本文選題：位姿測(cè)量 + 機(jī)器視覺(jué)��； 參考：《納米技術(shù)與精密工程》2017年03期

【摘要】：為提高空中光電位姿測(cè)量系統(tǒng)的可靠性和環(huán)境適應(yīng)性,分析了在復(fù)雜環(huán)境中工作時(shí)影響其成像質(zhì)量的兩種干擾因素:一是以陽(yáng)光為主的雜光干擾,二是復(fù)雜天氣條件下大氣對(duì)光輻射的衰減.利用MODTRAN模型分析了不同條件下的天空背景亮度及大氣透過(guò)率,并在此基礎(chǔ)上提出以下抗干擾措施:選擇近紅外波段的大功率LED作為合作目標(biāo),提高了目標(biāo)背景對(duì)比度;在光路中加入與LED匹配的窄帶濾光片,消除了LED工作波段外雜光的干擾;在圖像處理階段采用特征分析的方法消除了陽(yáng)光直射入鏡頭時(shí)的干擾.設(shè)計(jì)了模擬靶標(biāo),并通過(guò)實(shí)驗(yàn)驗(yàn)證了上述措施的可行性.
[Abstract]:In order to improve the reliability and environmental adaptability of the aerial photoelectronic pose measurement system, two interference factors that affect the imaging quality in the complex environment are analyzed. One is the interference of the sun mainly and the two is the attenuation of the atmospheric radiation under the complex weather conditions. The sky background under different conditions is analyzed by using the MODTRAN model. Luminance and atmospheric transmittance, and on this basis, the following anti-interference measures are proposed: the high power LED in the near infrared band is selected as the cooperation target, the contrast of the target background is improved; the narrow band filter matching with the LED is added to the optical path to eliminate the interference of the miscellaneous light outside the working band of the LED; and the feature analysis method is adopted in the image processing stage. The interference of direct sunlight into the lens is eliminated. A simulated target is designed, and the feasibility of the above measures is verified by experiments.
【作者單位】： 天津大學(xué)微光機(jī)電系統(tǒng)技術(shù)教育部重點(diǎn)實(shí)驗(yàn)室;
【分類號(hào)】：TN29;TP391.41

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本文編號(hào)：1910705