀進行分析,詳細闡述了像元級參數(shù)與系統(tǒng)性能之間的關(guān)系,明確了像元級參數(shù)測試的意義。 (2)論文系統(tǒng)地研究了紅外焦平面陣列敏感像元熱學(xué)參數(shù)與噪聲參數(shù)的工程性測試方法,采用電學(xué)功率測試法以及惠斯通電橋法測試敏感像元熱導(dǎo)參數(shù)與熱時間常數(shù),并基于虛擬儀器技術(shù)進行像元噪聲參數(shù)測試,解決了已有技術(shù)測試流程繁瑣、測試精度不足的問題。論文詳細介紹了各參數(shù)的物理意義,通過理論計算與建模仿真得到可供測試參考的理論數(shù)值；分別對各參數(shù)進行樣品性能測試與數(shù)據(jù)分析,并對所測像元級參數(shù)進行推導(dǎo)得到能夠反映系統(tǒng)性能的響應(yīng)率參數(shù),實現(xiàn)對探測器系統(tǒng)性能的預(yù)估。 (3)在完成像元級參數(shù)測試方法研究的基礎(chǔ)上,論文驗證了此類方法在工程應(yīng)用中的可行性。論文基于本領(lǐng)域成熟的系統(tǒng)級參數(shù)評判標(biāo)準(zhǔn),對實驗樣品所組成的探測器系統(tǒng)進行系統(tǒng)級響應(yīng)率、噪聲參數(shù)測試,并將測試結(jié)果與像元級測試推導(dǎo)結(jié)果進行對比,從而完成對像元級參數(shù)測試方法可行性的分析驗證工作。 經(jīng)驗證分析,本論文所研究的像元級參數(shù)測試方法能夠滿足產(chǎn)品研發(fā)階段分析測試要求,對產(chǎn)品設(shè)計優(yōu)化具有指導(dǎo)意義,并能夠為工藝開發(fā)提供數(shù)值參考,實時修正產(chǎn)品設(shè)計與制造工藝之間的偏差,從而縮短產(chǎn)品研發(fā)周期,為提升產(chǎn)品性能、優(yōu)化產(chǎn)品設(shè)計提供及時有效的測試數(shù)據(jù)支持。
[Abstract]:Infrared detection technology is more and more widely used in military and civilian fields. Infrared focal plane array (IRFPA) is the core device of detector system. The infrared focal plane array consists of a large number of sensitive pixels. The pixel parameters are closely related to the overall performance of the detector system. At present, the testing work of infrared focal plane array is mainly focused on the system level parameter testing, and the research on pixel level parameter testing is less and most of them are in the theoretical analysis level. Therefore, the research on the pixel level parameters measurement of infrared focal plane arrays needs to be strengthened. The main contents of this paper are as follows: (1) the research status of infrared focal plane array (IRFPA) testing technology at home and abroad is analyzed, and the relationship between pixel level parameters and system performance is described in detail. The significance of pixel level parameter testing is clarified. (2) the engineering testing methods of infrared focal plane array sensitive pixel thermal parameters and noise parameters are systematically studied in this paper. The thermal conductivity parameters and thermal time constants of sensitive pixels are measured by using electrical power test method and Wheatstone bridge method, and the pixel noise parameters are measured based on virtual instrument technology. The problem of insufficient precision of the test. In this paper, the physical meaning of each parameter is introduced in detail, the theoretical values can be obtained by theoretical calculation and modeling and simulation, and the performance test and data analysis of each parameter are carried out respectively. Based on the derivation of the pixel level parameters, the response rate parameters which can reflect the system performance are obtained, and the performance of the detector system is predicted. (3) on the basis of the research of the pixel level parameter testing method, The paper verifies the feasibility of this method in engineering application. Based on the system level parameter evaluation standard, the system level response rate and noise parameter of the detector system composed of experimental samples are tested, and the test results are compared with the pixel level test results. Thus, the feasibility of pixel level parameter testing method is analyzed and verified. After verification and analysis, the pixel level parameter testing method studied in this paper can meet the requirements of product development stage analysis and test, and has guiding significance for product design optimization, and can provide a numerical reference for process development. The deviation between product design and manufacturing process can be corrected in real time so as to shorten the product R & D cycle and provide timely and effective test data support for improving product performance and optimizing product design.
【學(xué)位授予單位】：中國科學(xué)院大學(xué)（工程管理與信息技術(shù)學(xué)院）
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN215

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