本文選題：單粒子翻轉(zhuǎn) + 軟錯(cuò)誤��； 參考：《西安電子科技大學(xué)》2015年碩士論文

【摘要】：基于SRAM結(jié)構(gòu)的FPGA(SRAM-based FPGA),自從問世以來一直不斷向大規(guī)模,高密度,低功耗方面發(fā)展,已達(dá)到Virtex-7系列的千萬門規(guī)模,憑借這些優(yōu)勢,SRAM型FPGA在星載設(shè)備方面?zhèn)涫苋藗冴P(guān)注;但其FPGA的邏輯門電路都是動態(tài)加載到SRAM中,其中配置位占FPGA存儲單元的比重在99%以上;在輻射環(huán)境下,相比于ASIC、基于反熔絲結(jié)構(gòu)的FPGA等,SRAM型FPGA更容易受到單粒子效應(yīng),尤其是單粒子翻轉(zhuǎn)效應(yīng)(single-event upset,SEU)的影響。如何提高設(shè)備的抗單粒子翻轉(zhuǎn)可靠性已經(jīng)成為SRAM-based FPGA系統(tǒng)設(shè)計(jì)時(shí)必須重點(diǎn)考慮的問題。本文通過對常見防護(hù)方法的防護(hù)效果、代價(jià)進(jìn)行建模、理論分析、數(shù)據(jù)分析,進(jìn)而期望為工程實(shí)踐中防護(hù)方法的選擇提供參考。主要工作分為如下三個(gè)方面:1、將空間高能粒子對器件輻射抽象為泊松過程,在此基礎(chǔ)上對常用的抗單粒子翻轉(zhuǎn)防護(hù)方法:三模冗余防護(hù)方法、周期刷新防護(hù)方法以及漢明碼防護(hù)方法,在理論上推導(dǎo)分析,并對防護(hù)前、后抗單粒子翻轉(zhuǎn)可靠性進(jìn)行定性對比分析。2、針對整個(gè)FPGA工程采用某種單一的防護(hù)方法進(jìn)行防護(hù),代價(jià)過大,于是對其按照一定規(guī)則劃分為可以獨(dú)立綜合映射模塊,分析各個(gè)模塊的抗單粒子翻轉(zhuǎn)可靠性,對易出錯(cuò)模塊進(jìn)行防護(hù),以達(dá)到用最小的代價(jià)換取性能最大限度提升。所以,對FPGA工程按照一定規(guī)則劃分為模塊,針對于模塊實(shí)現(xiàn)以下5種防護(hù)方法:基于模塊的三模冗余防護(hù)方法;以犧牲速度為代價(jià)提高可靠性的基于模塊的時(shí)間冗余防護(hù)方法;等時(shí)間間隔對FPGA重新擦寫的周期刷新防護(hù)方法;將周期刷新和三模冗余結(jié)合在一起提升可靠性的基于模塊刷新三模冗余防護(hù)方法;針對于BRAM進(jìn)行防護(hù)的漢明碼防護(hù)方法。3、對這些防護(hù)方法進(jìn)行性能方面定量分析,結(jié)合FPGA的特性,從面積、速度、功耗三方面分析防護(hù)帶來的代價(jià)。分析XC4VSX55型FPGA實(shí)驗(yàn)數(shù)據(jù),與理論模型預(yù)估結(jié)果基本一致。可以為工程應(yīng)用中防護(hù)方法的選擇提供參考。
[Abstract]:SRAM-based FPGA (SRAM-based FPGA) has been developing to large scale, high density and low power consumption since its inception. It has reached the scale of tens of millions of Virtex-7 series. With these advantages, SRAM FPGA has attracted much attention in space-borne devices. But the logic gates of FPGA are loaded into SRAM dynamically, in which the proportion of configuration bit is more than 99% of the memory cell of FPGA. In radiation environment, compared with ASIC-based FPGA, FPGA based on anti-fuse structure is more vulnerable to single particle effect. In particular, the effect of single particle reversal (single-event upset SEU). How to improve the reliability of SRAM-based FPGA has become an important problem in the design of SRAM-based FPGA system. Through modeling, theoretical analysis and data analysis of the protection effect and cost of common protection methods, this paper hopes to provide a reference for the selection of protection methods in engineering practice. The main work is divided into the following three aspects: 1, abstracting the radiation of space high-energy particles to the Poisson process. Based on this, the common anti-single-particle inversion protection method: the three-mode redundancy protection method, is proposed. The periodic refresh protection method and the hamming code protection method are deduced and analyzed in theory, and the reliability of anti-single particle inversion before and after protection is qualitatively compared and analyzed .2. a single protection method is adopted to protect the whole FPGA project. The cost is too high, so it can be divided into independent integrated mapping modules according to certain rules. The reliability of each module can be analyzed, and the error-prone module can be protected in order to achieve the minimum cost in exchange for maximum performance improvement. Therefore, the FPGA project is divided into modules according to certain rules, and the following five protection methods are implemented for the modules: three mode redundancy protection methods based on modules, time redundancy protection methods based on modules at the expense of sacrificing speed, and time redundancy protection methods based on modules at the expense of sacrificing speed. A periodic refresh protection method for rewriting FPGA at equal intervals; a modular refreshed three-mode redundancy protection method which combines periodic refresh and trimode redundancy to enhance reliability; Aiming at the hamming code protection method. 3, the performance of these protection methods is analyzed quantitatively, and the cost of protection is analyzed from three aspects of area, speed and power consumption combined with the characteristics of FPGA. The experimental data of XC4VSX55 FPGA are in good agreement with the theoretical model. It can provide reference for selection of protection methods in engineering application.
【學(xué)位授予單位】：西安電子科技大學(xué)
【學(xué)位級別】：碩士
【學(xué)位授予年份】：2015
【分類號】：TN791

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