本文選題：模擬集成電路 + 濾波器��； 參考：《華北電力大學(xué)》2015年碩士論文

【摘要】：模擬集成電路作為電子技術(shù)領(lǐng)域的一門(mén)學(xué)科已經(jīng)廣泛應(yīng)用到生活中的各個(gè)領(lǐng)域,其技術(shù)發(fā)展的水平也越來(lái)越影響到我們的日常生活。作為模擬集成電路的一類(lèi)技術(shù),其測(cè)試系統(tǒng)在電路的可靠性及有效性方面扮演著至關(guān)重要的角色。相比于數(shù)字集成電路,模擬集成電路在電路結(jié)構(gòu)以及特性方面的變化更為多樣,盡管這種結(jié)果導(dǎo)致其測(cè)試系統(tǒng)難以形成統(tǒng)一規(guī)范的標(biāo)準(zhǔn),不過(guò)這也使得對(duì)模擬集成測(cè)試系統(tǒng)的研究顯得更有意義。本文設(shè)計(jì)的測(cè)試系統(tǒng)首先通過(guò)數(shù)據(jù)采集模塊將電路的故障信息采集并輸出到計(jì)算機(jī),然后利用計(jì)算機(jī)可編程軟件LabVIEW與Matlab對(duì)輸入信息進(jìn)行處理,依據(jù)故障字典法和小波變化法將得到故障特征值進(jìn)行分析,從而達(dá)到故障診斷及定位的目的。在本測(cè)試系統(tǒng)中,涉及到測(cè)試節(jié)點(diǎn)的選擇、故障特征提取算法和硬件及軟件平臺(tái)的搭建等內(nèi)容。綜合考慮本測(cè)試系統(tǒng)的特點(diǎn)及目的,本文通過(guò)硬件平臺(tái)的單測(cè)試節(jié)點(diǎn)提取故障信息,利用軟件平臺(tái)完成多通道濾波器組的設(shè)計(jì),以進(jìn)行子帶分解來(lái)提取子帶的相關(guān)系數(shù)和相干函數(shù)自相關(guān)序列定積分等特征量,利用故障特征量來(lái)完成電路的故障診斷。本文的最后,通過(guò)軟件仿真和具體實(shí)驗(yàn),對(duì)得出的故障特征值做出了詳細(xì)的分析；并且為了提高系統(tǒng)的可靠性,選取了多個(gè)子帶下的故障值進(jìn)行對(duì)比分析。最后本文設(shè)計(jì)的測(cè)試系統(tǒng)雖然能夠基本滿(mǎn)足測(cè)試需要,但肯定還有一些值得改進(jìn)的地方,后續(xù)還會(huì)繼續(xù)改進(jìn)。
[Abstract]:As a subject of electronic technology, analog integrated circuit has been widely used in every field of life, and the level of its technology development has more and more influence on our daily life. As a kind of analog integrated circuit technology, the test system plays an important role in the reliability and effectiveness of the circuit. Analog integrated circuits vary more in circuit structure and characteristics than digital integrated circuits, although this result makes it difficult for their test systems to form uniform and standardized standards. However, this also makes the research of analog integrated test system more meaningful. The test system designed in this paper firstly collects the fault information of the circuit and outputs it to the computer through the data acquisition module, and then processes the input information by using the computer programmable software LabVIEW and Matlab. According to the fault dictionary method and wavelet change method, the fault eigenvalues will be analyzed, so as to achieve the purpose of fault diagnosis and location. In this test system, it involves the selection of test nodes, fault feature extraction algorithm and the construction of hardware and software platform. Considering the characteristics and purpose of the test system, the fault information is extracted from the single test node of the hardware platform, and the design of the multi-channel filter bank is completed by using the software platform. The subband decomposition is used to extract the correlation coefficient of the subband and the definite integral of the coherent function autocorrelation sequence, and the fault characteristic quantity is used to complete the fault diagnosis of the circuit. Finally, through software simulation and specific experiments, the fault eigenvalues obtained are analyzed in detail, and in order to improve the reliability of the system, the fault values under several sub-bands are selected for comparative analysis. Finally, although the test system designed in this paper can basically meet the needs of the test, there must be some improvements to be made, which will continue to be improved in the future.
【學(xué)位授予單位】：華北電力大學(xué)
【學(xué)位級(jí)別】：碩士
【學(xué)位授予年份】：2015
【分類(lèi)號(hào)】：TN431.1

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本文編號(hào)：1946602