紅外系統(tǒng)自身熱輻射對(duì)探測(cè)系統(tǒng)性能的影響研究
發(fā)布時(shí)間:2018-05-15 11:32
本文選題:紅外探測(cè)系統(tǒng) + 自身熱輻射; 參考:《中國(guó)科學(xué)院大學(xué)(中國(guó)科學(xué)院光電技術(shù)研究所)》2017年碩士論文
【摘要】:在空間、空中等特殊低溫環(huán)境中,紅外系統(tǒng)接受到的外部背景輻射大幅減小,系統(tǒng)自身熱輻射的影響則可能會(huì)凸顯出來。系統(tǒng)自身熱輻射會(huì)導(dǎo)致探測(cè)像面的輻射量噪聲變大,系統(tǒng)的動(dòng)態(tài)范圍縮小,非均勻性變差等現(xiàn)象。本論文通過對(duì)光學(xué)系統(tǒng)自身熱輻射的分析,基于實(shí)驗(yàn)測(cè)量光學(xué)系統(tǒng)自身熱輻射在像面處的大小,得到光學(xué)系統(tǒng)的等效黑體輻射溫度,并分析了自身熱輻射對(duì)探測(cè)系統(tǒng)的相關(guān)性能指標(biāo)的影響,為控制自身熱輻射以達(dá)到探測(cè)性能指標(biāo)提供參考及意見。本文首先對(duì)影響光學(xué)系統(tǒng)自身熱輻射的因素進(jìn)行分析,介紹并比較了自身熱輻射的評(píng)估方式,詳細(xì)闡述了三種自身熱輻射的計(jì)算方法:仿真測(cè)試、輻射標(biāo)定測(cè)試法,等效黑體測(cè)試法。其次,介紹自身熱輻射的測(cè)試實(shí)驗(yàn)平臺(tái)的組成、工作原理、儀器選擇要求等,并對(duì)背景模擬板的發(fā)射率進(jìn)行測(cè)試,進(jìn)行光學(xué)系統(tǒng)的調(diào)試,為后期實(shí)驗(yàn)做了重要的鋪墊。然后,進(jìn)行仿真和測(cè)試,用上述三種自身熱輻射研究方法,對(duì)某光學(xué)系統(tǒng)的等效黑體輻射溫度進(jìn)行了評(píng)估,并進(jìn)行了背景模擬板的溫度變化引起的輻射強(qiáng)度變化分析,探測(cè)器的穩(wěn)定性分析,線性擬合不確定度分析等。最后分析了探測(cè)系統(tǒng)的噪聲組成及定性分析了光學(xué)系統(tǒng)自身熱輻射對(duì)探測(cè)系統(tǒng)的信噪比影響,介紹了各項(xiàng)探測(cè)性能指標(biāo)的計(jì)算方法,并通過實(shí)驗(yàn)定量得到和比較了不同反射率紅外光學(xué)探測(cè)系統(tǒng)的性能表現(xiàn),研究了光學(xué)系統(tǒng)在不同的局部溫度變化速率下性能的變化情況,也研究了光學(xué)系統(tǒng)制冷到-43℃狀態(tài)下的探測(cè)系統(tǒng)性能表現(xiàn),結(jié)合實(shí)驗(yàn)結(jié)果又分析了光學(xué)系統(tǒng)各狀態(tài)下自身熱輻射對(duì)性能影響。通過對(duì)某光學(xué)系統(tǒng)自身熱輻射的研究,得到其自身熱輻射在探測(cè)像面上的量級(jí)為10~(-5)W/cm~2,結(jié)果說明其對(duì)系統(tǒng)的NETD、系統(tǒng)NEFD、探測(cè)距離有較大的影響。
[Abstract]:In the special low temperature environment such as space and air, the external background radiation received by infrared system is greatly reduced, and the influence of the system's own thermal radiation may be highlighted. The thermal radiation of the system itself will cause the noise of the detected image surface to increase, the dynamic range of the system to narrow, and the inhomogeneity to become worse. In this paper, the equivalent blackbody radiation temperature of the optical system is obtained by analyzing the thermal radiation of the optical system and measuring the size of the thermal radiation of the optical system at the image plane based on the experiment. The influence of self-heat radiation on the related performance index of the detection system is analyzed, which provides a reference and advice for controlling the self-thermal radiation to reach the detection performance index. In this paper, the factors affecting the thermal radiation of the optical system are analyzed, and the evaluation methods of the self-thermal radiation are introduced and compared, and three calculation methods of the self-thermal radiation are described in detail: simulation test, radiation calibration test method. Equivalent blackbody test method. Secondly, it introduces the composition, working principle, instrument selection requirements of its own thermal radiation test platform, and tests the emissivity of the background analogue board, carries on the optical system debugging, and makes the important cushion for the later experiment. Then, the equivalent blackbody radiation temperature of an optical system is evaluated by using the three self-heat radiation research methods mentioned above, and the radiation intensity change caused by the temperature change of the background analog plate is analyzed. Stability analysis, linear fitting uncertainty analysis and so on. Finally, the noise composition of the detection system and the influence of the thermal radiation of the optical system on the signal-to-noise ratio of the detection system are analyzed qualitatively, and the calculation methods of each detection performance index are introduced. The performance of infrared optical detection system with different reflectivity is quantitatively obtained and compared by experiments. The performance of the optical system under different local temperature changing rates is studied. The performance of the detection system is also studied when the optical system is cooled to -43 鈩,
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